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51

Enhanced Proton and Neutron Induced Degradation and Its Impact on Hardness Assurance Testing

Shaneyfelt, Marty R., Felix, James A., Dodd, Paul E., Schwank, James R., Dalton, Scott M., Baggio, Jacques, Ferlet-Cavrois, VÉronique, Paillet, Philippe, Blackmore, Ewart W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 1.34 MB

english, 2008

52

Investigation of the Propagation Induced Pulse Broadening (PIPB) Effect on Single Event Transients in SOI and Bulk Inverter Chains

Ferlet-Cavrois, V., Pouget, V., McMorrow, D., Schwank, J. R., Fel, N., Essely, F., Flores, R. S., Paillet, P., Gaillardin, M., Kobayashi, D., Melinger, J. S., Duhamel, O., Dodd, P. E., Shaneyfelt, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 577 KB

english, 2008

53

Investigations of Single Event Effects With Heavy Ions of Energies up to 1.5 GeV/n

Hoeffgen, Stefan K., Durante, Marco, Ferlet-Cavrois, Veronique, Harboe-Sorensen, Reno, Lennartz, Wilhelm, Kuendgen, Tobias, Kuhnhenn, Jochen, LaTessa, Chiara, Mathes, Markus, Menicucci, Alessandra, Me

Journal:

IEEE Transactions on Nuclear Science

Year:

2012

Language:

english

File:

PDF, 657 KB

english, 2012

54

Direct Comparison of Charge Collection in SOI Devices From Single-Photon and Two-Photon Laser Testing Techniques

Schwank, James R., Shaneyfelt, Marty R., Dodd, Paul E., McMorrow, Dale, Vizkelethy, Gyorgy, Ferlet-Cavrois, Véronique, Gouker, Pascale M., Flores, Richard S., Stevens, Jeffrey, Buchner, Stephen B., Da

Journal:

IEEE Transactions on Nuclear Science

Year:

2011

Language:

english

File:

PDF, 553 KB

english, 2011

55

Estimation of Heavy-Ion LET Thresholds in Advanced SOI IC Technologies From Two-Photon Absorption Laser Measurements

Schwank, James R., Shaneyfelt, Marty R., McMorrow, Dale, Ferlet-Cavrois, Véronique, Dodd, Paul, Heidel, David F., Marshall, Paul W., Pellish, Jonathan A., LaBel, Kenneth A., Rodbell, Kenneth P., Hakey

Journal:

IEEE Transactions on Nuclear Science

Year:

2010

Language:

english

File:

PDF, 549 KB

english, 2010

56

Insights on the transient response of fully and partially depleted SOI technologies under heavy-ion and dose-rate irradiations

Ferlet-Cavrois, V., Gasiot, G., Marcandella, C., D'Hose, C., Flament, O., Faynot, O., du Port de Pontcharra, J., Raynaud, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

2002

Language:

english

File:

PDF, 652 KB

english, 2002

57

Characterization of the parasitic bipolar amplification in SOI technologies submitted to transient irradiation

Ferlet-Cavrois, V., Marcandella, C., Giraud, G., Gasiot, G., Colladant, I., Musseau, O., Fenouillet, C., du Port de Poncharra, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2002

Language:

english

File:

PDF, 320 KB

english, 2002

58

[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Heavy Ion Sensitivity of 16/32-Gbit NAND-Flash and 4-Gbit DDR3 SDRAM

Grürmann, Kai, Herrmann, Martin, Gliem, Fritz, Schmidt, Hagen, Leibeling, Gilbert, Kettunen, Heikki, Ferlet-Cavrois, Véronique

Year:

2012

Language:

english

File:

PDF, 884 KB

english, 2012

59

Effects of Total Dose Irradiation on Single-Event Upset Hardness

Schwank, J.R., Shaneyfelt, M.R., Felix, J.A., Dodd, P.E., Baggio, J., Ferlet-Cavrois, V., Paillet, P., Hash, G.L., Flores, R.S., Massengill, L.W., Blackmore, E.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 444 KB

english, 2006

60

Heavy Ion Energy Effects in CMOS SRAMs

Dodd, P. E., Schwank, J. R., Shaneyfelt, M. R., Ferlet-Cavrois, V., Paillet, P., Baggio, J., Hash, G. L., Felix, J. A., Hirose, K., Saito, H.

