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51

[ECS 23rd Symposium on Microelectronics Technology and Devices - Gramado, Brazil (September 1 - September 4, 2008)] ECS Transactions - A New Methodology for Characterizing the Progressive BD of Hfo2/Sio2 Metal Gate Stacks

Pagano, Roberto, Lombardo, Salvatore, Palumbo, Felix R., Carloni, Stefania, Kirsch, Paul, Krishnan, Siddarth, Young, Chadwin, Choi, Rino, Bersuker, Gennadi, Stathis, James

Year:

2008

Language:

english

File:

PDF, 455 KB

english, 2008

52

[ECS 215th ECS Meeting - San Francisco, CA (May 24 - May 29, 2009)] ECS Transactions - The Dielectric Breakdown in Gate Oxides under High Field Stress

Lombardo, Salvatore A., Stathis, James H., Bersuker, Gennadi

Year:

2009

Language:

english

File:

PDF, 755 KB

english, 2009

53

[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - Separation of interface states and electron trapping for hot carrier degradation in ultra-scaled replacement metal gate n-FinFET

Wang, Miaomiao, Liu, Zuoguang, Yamashita, Tenko, Stathis, James H., Chen, Chia-yu

Year:

2015

Language:

english

File:

PDF, 1.21 MB

english, 2015

54

[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - A critical analysis of sampling-based reconstruction methodology for dielectric breakdown systems (BEOL/MOL/FEOL)

Wu, Ernest, Stathis, James, Li, Baozhen, Linder, Barry, Zhao, Kai, Bonilla, Griselda

Year:

2015

Language:

english

File:

PDF, 1.78 MB

english, 2015

55

[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - Analyzing path delays for accelerated testing of logic chips

Ray, Emily, Linder, Barry, Robertazzi, Raphael, Stawiasz, Kevin, Weger, Alan, Yashchin, Emmanuel, Stathis, James, Song, Peilin

Year:

2015

Language:

english

File:

PDF, 757 KB

english, 2015

56

Swift and the Twentieth Centuryby Milton Voigt

Review by: James J. Stathis

Journal:

Comparative Literature Studies

Year:

1965

Language:

english

File:

PDF, 741 KB

english, 1965

57

Photoluminescence Characterization of Defects in Thermal Oxide

Nishikawa, Hiroyuki, Stathis, James H.

Journal:

MRS Proceedings

Year:

1999

Language:

english

File:

PDF, 679 KB

english, 1999

58

Jonathan Swift as a Tory Pamphleteerby Richard Cook

Review by: James J. Stathis

Journal:

The Georgia Review

Year:

1969

Language:

english

File:

PDF, 302 KB

english, 1969

59

[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Preface

Stathis, James H.

Year:

2011

Language:

english

File:

PDF, 243 KB

english, 2011

60

Introduction to the Special Issue on the 50th International Reliability Physics Symposium

Ogawa, Ennis T., Chaparala, Prasad, Stathis, James H., Krishnan, Srikanth

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2013

Language:

english

File:

PDF, 40 KB

english, 2013

61

William Gaddis

Stathis, James J.

Journal:

Critique Studies in Contemporary Fiction

Year:

1962

File:

PDF, 287 KB

1962

62

A Preliminary Case Series on the Use of Quetiapine for Posttraumatic Stress Disorder in Juveniles Within a Youth Detention Center

Stathis, Stephen, Martin, Graham, McKenna, James G.

Journal:

Journal of Clinical Psychopharmacology

Year:

2005

Language:

english

File:

PDF, 92 KB

english, 2005

63

Physical Activity and Dimensions of Subjective Well-Being in Older Adults

Stathi, Aphrodite, Fox, Kenneth R., McKenna, James

Journal:

Journal of Aging and Physical Activity

Year:

2002

Language:

english

File:

PDF, 1.12 MB

english, 2002

64

[IEEE 2016 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2016.12.3-2016.12.7)] 2016 IEEE International Electron Devices Meeting (IEDM) - Hot carrier effect in ultra-scaled replacement metal gate Sii-xGex channel p-FinFETs

Wang, Miaomiao, Miao, Xin, Stathis, James H, Southwick, Richard, Linder, Barry P., Liu, Derrick, Bao, Ruqiang, Watanabe, Koji

Year:

2016

Language:

english

File:

PDF, 718 KB

english, 2016

65

Applications of clustering model to bimodal distributions for dielectric breakdown

Wu, Ernest Y., Bolam, Ronald, Filippi, Ronald, Stathis, James H., Li, Baozhen, Kim, Andrew

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2017

Language:

english

File:

PDF, 2.69 MB

english, 2017

66

[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Fundamental statistical properties of reconstruction methodology for TDDB with variability in BEOL/MOL/FEOL applications

Wu, Ernest, Stathis, James, Li, Baozhen, Kim, Andrew, Linder, Barry, Bolam, Ronald, Bonilla, Griselda

Year:

2016

Language:

english

File:

PDF, 2.63 MB

english, 2016

67

[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Comparison of DC and AC NBTI kinetics in RMG Si and SiGe p-FinFETs

