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51

Enthalpy Increment Measurements from 4.5 to 350 K and the Thermodynamic Properties of Titanium Disilicide(cr) to 1700 K

Archer, Donald G., Sabella, Mel S., Stillman, Stacey E., Cotts, Eric J.

Journal:

Journal of Chemical & Engineering Data

Year:

1995

Language:

english

File:

PDF, 614 KB

english, 1995

52

Tracheal intubation difficulties in the setting of face and neck burns: myth or reality?

Esnault, Pierre, Prunet, Bertrand, Cotte, Jean, Marsaa, Hélène, Prat, Nicolas, Lacroix, Guillaume, Goutorbe, Philippe, Montcriol, Ambroise, Dantzer, Eric, Meaudre, Eric

Journal:

The American Journal of Emergency Medicine

Year:

2014

Language:

english

File:

PDF, 276 KB

english, 2014

53

Improved detection of low vapor pressure compounds in air by serial combination of single-sided membrane introduction with fiber introduction mass spectrometry (SS-MIMS-FIMS)

Cotte-Rodr�guez, Ismael, Handberg, Eric, Noll, Robert J., Kilgour, David P. A., Cooks, R. Graham

Journal:

The Analyst (Royal Society of Chemistry)

Year:

2005

Language:

english

File:

PDF, 470 KB

english, 2005

54

[IEEE 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) - Orlando, FL, USA (2014.5.27-2014.5.30)] 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) - Controlling the Sn grain morphology of SnAg C4 solder bumps

Parks, Gregory, Lu, Minhua, Perfecto, Eric, Cotts, Eric

Year:

2014

Language:

english

File:

PDF, 2.78 MB

english, 2014

55

[IEEE 2009 IEEE 59th Electronic Components and Technology Conference (ECTC 2009) - San Diego, CA, USA (2009.05.26-2009.05.29)] 2009 59th Electronic Components and Technology Conference - Accelerating the effects of aging on the reliability of lead free solder joints in a quantitative fashion

Venkatadri, Vikram, Yin, Liang, Xing, Yan, Cotts, Eric, Srihari, K., Borgesen, Peter

Year:

2009

Language:

english

File:

PDF, 1.41 MB

english, 2009

56

[IEEE 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) - Orlando, FL, USA (2014.5.27-2014.5.30)] 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) - Dependence of solder joint reliability on solder volume, Composition and printed circuit board surface finish

Arfaei, Babak, Mutuku, Francis, Sweatman, Keith, Lee, Ning-Cheng, Cotts, Eric, Coyle, Richard

Year:

2014

Language:

english

File:

PDF, 3.59 MB

english, 2014

57

[IEEE 2012 IEEE 62nd Electronic Components and Technology Conference (ECTC) - San Diego, CA, USA (2012.05.29-2012.06.1)] 2012 IEEE 62nd Electronic Components and Technology Conference - The dependence of the Sn grain structure of Pb-free solder joints on composition and geometry

Parks, Gregory, Arfaei, Babak, Benedict, Michael, Cotts, Eric, Lu, Minhua, Perfecto, Eric

Year:

2012

Language:

english

File:

PDF, 868 KB

english, 2012

58

Reply to “Comment on ‘Free surface Hele-Shaw flows around an obstacle: A random walk simulation’ ”

Bogoyavlenskiy, Vladislav A., Cotts, Eric J.

Journal:

Physical Review E

Year:

2007

Language:

english

File:

PDF, 29 KB

english, 2007

59

graphite intercalation compounds

Suzuki, Masatsugu, Santodonato, Louis J., Suzuki, Itsuko S., White, Bruce E., Cotts, Eric J.

Journal:

Physical Review B

Year:

1991

Language:

english

File:

PDF, 681 KB

english, 1991

60

[IEEE 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) - Orlando, FL, USA (2014.5.27-2014.5.30)] 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) - Effect of variation in the reflow profile on the microstructure of near eutectic SnAgCu alloys

Mutuku, Francis, Arfaei, Babak, Cotts, Eric J

Year:

2014

Language:

english

File:

PDF, 2.73 MB

english, 2014

61

Free surface Hele-Shaw flows around an obstacle: A random walk simulation

Bogoyavlenskiy, Vladislav A., Cotts, Eric J.

Journal:

Physical Review E

Year:

2004

Language:

english

File:

PDF, 267 KB

english, 2004

62

Thermal Conductivity of Thermal Interface Materials

Fullem, Travis Z., Cotts, Eric J.