Journal:

IEEE Transactions on Nuclear Science

Year:

2007

Language:

english

File:

PDF, 346 KB

english, 2007

61

Transient response of III-V field-effect transistors to heavy-ion irradiation

McMorrow, D., Boos, J.B., Knudson, A.R., Lotshaw, W.T., Doe Park,, Melinger, J.S., Bennett, B.R., Torres, A., Ferlet-Cavrois, V., Sauvestre, J.-E., D'Hose, C., Flament, O.

Journal:

IEEE Transactions on Nuclear Science

Year:

2004

Language:

english

File:

PDF, 2.13 MB

english, 2004

62

Total Ionizing Dose Effects on Triple-Gate FETs

Gaillardin, M., Paillet, P., Ferlet-Cavrois, V., Faynot, O., Jahan, C., Cristoloveanu, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1008 KB

english, 2006

63

Charge Generation by Secondary Particles From Nuclear Reactions in BEOL Materials

Dodds, N. A., Reed, R. A., Mendenhall, M. H., Weller, R. A., Clemens, M. A., Dodd, P. E., Shaneyfelt, M. R., Vizkelethy, G., Schwank, J. R., Ferlet-Cavrois, V., Adams, J. H., Schrimpf, R. D., King, M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 739 KB

english, 2009

64

Two-dimensional simulation of total dose effects on NMOSFET with lateral parasitic transistor

Brisset, C., Ferlet-Cavrois, V., Flament, O., Musseau, O., Leray, J.L., Pelloie, J.L., Escoffier, R., Michez, A., Cirba, C., Bordure, G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1996

Language:

english

File:

PDF, 864 KB

english, 1996

65

[IEEE 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Cap d'Agde, France (2005.09.19-2005.09.23)] 2005 8th European Conference on Radiation and Its Effects on Components and Systems - Effects of Total Dose Irradiation on Single-Event Upset Hardness

Schwank, J. R., Shaneyfelt, M. R., Felix, J. A., Dodd, P. E., Ferlet-Cavrois, V., Paillet, P., Baggio, J., Hash, G. L., Flores, R. S., Massengill, L. W., Blackmore, E.

Year:

2005

Language:

english

File:

PDF, 6.53 MB

english, 2005

66

[IEEE 2011 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2011) - Las Vegas, NV, USA (2011.07.25-2011.07.29)] 2011 IEEE Radiation Effects Data Workshop - SEU and MBU Angular Dependence of Samsung and Micron 8-Gbit SLC NAND-Flash Memories under Heavy-Ion Irradiation

Grurmann, Kai, Walter, Dietmar, Herrmann, Martin, Gliem, Fritz, Kettunen, Heikki, Ferlet-Cavrois, Veronique

Year:

2010

Language:

english

File:

PDF, 335 KB

english, 2010

67

Comparison of single event phenomena for front/back irradiations

Musseau, O., Ferlet-Cavrois, V., Campbell, A.B., Stapor, W.J., McDonald, P.T.

Journal:

IEEE Transactions on Nuclear Science

Year:

1997

Language:

english

File:

PDF, 775 KB

english, 1997

68

[IEEE RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - Cannes, France (15-19 Sept. 1997)] RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - A methodology study lateral parasitic transistors in CMOS technologies

Flament, O., Chabrerie, C., Ferlet-Cavrois, V., Leray, J.L., Faccio, F., Jarron, P.

Year:

1998

Language:

english

File:

PDF, 509 KB

english, 1998

69

Optimum laboratory radiation source for hardness assurance testing

Schwank, J.R., Shaneyfelt, M.R., Paillet, P., Beutler, D.E., Ferlet-Cavrois, V., Draper, B.L., Loemaker, R.A., Dodd, P.E., Sexton, F.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2001

Language:

english

File:

PDF, 100 KB

english, 2001

70

[IEEE RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - Cannes, France (15-19 Sept. 1997)] RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - Transient radiation effects in CMOS/SOI transistors and circuits

Ferlet-Cavrois, V., Dupont-Nivet, E., Vildeuil, J.C., Musseau, O., Leray, J.L.

