Piero Olivo: search on Z-Library

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51

[IEEE 2015 IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2015.5.17-2015.5.20)] 2015 IEEE International Memory Workshop (IMW) - LDPC Soft Decoding with Reduced Power and Latency in 1X-2X NAND Flash-Based Solid State Drives

Zuolo, Lorenzo, Zambelli, Cristian, Olivo, Piero, Micheloni, Rino, Marelli, Alessia

Year:

2015

Language:

english

File:

PDF, 546 KB

english, 2015

52

[IEEE 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Wien, Vienna, Austria (2016.1.25-2016.1.27)] 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Performance and reliability comparison of 1T-1R RRAM arrays with amorphous and polycrystalline HfO2

Grossi, Alessandro, Perez, Eduardo, Zambelli, Cristian, Olivo, Piero, Wenger, Christian

Year:

2016

Language:

english

File:

PDF, 204 KB

english, 2016

53

[IEEE 2015 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Montpellier, France (2015.7.8-2015.7.10)] 2015 IEEE Computer Society Annual Symposium on VLSI - RRAM Reliability/Performance Characterization through Array Architectures Investigations

Zambelli, Cristian, Grossi, Alessandro, Olivo, Piero, Walczyk, Christian, Wenger, Christian

Year:

2015

Language:

english

File:

PDF, 532 KB

english, 2015

54

[IEEE 2015 15th Non-Volatile Memory Technology Symposium (NVMTS) - Beijing (2015.10.12-2015.10.14)] 2015 15th Non-Volatile Memory Technology Symposium (NVMTS) - Design space exploration of latency and bandwidth in RRAM-based solid state drives

Zuolo, Lorenzo, Zambelli, Cristian, Micheloni, Rino, Bates, Stephen, Olivo, Piero

Year:

2015

Language:

english

File:

PDF, 210 KB

english, 2015

55

[IEEE 2016 IEEE International Memory Workshop (IMW) - Paris, France (2016.5.15-2016.5.18)] 2016 IEEE 8th International Memory Workshop (IMW) - Memory System Architecture Optimization for Enterprise All-RRAM Solid State Drives

Zuolo, Lorenzo, Zambelli, Cristian, Grossi, Alessandro, Micheloni, Rino, Bates, Stephen, Olivo, Piero

Year:

2016

Language:

english

File:

PDF, 3.30 MB

english, 2016

56

An Automated Test Equipment for Characterization of emerging MRAM and RRAM arrays

Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero, Pellati, Paolo, Ramponi, Michele, Wenger, Christian, Alvarez-Herault, Jeremy, Mackay, Ken

Journal:

IEEE Transactions on Emerging Topics in Computing

Year:

2016

Language:

english

File:

PDF, 1.14 MB

english, 2016

57

Electrical characterization and modeling of 1T-1R RRAM arrays with amorphous and poly-crystalline HfO2

Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero, Crespo-Yepes, Alberto, Martin-Martinez, Javier, Rodríguez, Rosana, Nafria, Monserrat, Perez, Eduardo, Wenger, Christian

Journal:

Solid-State Electronics

Year:

2016

Language:

english

File:

PDF, 1.21 MB

english, 2016

58

Mechanism of the Key Impact of Residual Carbon Content on the Reliability of Integrated Resistive Random Access Memory Arrays

Niu, Gang, Cartoixà, Xavier, Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero, Perez, Eduardo, Schubert, Markus Andreas, Zaumseil, Peter, Costina, Ioan, Schroeder, Thomas, Wenger, Christian

Journal:

The Journal of Physical Chemistry C

Year:

2017

Language:

english

File:

PDF, 7.39 MB

english, 2017

59

Impact of the Incremental Programming Algorithm on the Filament Conduction in HfO 2 -Based RRAM Arrays

Perez, Eduardo, Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero, Wenger, Christian

Journal:

IEEE Journal of the Electron Devices Society

Year:

2017

Language:

english

File:

PDF, 898 KB

english, 2017

60

[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Uniform and concentrated read disturb effects in mid-1X TLC NAND flash memories for enterprise solid state drives

Zambelli, Cristian, Olivo, Piero, Crippa, Luca, Marelli, Alessia, Micheloni, Rino

Year:

2017

Language:

english

File:

PDF, 647 KB

english, 2017

61

Cell-to-Cell Fundamental Variability Limits Investigation in OxRRAM Arrays

Grossi, Alessandro, Zambelli, Cristian, Olivo, Piero, Nowak, Etienne, Molas, Gabriel, Nodin, Jean Francois, Perniola, Luca

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 823 KB

english, 2018

62

Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM

Grossi, Alessandro, Vianello, Elisa, Zambelli, Cristian, Royer, Pablo, Noel, Jean-Philippe, Giraud, Bastien, Perniola, Luca, Olivo, Piero, Nowak, Etienne

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2018

Language:

english

File:

PDF, 4.36 MB

english, 2018

63

[IEEE 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Granada, Spain (2018.3.19-2018.3.21)] 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - The role of the bottom and top interfaces in the 1 st reset operation in HfO2 based RRAM devices

Perez, Eduardo, Mahadevaiah, Mamathamba Kalishettyhalli, Wenger, Christian, Zambelli, Cristian, Olivo, Piero, Wenger, Christian

Year:

2018

Language:

english

File:

PDF, 695 KB

english, 2018

64

Impact of the precursor chemistry and process conditions on the cell-to-cell variability in 1T-1R based HfO2 RRAM devices

Grossi, Alessandro, Perez, Eduardo, Zambelli, Cristian, Olivo, Piero, Miranda, Enrique, Roelofs, Robin, Woodruff, Jacob, Raisanen, Petri, Li, Wei, Givens, Michael, Costina, Ioan, Schubert, Markus Andr

Journal:

Scientific Reports

Year:

2018

Language:

english

File:

PDF, 2.48 MB

english, 2018

65

Is Consumer Electronics Redesigning Our Cars?: Challenges of Integrated Technologies for Sensing, Computing, and Storage

Pieri, Francesco, Zambelli, Cristian, Nannini, Andrea, Olivo, Piero, Saponara, Sergio

Journal:

IEEE Consumer Electronics Magazine

Year:

2018

Language:

english

File:

PDF, 2.17 MB

english, 2018

66

[IEEE 2018 New Generation of CAS (NGCAS) - Valletta, Malta (2018.11.20-2018.11.23)] 2018 New Generation of CAS (NGCAS) - Correlating Power Efficiency and Lifetime to Programming Strategies in RRAM-Based FPGAs

Zambelli, Cristian, Castellari, Marco, Olivo, Piero, Bertozzi, Davide

Year:

2018

Language:

english

File:

PDF, 898 KB

english, 2018

67

Data retention investigation in Al:HfO 2 -based resistive random access memory arrays by using high-temperature accelerated tests

Perez, Eduardo, Mahadevaiah, Mamathamba K., Zambelli, Cristian, Olivo, Piero, Wenger, Christian

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2019

Language:

english

File:

PDF, 1.15 MB

english, 2019

68

Characterization of the Interface-Driven 1st Reset Operation in HfO2-based 1T1R RRAM Devices

Pérez, Eduardo, Mahadevaiah, Mamathamba Kalishettyhalli, Zambelli, Cristian, Olivo, Piero, Wenger, Christian

Journal:

Solid-State Electronics

Year:

2019

Language:

english

File:

PDF, 4.23 MB

english, 2019

69

[IEEE 2019 IEEE 11th International Memory Workshop (IMW) - Monterey, CA, USA (2019.5.12-2019.5.15)] 2019 IEEE 11th International Memory Workshop (IMW) - Reliability challenges in 3D NAND Flash memories

Zambelli, Cristian, Micheloni, Rino, Olivo, Piero

Year:

2019

Language:

english

File:

PDF, 1.56 MB

english, 2019

70

[IEEE 2019 IEEE 11th International Memory Workshop (IMW) - Monterey, CA, USA (2019.5.12-2019.5.15)] 2019 IEEE 11th International Memory Workshop (IMW) - Reliability challenges in 3D NAND Flash memories

Zambelli, Cristian, Micheloni, Rino, Olivo, Piero

Year:

2019

File:

PDF, 1.56 MB

2019

71

Enabling Computational Storage through FPGA Neural Network Accelerator for Enterprise SSD

Zambelli, Cristian, Bertaggia, Riccardo, Zuolo, Lorenzo, Micheloni, Rino, Olivo, Piero

Journal:

IEEE Transactions on Circuits and Systems II: Express Briefs

Year:

2019

Language:

english

File:

PDF, 4.40 MB

english, 2019

72

Toward Reliable Multi-Level Operation in RRAM Arrays: Improving Post-Algorithm Stability and Assessing Endurance/Data Retention

Perez, Eduardo, Zambelli, Cristian, Mahadevaiah, Mamathamba Kalishettyhalli, Olivo, Piero, Wenger, Christian

Journal:

IEEE Journal of the Electron Devices Society

Year:

2019

Language:

english

File:

PDF, 3.72 MB

english, 2019

73

[IEEE 2019 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2019.10.13-2019.10.17)] 2019 IEEE International Integrated Reliability Workshop (IIRW) - Dynamic V TH Tracking for Cross-Temperature Suppression in 3D-TLC NAND Flash

Zambelli, Cristian, Ferro, Enrico, Crippa, Luca, Micheloni, Rino, Olivo, Piero

Year:

2019

Language:

english

File:

PDF, 597 KB

english, 2019

74

An uncommon urticaria

Bertolo, Olivo, Risucci, Piero, Pollet, Cristina, Sechi, Antonio

Journal:

Emergency Care Journal

Year:

2007

File:

PDF, 1.18 MB

2007

75

Mitigating Self-Heating in Solid State Drives for Industrial Internet-of-Things Edge Gateways

Zambelli, Cristian, Zuolo, Lorenzo, Crippa, Luca, Micheloni, Rino, Olivo, Piero

Journal:

Year:

2020

File:

PDF, 2.03 MB

2020

76

Reliability of Logic-in-Memory Circuits in Resistive Memory Arrays

Zanotti, Tommaso, Zambelli, Cristian, Puglisi, Francesco Maria, Milo, Valerio, Perez, Eduardo, Mahadevaiah, Mamathamba K., Ossorio, Oscar G., Wenger, Christian, Pavan, Paolo, Olivo, Piero, Ielmini, Da

Journal:

IEEE Transactions on Electron Devices

Year:

2020

File:

PDF, 1.44 MB

2020