Parihar, Narendra, Southwick, Richard G., Sharma, Uma, Wang, Miaomiao, Stathis, James H, Mahapatra, Souvik

Year:

2017

Language:

english

File:

PDF, 318 KB

english, 2017

68

[IEEE 2017 IEEE 12th International Conference on ASIC (ASICON) - Guiyang (2017.10.25-2017.10.28)] 2017 IEEE 12th International Conference on ASIC (ASICON) - Hot carrier reliability in ultra-scaled sige channel p-FinFETs

Wang, Miaomiao, Miao, Xin, Stathis, James H, Southwick, Richard

Year:

2017

Language:

english

File:

PDF, 794 KB

english, 2017

69

Modeling of NBTI Kinetics in RMG Si and SiGe FinFETs, Part-I: DC Stress and Recovery

Parihar, Narendra, Southwick, Richard G., Wang, Miaomiao, Member, Senior, Stathis, James H., Mahapatra, Souvik

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 2.22 MB

english, 2018

70

Modeling of NBTI Kinetics in Replacement Metal Gate Si and SiGe FinFETs--Part-II: AC Stress and Recovery

Parihar, Narendra, Southwick, Richard G., Wang, Miaomiao, Stathis, James H., Mahapatra, Souvik

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 2.16 MB

english, 2018

71

A community-based physical activity intervention to prevent mobility-related disability for retired older people (REtirement in ACTion (REACT)): study protocol for a randomised controlled trial

Stathi, Afroditi, Withall, Janet, Greaves, Colin J., Thompson, Janice L., Taylor, Gordon, Medina-Lara, Antonieta, Green, Colin, Bilzon, James, Gray, Selena, Johansen-Berg, Heidi, Sexton, Claire E., We

Journal:

Year:

2018

Language:

english

File:

PDF, 496 KB

english, 2018

72

[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - The physics of NBTI: What do we really know?

Stathis, James H.

Year:

2018

Language:

english

File:

PDF, 310 KB

english, 2018

73

Creating a comprehensive research strategy for cutaneous neurofibromas

Blakeley, Jaishri O., Wolkenstein, Pierre, Widemann, Brigitte C., Lee, James, Le, Lu Q., Jackson, Rhonda, Stathis, Marigo, Verma, Sharad K.

Journal:

Year:

2018

Language:

english

File:

PDF, 141 KB

english, 2018

74

[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Comprehensive Methodology for Multiple Spots Competing Progressive Breakdown for BEOL/FEOL Applications

Wu, Ernest Y., Li, Baozhen, Stathis, James H., Kim, Andrew

Year:

2019

Language:

english

File:

PDF, 33 KB

english, 2019

75

[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - On the Frequency Dependence of Bulk Trap Generation During AC Stress in Si and SiGe RMG P-FinFETs

Parihar, Narendra, Sharma, Uma, Southwick, Richard G., Wang, Miaomiao, Stathis, James H., Mahapatra, Souvik

Year:

2019

Language:

english

File:

PDF, 35 KB

english, 2019

76

[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Long Term NBTI Relaxation Under AC and DC Biased Stress and Recovery

Mataev, Elnatan, Stathis, James, La Rosa, Giuseppe, Linder, Barry P.

Year:

2019

Language:

english

File:

PDF, 824 KB

english, 2019

77

[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor

Wang, Miaomiao, Zhang, Jingyun, Zhou, Huimei, Southwick, Richard G., Kuo Chao, Robin Hsin, Miao, Xin, Basker, Veeraraghavan S., Yamashita, Tenko, Guo, Dechao, Karve, Gauri, Bu, Huiming, Stathis, James

Year:

2019

Language:

english

File:

PDF, 1.98 MB

english, 2019

78

[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor

Wang, Miaomiao, Zhang, Jingyun, Zhou, Huimei, Southwick, Richard G., Kuo Chao, Robin Hsin, Miao, Xin, Basker, Veeraraghavan S., Yamashita, Tenko, Guo, Dechao, Karve, Gauri, Bu, Huiming, Stathis, James

Year:

2019

File:

PDF, 1.98 MB

2019

79

[IEEE 2019 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2019.3.31-2019.4.4)] 2019 IEEE International Reliability Physics Symposium (IRPS) - Long Term NBTI Relaxation Under AC and DC Biased Stress and Recovery

Mataev, Elnatan, Stathis, James, La Rosa, Giuseppe, Linder, Barry P.

Year:

2019

File:

PDF, 824 KB

2019

80

Damage control hip disarticulation: two-stage operation with index creation of a large medial flap for the septic hip

Colosimo, Christina, Fredericks, Charles, Yon, James R, Kubasiak, John C, Bokhari, Faran, Poulakidas, Stathis

Journal:

Trauma Surgery & Acute Care Open

Year:

2020

File:

PDF, 1.10 MB

2020

81

Obesity is Not Associated With Need for Skin Grafting After Hidradenitis Excision

Colosimo, Christina, Yon, James R., Fredericks, Charles, Kingsley, Samuel, Gupta, Sameer, Mentzer, Caleb J., Bokhari, Faran, Poulakidas, Stathis

Journal:

The American surgeon

Year:

2020

File:

PDF, 276 KB

2020