Year:

1998

Language:

english

File:

PDF, 648 KB

english, 1998

71

Charge enhancement effect in NMOS bulk transistors induced by heavy ion Irradiation-comparison with SOI

Ferlet-Cavrois, V., Vizkelethy, G., Paillet, P., Torres, A., Schwank, J.R., Shaneyfelt, M.R., Baggio, J., de Pontcharra, Jd.P., Tosti, L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2004

Language:

english

File:

PDF, 335 KB

english, 2004

72

Direct Evidence of Secondary Recoiled Nuclei From High Energy Protons

Cellere, G., Paccagnella, A., Visconti, A., Beltrami, S., Schwank, J., Shaneyfelt, M., Lambert, D., Paillet, P., Ferlet-Cavrois, V., Baggio, J., Harboe-Sorensen, R., Blackmore, E., Virtanen, A., Fuoch

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 350 KB

english, 2008

73

Single and Multiple Cell Upsets in 25-nm NAND Flash Memories

Bagatin, M., Gerardin, S., Paccagnella, A., Ferlet-Cavrois, V.

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 946 KB

english, 2013

74

[IEEE 2000 IEEE International SOI Conference. Proceedings - Wakefield, MA, USA (2-5 Oct. 2000)] 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125) - Characterization of the parasitic bipolar transistor in SOI technology: comparison between direct and indirect triggering techniques

Flament, O., Musseau, O., Ferlet-Cavrois, V., Colladant, T., Pelloie, J.L., Buchner, S., McMorrow, D., Campbell, A.B.

Year:

2000

Language:

english

File:

PDF, 165 KB

english, 2000

75

Proton-Induced Upsets in SLC and MLC NAND Flash Memories

Bagatin, Marta, Gerardin, Simone, Paccagnella, Alessandro, Ferlet-Cavrois, Veronique, Schwank, James R., Shaneyfelt, Marty R., Visconti, Angelo

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 571 KB

english, 2013

76

Semi-Empirical Model for SEGR Prediction

Javanainen, Arto, Ferlet-Cavrois, Veronique, Jaatinen, Jukka, Kettunen, Heikki, Muschitiello, Michele, Pintacuda, Francesco, Rossi, Mikko, Schwank, James R., Shaneyfelt, Marty R., Virtanen, Ari

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 1.04 MB

english, 2013

77

SEE Measurements and Simulations Using Mono-Energetic GeV-Energy Hadron Beams

Alia, Ruben Garcia, Brugger, Markus, Danzeca, Salvatore, Ferlet-Cavrois, Veronique, Poivey, Christian, Roed, Ketil, Saigne, Frederic, Spiezia, Giovanni, Uznanski, Slawosz, Wrobel, Frederic

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 896 KB

english, 2013

78

Investigation of Supply Current Spikes in Flash Memories Using Ion-Electron Emission Microscopy

Gerardin, S., Bagatin, M., Paccagnella, A., Bisello, D., Giubilato, P., Mattiazzo, S., Pantano, D., Silvestrin, L., Tessaro, M., Wyss, J., Ferlet-Cavrois, V.

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 663 KB

english, 2013

79

SEGR in SiO${}_2$ –Si$_3$ N$_4$ Stacks

Javanainen, Arto, Ferlet-Cavrois, Veronique, Bosser, Alexandre, Jaatinen, Jukka, Kettunen, Heikki, Muschitiello, Michele, Pintacuda, Francesco, Rossi, Mikko, Schwank, James R., Shaneyfelt, Marty R., V

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 870 KB

english, 2014

80

Neutron and Alpha Single Event Upsets in Advanced NAND Flash Memories

Gerardin, S., Bagatin, M., Paccagnella, A., Ferlet-Cavrois, V., Visconti, A., Frost, C. D.

