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51

(Invited) Replacement Metal Gate/High-k Last Technology for Aggressively Scaled Planar and FinFET-Based Devices

Veloso, A., Lee, J. W., Simoen, E., Ragnarsson, L.-A., Arimura, H., Cho, M. J., Boccardi, G., Thean, A., Horiguchi, N.

Journal:

ECS Transactions

Year:

2014

Language:

english

File:

PDF, 2.33 MB

english, 2014

52

Negative Bias Temperature Instabilities induced in devices with millisecond anneal for ultra-shallow junctions

Moras, M., Martin-Martinez, J., Rodriguez, R., Nafria, M., Aymerich, X., Simoen, E.

Journal:

Solid-State Electronics

Year:

2014

Language:

english

File:

PDF, 1.44 MB

english, 2014

53

Mechanical stress of the electrical performance of polycrystalline-silicon resistors

Nakabayashi, N., Ohyama, H., Simoen, E., Ikegami, M., Claeys, C., Kobayashi, K., Yoneoka, M., Miyahara, K.

Journal:

Journal of Materials Research

Year:

2001

Language:

english

File:

PDF, 227 KB

english, 2001

54

[IEEE 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Shanghai, China (2010.11.1-2010.11.4)] 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology - Channel hot-carrier degradation on strained MOSFETs with embedded SiGe or SiC Source/Drain

Amat, E., Rodriguez, R., Gonzalez, M.B., Martin-Martinez, J., Nafria, M., Aymerich, X., Machkaoutsan, V., Bauer, M., Verheyen, P., Simoen, E.

Year:

2010

Language:

english

File:

PDF, 338 KB

english, 2010

55

What Do We Know about Hydrogen-Induced Thermal Donors in Silicon?

Simoen, E., Huang, Y. L., Ma, Y., Lauwaert, J., Clauws, P., Rafí, J. M., Ulyashin, A., Claeys, C.

Journal:

Journal of The Electrochemical Society

Year:

2009

Language:

english

File:

PDF, 549 KB

english, 2009

56

Influence of Tin Impurities on the Generation and Annealing of Thermal Oxygen Donors in Czochralski Silicon at 450°C

Neimash, V. B., Kraitchinskii, A., Kras'ko, M., Puzenko, O., Claeys, C., Simoen, E., Svensson, B., Kuznetsov, A.

Journal:

Journal of The Electrochemical Society

Year:

2000

Language:

english

File:

PDF, 326 KB

english, 2000

57

Ultra Shallow Arsenic Junctions in Germanium Formed by Millisecond Laser Annealing

Hellings, Geert, Rosseel, Erik, Simoen, Eddy, Radisic, Dunja, Petersen, Dirch Hjorth, Hansen, Ole, Nielsen, Peter Folmer, Zschätzsch, Gerd, Nazir, Aftab, Clarysse, Trudo, Vandervorst, Wilfried, Hoffm

Journal:

Electrochemical and Solid-State Letters

Year:

2011

Language:

english

File:

PDF, 266 KB

english, 2011

58

New DVB-S2X constellations for improved performance on the satellite channel

Eroz, Mustafa, Lee, Lin-Nan, Loghin, Nabil, De Bie, Ulrik, Simoens, Frederik, Delaruelle, Daniel

Journal:

International Journal of Satellite Communications and Networking

Year:

2016

Language:

english

File:

PDF, 1.28 MB

english, 2016

59

Interoperability for industrial cyber-physical systems: an approach for legacy systems

Givehchi, Omid, Landsdorf, Klaus, Simoens, Pieter, Colombo, Armando Walter

Journal:

IEEE Transactions on Industrial Informatics

Year:

2017

Language:

english

File:

PDF, 1.19 MB

english, 2017

60

Prophylactic vaccination against human papillomaviruses to prevent cervical cancer and its precursors

Arbyn, Marc, Xu, Lan, Simoens, Cindy, Martin-Hirsch, Pierre PL

Journal:

Cochrane database of systematic reviews

Year:

2018

Language:

english

File:

PDF, 2.92 MB

english, 2018

61

Asynchronous Spiking Neurons, the natural key to exploit temporal sparsity

Yousefzadeh, Amirreza, Serrano-Gotarredona, Teresa, Barranco, Bernabe Linares, Khoei, Mina A, Hosseini, Sahar, Holanda, Priscila, Leroux, Sam, Moreira, Orlando, Tapson, Jonathan, Dhoedt, Bart, Simoens