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 512 KB

english, 2014

81

Impact of technology scaling in SOI back-channel total dose tolerance. A 2-D numerical study using self-consistent oxide code

Leray, J.-L., Paillet, P., Ferlet-Cavrois, V., Tavernier, C., Belhaddad, K., Penzin, O.

Journal:

IEEE Transactions on Nuclear Science

Year:

2000

Language:

english

File:

PDF, 599 KB

english, 2000

82

Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs

Ferlet-Cavrois, V., Paillet, P., Gaillardin, M., Lambert, D., Baggio, J., Schwank, J. R., Vizkelethy, G., Shaneyfelt, M. R., Hirose, K., Blackmore, E. W., Faynot, O., Jahan, C., Tosti, L.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.20 MB

english, 2006

83

Analysis of local and global transient effects in a CMOS SRAM

Gardic, F., Musseau, O., Flament, O., Brisset, C., Ferlet-Cavrois, V., Martinez, M., Corbiere, T.

Journal:

IEEE Transactions on Nuclear Science

Year:

1996

Language:

english

File:

PDF, 813 KB

english, 1996

84

[IEEE 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 - Fontevraud, France (13-17 Sept. 1999)] 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) - Total dose behavior of partially depleted SOI dynamic threshold voltage MOS (DTMOS) for very low supply voltage applications (0.6-1 V)

Ferlet-Cavrois, V., Paillet, P., Musseau, O., Leray, J.L., Faynot, O., Raynaud, C., Pelloie, J.L.

Year:

2000

Language:

english

File:

PDF, 723 KB

english, 2000

85

Transient Response of Semiconductor Electronics to Ionizing Radiation. Recent Developments in Charge-Collection Measurement

McMorrow, Dale, Ferlet-Cavrois, Veronique, Paillet, Philippe, Duhamel, Olivier, Baggio, Jacques, Boos, J. Brad, Melinger, Joseph S.

Journal:

IEEE Transactions on Nuclear Science

Year:

2007

Language:

english

File:

PDF, 804 KB

english, 2007

86

Comparison of the sensitivity to heavy ions of 0.25-μm bulk and SOI technologies

Gasiot, G., Ferlet-Cavrois, V., Roche, P., Flatresse, P., D'Hose, C., Musseau, O., du Port de Poncharra, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2002

Language:

english

File:

PDF, 272 KB

english, 2002

87

[IEEE 2007 9th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2007) - Deauville, France (2007.09.10-2007.09.14)] 2007 9th European Conference on Radiation and Its Effects on Components and Systems - Tungsten-filled silicone composites for moderating proton radiation effects in electronics

Dodd, P. E., Lenhart, J. L., Schroeder, J. L., Schwank, J. R., Shaneyfelt, M. R., Felix, J. A., Baggio, J., Paillet, P., Ferlet-Cavrois, V., Girard, S., Blackmore, E. W.

Year:

2007

Language:

english

File:

PDF, 2.73 MB

english, 2007

88

[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - Analysis of SET propagation in flash-based FPGAs by means of electrical pulse injection

Battezzati, N., Sterpone, L., Ferlet-Cavrois, V.

Year:

2009

Language:

english

File:

PDF, 1.04 MB

english, 2009

89

Direct measurement of transient pulses induced by laser and heavy ion irradiation in deca-nanometer devices

Ferlet-Cavrois, V., Paillet, P., McMorrow, D., Torres, A., Gaillardin, M., Melinger, J.S., Knudson, A.R., Campbell, A.B., Schwank, J.R., Vizkelethy, G., Shaneyfelt, M.R., Hirose, K., Faynot, O., Jahan

Journal:

IEEE Transactions on Nuclear Science

Year:

2005

Language:

english

File:

PDF, 307 KB

english, 2005

90

Simulation analysis of the bipolar amplification induced by heavy-ion irradiation in double-gate MOSFETs

Castellani-Coulie, K., Munteanu, D., Autran, J.L., Ferlet-Cavrois, V., Paillet, P., Baggio, J.

Journal:

IEEE Transactions on Nuclear Science

Year:

2005

Language:

english

File:

PDF, 583 KB

english, 2005

91

[IEEE 2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Sevilla, Spain (2011.09.19-2011.09.23)] 2011 12th European Conference on Radiation and Its Effects on Components and Systems - Influence of beam conditions and energy for SEE testing

Ferlet-Cavrois, V., Schwank, J. R., Liu, S., Muschitiello, M., Beutier, Th., Javanainen, A., Hedlund, A., Poivey, C., Zadeh, A., Harboe-Sorensen, R., Santin, G., Nickson, B., Menicucci, A., Binois, C.

Year:

2011

Language:

english

File:

PDF, 753 KB

english, 2011

92

[IEEE Third European Conference on Radiation and its Effects on Components and Systems - Arcachon, France (18-22 Sept. 1995)] Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems - Analysis of local and global transient effects in a CMOS SRAM

Gardic, F., Musseau, O., Flament, O., Brisset, C., Ferlet-Cavrois, V., Martinez, M., Corbiere, T.

Year:

1996

Language:

english

File:

PDF, 727 KB

english, 1996

93

[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - Estimation of heavy-ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurements

Schwank, James R., Shaneyfelt, Marty R., McMorrow, Dale, Ferlet-Cavrois, Veronique, Dodd, P. E., Heidel, David F., Marshall, Paul W., Pellish, Jonathan A., LaBel, Kenneth A., Rodbell, Kenneth P., Hake

Year:

2009

Language:

english

File:

PDF, 879 KB

english, 2009

94

[IEEE Third European Conference on Radiation and its Effects on Components and Systems - Arcachon, France (18-22 Sept. 1995)] Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems - Radiation induced shift study in parasitic MOS structures by 2D numerical simulation

Escoffier, R., Michez, A., Cirba, G., Bordure, G., Ferlet-Cavrois, V., Paillet, P., Leray, J.L.

Year:

1996

Language:

english

File:

PDF, 330 KB

english, 1996

95

SEU in SOI SRAMs-a static model

Musseau, O., Leray, J.L., Ferlet-Cavrois, V., Coic, Y.M., Giffard, B.

Journal:

IEEE Transactions on Nuclear Science

Year:

1994

Language:

english

File:

PDF, 512 KB

english, 1994

96

Errata to "Comparison of charge yield in MOS devices for different radiation sources"

Paillet, P., Schwank, J.R., Shaneyfelt, M.R., Ferlet-Cavrois, V., Jones, R.L., Flament, O., Blackmore, E.W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2003

Language:

english

File:

PDF, 153 KB

english, 2003

97

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Heavy-ion induced single event upsets in phase-change memories

Gerardin, S., Bagatin, M., Paccagnella, A., Visconti, A., Bonanomi, M., Beltrami, S., Frost, C., Ferlet-Cavrois, V.

Year:

2014

Language:

english

File:

PDF, 271 KB

english, 2014

98

[IEEE 2011 12th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Sevilla, Spain (2011.09.19-2011.09.23)] 2011 12th European Conference on Radiation and Its Effects on Components and Systems - SEGR characterization of power MOSFETs: A new insight on PIGST associated to a non-destructive charge collection measurement tool

Carvalho, A. M. J. F., Binois, C., Salvaterra, G., Beutier, T., Mangeret, R., Marinoni, M., Miller, F., Ferlet-Cavrois, V.

Year:

2011

Language:

english

File:

PDF, 736 KB

english, 2011

99

[IEEE Third European Conference on Radiation and its Effects on Components and Systems - Arcachon, France (18-22 Sept. 1995)] Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems - Total dose effects on a fully-depleted SOI NMOSFET and its lateral parasitic transistor

Ferlet-Cavrois, V., Musseau, O., Leray, D.L., Raffaelli, M., Pelloie, J.L., Raynaud, C.

Year:

1996

Language:

english

File:

PDF, 483 KB

english, 1996

100

Implications of Characterization Temperature on Hardness Assurance Qualification

Shaneyfelt, Marty R., Schwank, James R., Dodd, Paul E., Hash, Gerald L., Paillet, Philippe, Felix, James A., Baggio, Jacques, Ferlet-Cavrois, Veronique

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 272 KB

english, 2006