Journal:

IEEE Journal on Emerging and Selected Topics in Circuits and Systems

Year:

2019

Language:

english

File:

PDF, 4.58 MB

english, 2019

62

Two at the time: The parallel learning of French and English as foreign languages

De Clercq, Bastien, Simoens, Hannelore

Journal:

Círculo de lingüística aplicada a la comunicación

Year:

2015

Language:

english

File:

PDF, 197 KB

english, 2015

63

(Invited) Gate-All-Around Nanosheet Field-Effect Transistors for Advanced Logic and Memory Applications: Integration and Device Features

Veloso, Anabela, Matagne, Philippe, Eneman, Geert, Mertens, Hans, Chasin, Adrian, Simoen, Eddy, Horiguchi, Naoto

Journal:

ECS Transactions

Year:

2020

File:

PDF, 1.16 MB

2020

64

Intrinsic Voltage Gain of Stacked GAA Nanosheet MOSFETs Operating at High Temperatures

Perina, Welder Fernandes, Silva, Vanessa Cristina Pereira, Martino, Joao Antonio, Agopian, Paula Ghedini Der, Simoen, Eddy, Veloso, Anabela

Journal:

ECS Transactions

Year:

2020

File:

PDF, 246 KB

2020

65

EFFECT OF SUBLETHAL DOSES OF CADMIUM, INORGANIC MERCURY AND METHYLMERCURY ON THE CELL MORPHOLOGY OF AN INSECT CELL LINE (AEDES ALBOPICTUS, C6/36)

BART BRAECKMAN, CAROLINE SIMOENS, URSZULA RZEZNIK, HILDA RAES

Journal:

Cell Biology International

Year:

1997

Language:

english

File:

PDF, 272 KB

english, 1997

66

Back-gate induced random telegraph signal noise in fully-depleted silicon-on-insulator nMOSFETs

E. Simoen, U. Magnusson, J. Vermeiren, C. Claeys

Journal:

Solid-State Electronics

Year:

1993

Language:

english

File:

PDF, 275 KB

english, 1993

67

Impact of silicidation on the excess noise behaviour of mos transistors

E.P Vandamme, L.K.J Vandamme, C Claeys, E Simoen, R.J Schreutelkamp

Journal:

Solid-State Electronics

Year:

1995

Language:

english

File:

PDF, 498 KB

english, 1995

68

The low-frequency noise behaviour of silicon-on-insulator technologies

E. Simoen, C. Claeys

Journal:

Solid-State Electronics

Year:

1996

Language:

english

File:

PDF, 1.32 MB

english, 1996

69

Investigation of drain current RTS noise in small area silicon MOS transistors

O. Roux, B. Dierickx, E. Simoen, C. Claeys, G. Ghibaudo, J. Brini

Journal:

Microelectronic Engineering

Year:

1991

Language:

english

File:

PDF, 171 KB

english, 1991

70

Low temperature behaviour of submicron accumulation mode p-channel SOI MOSFETs

A.L.P. Rotondaro, U. Magnusson, E. Simoen, C. Claeys, J-P. Colinge

Journal:

Microelectronic Engineering

Year:

1992

Language:

english

File:

PDF, 228 KB

english, 1992

71

Grid design for mobile thin client computing

L. Deboosere, P. Simoens, J. De Wachter, B. Vankeirsbilck, F. De Turck, B. Dhoedt, P. Demeester

Journal:

Future Generation Computer Systems

Year:

2011

Language:

english

File:

PDF, 1.31 MB

english, 2011

72

High-temperature performance of state-of-the-art triple-gate transistors

K. Akarvardar, A. Mercha, E. Simoen, V. Subramanian, C. Claeys, P. Gentil, S. Cristoloveanu

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 378 KB

english, 2007

73

Shallow trench isolation dimensions effects on leakage current and doping concentration of advanced p–n junction diodes

A. Poyai, I. Rittaporn, E. Simoen, C. Claeys, R. Rooyackers

Journal:

Materials Science and Engineering: B

Year:

2004

Language:

english

File:

PDF, 130 KB

english, 2004

74

1/f noise performance of MOSFETs with HfO2 and metal gate on Ge-on-insulator substrates

P. Srinivasan, E. Simoen, B. De Jaeger, C. Claeys, D. Misra

Journal:

Materials Science in Semiconductor Processing

Year:

2006

Language:

english

File:

PDF, 267 KB

english, 2006

75

Radiation damage in electron-irradiated strained Si n-MOSFETs

K. Takakura, H. Ohyama, K. Hayama, Y. Aoki, G. Eneman, P. Verheyen, E. Simoen, R. Loo, C. Claeys

Journal:

Materials Science in Semiconductor Processing

Year:

2006

Language:

english

File:

PDF, 416 KB

english, 2006

76

Radiation damage in proton-irradiated strained Si n-MOSFETs

K. Hayama, K. Takakura, T. Ohtani, T. Kudou, H. Ohyama, A. Mercha, E. Simoen, C. Claeys

Journal:

Materials Science in Semiconductor Processing

Year:

2008

Language:

english

File:

PDF, 337 KB

english, 2008

77

Stress analysis of Si1−xGex embedded source/drain junctions

M. Bargallo Gonzalez, E. Simoen, N. Naka, Y. Okuno, G. Eneman, A. Hikavyy, P. Verheyen, R. Loo, C. Claeys, V. Machkaoutsan, P. Tomasini, S.G. Thomas, J.P. Lu, R. Wise

Journal:

Materials Science in Semiconductor Processing

Year:

2008

Language:

english

File:

PDF, 974 KB

english, 2008

78

Temperature dependence of drain current hysteresis in FD and PD-SOI n-MOSFETs

K. Hayama, K. Takakura, H. Ohyama, J.M. Rafí, A. Mercha, E. Simoen, C. Claeys

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

2006

Language:

english

File:

PDF, 175 KB

english, 2006

79

Delegation and digital mandates: Legal requirements and security objectives

Brendan Van Alsenoy, Danny De Cock, Koen Simoens, Jos Dumortier, Bart Preneel

Journal:

Computer Law & Security Review

Year:

2009

Language:

english

File:

PDF, 514 KB

english, 2009

80

Couplage d'un modèle stochastique lagrangien sous-maille avec une simulation grandes échelles

Ivana Vinkovic, Cesar Aguirre, Serge Simoëns, Jean-Noël Gence

Journal:

Comptes Rendus Mécanique

Year:

2005

File:

PDF, 183 KB

2005

81

Insights on identity documents based on the Belgian case study

Danny De Cock, Koen Simoens, Bart Preneel

Journal:

Information Security Technical Report

Year:

2008

Language:

english

File:

PDF, 608 KB

english, 2008

82

Impact of high-k gate stack material with metal gates on LF noise in n- and p-MOSFETs

P. Srinivasan, E. Simoen, L. Pantisano, C. Claeys, D. Misra

Journal:

Microelectronic Engineering

Year:

2005

Language:

english

File:

PDF, 295 KB

english, 2005

83

Characteristics of low-energy nitrogen ion-implanted oxide and NO-annealed gate dielectrics

Shih-Chung Lee, Eddy Simoen, Gonçal Badenes

Journal:

Solid-State Electronics

Year:

2004

Language:

english

File:

PDF, 324 KB

english, 2004

84

Tunneling 1/fγ noise in 5 nm HfO2/2.1 nm SiO2 gate stack n-MOSFETs

E. Simoen, A. Mercha, L. Pantisano, C. Claeys, E. Young

Journal:

Solid-State Electronics

Year:

2005

Language:

english

File:

PDF, 439 KB

english, 2005

85

Impact of halo implantation on 0.13 μm floating body partially depleted SOI n-MOSFETs in low temperature operation

Marcelo Antonio Pavanello, João Antonio Martino, Eddy Simoen, Cor Claeys

Journal:

Solid-State Electronics

Year:

2005

Language:

english

File:

PDF, 665 KB

english, 2005

86

Gate electrode effects on low-frequency (1/f) noise in p-MOSFETs with high-κ dielectrics

P. Srinivasan, E. Simoen, R. Singanamalla, H.Y. Yu, C. Claeys, D. Misra

Journal:

Solid-State Electronics

Year:

2006

Language:

english

File:

PDF, 318 KB

english, 2006

87

Low-frequency noise in silicon-on-insulator devices and technologies

E. Simoen, A. Mercha, C. Claeys, N. Lukyanchikova

Journal:

Solid-State Electronics

Year:

2007

Language:

english

File:

PDF, 609 KB

english, 2007

88

The low-frequency noise behaviour of graded-channel SOI nMOSFETs

E. Simoen, C. Claeys, T.M. Chung, D. Flandre, M.A. Pavanello, J.A. Martino, J.-P. Raskin

Journal:

Solid-State Electronics

Year:

2007

Language:

english

File:

PDF, 271 KB

english, 2007

89

Evaluation of triple-gate FinFETs with SiO2–HfO2–TiN gate stack under analog operation

M.A. Pavanello, J.A. Martino, E. Simoen, R. Rooyackers, N. Collaert, C. Claeys

Journal:

Solid-State Electronics

Year:

2007

Language:

english

File:

PDF, 226 KB

english, 2007

90

Impact of the gate-electrode/dielectric interface on the low-frequency noise of thin gate oxide n-channel metal-oxide-semiconductor field-effect transistors

C. Claeys, E. Simoen, P. Srinivasan, D. Misra

Journal:

Solid-State Electronics

Year:

2007

Language:

english

File:

PDF, 621 KB

english, 2007

91

Impact strain engineering on gate stack quality and reliability

C. Claeys, E. Simoen, S. Put, G. Giusi, F. Crupi

Journal:

Solid-State Electronics

Year:

2008

Language:

english

File:

PDF, 475 KB

english, 2008

92

1/f noise study on strained Si0.8Ge0.2 p-channel MOSFETs with high-k/poly Si gate stack

L. Yan, E. Simoen, S.H. Olsen, A. Akheyar, C. Claeys, A.G. O’Neill

Journal:

Solid-State Electronics

Year:

2009

Language:

english

File:

PDF, 789 KB

english, 2009

93

Effect of rotation, gate-dielectric and SEG on the noise behavior of advanced SOI MuGFETs

S. Put, H. Mehta, N. Collaert, M. Van Uffelen, P. Leroux, C. Claeys, N. Lukyanchikova, E. Simoen

Journal:

Solid-State Electronics

Year:

2010

Language:

english

File:

PDF, 1.10 MB

english, 2010

94

Low-frequency noise and static analysis of the impact of the TiN metal gate thicknesses on n- and p-channel MuGFETs

M. Rodrigues, J.A. Martino, A. Mercha, N. Collaert, E. Simoen, C. Claeys

Journal:

Solid-State Electronics

Year:

2010

Language:

english

File:

PDF, 605 KB

english, 2010

95

Gate-edge charges related effects and performance degradation in advanced multiple-gate MOSFETs

V. Kilchytska, J. Alvarado, N. Collaert, R. Rooyackers, S. Put, E. Simoen, C. Claeys, D. Flandre

Journal:

Solid-State Electronics

Year:

2011

Language:

english

File:

PDF, 579 KB

english, 2011

96

Impact of SEG on uniaxially strained MuGFET performance

Paula Ghedini Der Agopian, Vinícius Heltai Pacheco, João Antonio Martino, Eddy Simoen, Cor Claeys

Journal:

Solid-State Electronics

Year:

2011

Language:

english

File:

PDF, 428 KB

english, 2011

97

Si versus Ge for future microelectronics

C. Claeys, J. Mitard, G. Eneman, M. Meuris, E. Simoen

Journal:

Thin Solid Films

Year:

2010

Language:

english

File:

PDF, 1.44 MB

english, 2010

98

Low-frequency noise assessment of the silicon passivation of Ge pMOSFETs

E. Simoen, A. Firrincieli, F. Leys, R. Loo, B. De Jaeger, J. Mitard, C. Claeys

Journal:

Thin Solid Films

Year:

2010

Language:

english

File:

PDF, 801 KB

english, 2010

99

P+/n junction leakage in thin selectively grown Ge-in-STI substrates

G. Eneman, R. Yang, G. Wang, B. De Jaeger, R. Loo, C. Claeys, M. Caymax, M. Meuris, M.M. Heyns, E. Simoen

Journal:

Thin Solid Films

Year:

2010

Language:

english

File:

PDF, 572 KB

english, 2010

100

Effects of electron irradiation on SiGe devices

H. Ohyama, T. Nagano, K. Takakura, M. Motoki, K. Matsuo, H. Nakamura, M. Sawada, S. Kuboyama, M.B. Gonzalez, E. Simoen, G. Eneman, C. Claeys

Journal:

Thin Solid Films

Year:

2010

Language:

english

File:

PDF, 718 KB

english, 2010