Journal:

MRS Proceedings

Year:

2007

Language:

english

File:

PDF, 366 KB

english, 2007

63

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Metrology, Inspection, and Process Control for Microlithography XXIX - Influence of the process-induced asymmetry on the accuracy of overlay measurements

Cain, Jason P., Sanchez, Martha I., Shapoval, Tetyana, Schulz, Bernd, Itzkovich, Tal, Durran, Sean, Haupt, Ronny, Cangiano, Agostino, Bringoltz, Barak, Ruhm, Matthias, Cotte, Eric, Seltmann, Rolf, Her

Year:

2015

Language:

english

File:

PDF, 1.90 MB

english, 2015

64

SPIE Proceedings [SPIE 27th European Mask and Lithography Conference - Dresden, Germany (Tuesday 18 January 2011)] 27th European Mask and Lithography Conference - Multilayer reticles: advantages and challenges for 28nm chip making

Hotzel, Arthur, Seltmann, Rolf, Busch, Jens, Cotte, Eric, Behringer, Uwe F.W.

Year:

2011

Language:

english

File:

PDF, 6.16 MB

english, 2011

65

[ECS 215th ECS Meeting - San Francisco, CA (May 24 - May 29, 2009)] ECS Transactions - Understanding, Controlling and Minimizing the Voiding, Sporadically Occurring in Solder Joints with Electroplated Copper

Wafula, Fred, Liu, Yihua, Yin, Liang, Bliznakov, Stoyan, Borgesen, Peter, Cotts, Eric, Dimitrov, Nikolay

Year:

2009

Language:

english

File:

PDF, 1.60 MB

english, 2009

66

The incidence of coring and fragmentation of medication vial rubber stoppers

Eskander, Jonathan, Cotte, Juan, Glenn, Eric, Friedman, Scott, Rosinia, Frank

Journal:

Journal of Clinical Anesthesia

Year:

2015

Language:

english

File:

PDF, 120 KB

english, 2015

67

Studying the effects of elongational properties on atomization of weakly viscoelastic solutions using Rayleigh Ohnesorge Jetting Extensional Rheometry (ROJER)

Keshavarz, Bavand, Sharma, Vivek, Houze, Eric C., Koerner, Michael R., Moore, John R., Cotts, Patricia M., Threlfall-Holmes, Philip, McKinley, Gareth H.

Journal:

Journal of Non-Newtonian Fluid Mechanics

Year:

2015

Language:

english

File:

PDF, 4.45 MB

english, 2015

68

Book Review Genetics and Neurology (Genetics in Medicine and Surgery Series.) Second edition. By Sarah Bundey, with a contribution by E.M. Brett. 459 pp., illustrated. New York, Churchill Livingstone, 1992. $125. 0-443-04523-2

Hoffman, Eric P., Van Cott, Anne C.

Journal:

Boston Medical and Surgical Journal

Year:

1993

File:

PDF, 192 KB

1993

69

Case 1-2007

Cabot, Richard C., Harris, Nancy Lee, Shepard, Jo-Anne O., Rosenberg, Eric S., Cort, Alice M., Ebeling, Sally H., Peters, Christine C., Laposata, Michael, Van Cott, Elizabeth M., Lev, Michael H.

Journal:

Boston Medical and Surgical Journal

Year:

2007

Language:

english

File:

PDF, 1.20 MB

english, 2007

70

[IEEE 2007 IEEE Nuclear Science Symposium Conference Record - Honolulu, HI, USA (2007.10.26-2007.11.3)] 2007 IEEE Nuclear Science Symposium Conference Record - Examination of the utility of commercial-off-the-shelf memory devices as X-ray detectors

Fullem, Travis Z., Lehman, Lawrence P., Cotts, Eric J.

Year:

2007

Language:

english

File:

PDF, 666 KB

english, 2007

71

Vascular Hemostasis in Flowing Blood in Children

Van Cott, Elizabeth, Grabowski, Eric

Journal:

Seminars in Thrombosis and Hemostasis

Year:

1998

Language:

english

File:

PDF, 1.52 MB

english, 1998

72

Remplissage vasculaire en centre de traitement Ebola : comparaison de l’abord vasculaire périphérique et central

Cotte, Jean, Cordier, Pierre-yves, Bordes, Julien, Esnault, Pierre, Meaudre, Eric

Journal:

Anesthésie & Réanimation

Year:

2015

Language:

french

File:

PDF, 279 KB

french, 2015

73

Prise de poids chez le patient traumatisé crânien grave : impact sur la pression intracrânienne, l’oxygénation cérébrale et le pronostic

Esnault, Pierre, Montcriol, Ambroise, Cotte, Jean, NGuyen, Cédric, Boret, Henry, Meaudre, Eric

Journal:

Anesthésie & Réanimation

Year:

2015

Language:

french

File:

PDF, 84 KB

french, 2015

74

On-Demand Preexposure Prophylaxis in Men at High Risk for HIV-1 Infection

Molina, Jean-Michel, Capitant, Catherine, Spire, Bruno, Pialoux, Gilles, Cotte, Laurent, Charreau, Isabelle, Tremblay, Cecile, Le Gall, Jean-Marie, Cua, Eric, Pasquet, Armelle, Raffi, François, Pintad

Journal:

New England Journal of Medicine

Year:

2015

Language:

english

File:

PDF, 633 KB

english, 2015

75

Organ support in Ebola virus disease: Utility of point-of-care blood tests

Cotte, Jean, Janvier, Frédéric, Cordier, Pierre-Yves, Bordes, Julien, Kaiser, Eric

Journal:

Anaesthesia Critical Care & Pain Medicine

Year:

2015

Language:

english

File:

PDF, 525 KB

english, 2015

76

Fluid resuscitation in Ebola Virus Disease: A comparison of peripheral and central venous accesses

Cotte, Jean, Cordier, Pierre-Yves, Bordes, Julien, Janvier, Frederic, Esnault, Pierre, Kaiser, Eric, Meaudre, Eric

Journal:

Anaesthesia Critical Care & Pain Medicine

Year:

2015

Language:

english

File:

PDF, 519 KB

english, 2015

77

Vittel criteria for severe trauma triage: Characteristics of over-triage

Cotte, Jean, Courjon, Fredrik, Beaume, Sébastien, Prunet, Bertrand, Bordes, Julien, N’Guyen, Cédric, Contargyris, Claire, Lacroix, Guillaume, Montcriol, Ambroise, Kaiser, Eric, Meaudre, Eric

Journal:

Anaesthesia Critical Care & Pain Medicine

Year:

2015

Language:

english

File:

PDF, 636 KB

english, 2015

78

Arterial ischemic stroke in childhood: the role of plasma-phase risk factors

Nestoridi, Eirini, Buonanno, Ferdinando S., Jones, Robin M., Krishnamoorthy, Kalpathy, Grant, P. Ellen, Van Cott, Elizabeth M., Grabowski, Eric F.

Journal:

Current Opinion in Neurology

Year:

2002

Language:

english

File:

PDF, 144 KB

english, 2002

79

Évaluer les situations nécessitant le recours à l’O2 mural dans une réanimation ou la principale source d’O2 sont des extracteurs d’oxygène

Cungi, Pierre-Julien, Bordes, Julien, Esnault, Pierre, Nguyen, Cédric, cotte, Jean, d’Aranda, Erwan, Kaiser, Eric, Benois, Alain

Journal:

Anesthésie & Réanimation

Year:

2015

Language:

french

File:

PDF, 156 KB

french, 2015

80

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Meeting overlay requirements for future technology nodes with in-die overlay metrology

Schulz, Bernd, Archie, Chas N., Seltmann, Rolf, Busch, Jens, Hempel, Fritjof, Cotte, Eric, Alles, Benjamin

Year:

2007

Language:

english

File:

PDF, 402 KB

english, 2007

81

SPIE Proceedings [SPIE 27th Annual BACUS Symposium on Photomask Technology - Monterey, CA (Monday 17 September 2007)] Photomask Technology 2007 - Mask characterization for double patterning lithography

Bubke, Karsten, Naber, Robert J., Kawahira, Hiroichi, Cotte, Eric, Peters, Jan Hendrik, de Kruif, Robert, Dusa, Mircea, Fochler, Joerg, Connolly, Brid

Year:

2007

Language:

english

File:

PDF, 277 KB

english, 2007

82

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Optical Microlithography XIX - 193-nm immersion photomask image placement in exposure tools

Cotte, Eric, Flagello, Donis G., Alles, Benjamin, Wandel, Timo, Antesberger, Gunter, Teuber, Silvio, Vorwerk, Manuel, Frangen, Andreas, Katzwinkel, Frank

Year:

2006

Language:

english

File:

PDF, 323 KB

english, 2006

83

SPIE Proceedings [SPIE Photomask and Next Generation Lithography Mask Technology IX - Yokohama, Japan (Tuesday 23 April 2002)] Photomask and Next-Generation Lithography Mask Technology IX - Experimental and numerical studies of the effects of materials and attachment conditions on pellicle induced distortions in advanced photomasks

Cotte, Eric P., Engelstad, Roxann L., Lovell, Edward G., Tanzil, Daniel, Eschbach, Florence O., Shu, Emily Y., Kawahira, Hiroichi

Year:

2002

Language:

english

File:

PDF, 341 KB

english, 2002

84

SPIE Proceedings [SPIE Photomask and Next Generation Lithography Mask Technology IX - Yokohama, Japan (Tuesday 23 April 2002)] Photomask and Next-Generation Lithography Mask Technology IX - Pellicle-induced distortions in advanced photomasks

Fujita, Minoru, Akiyama, Masaya, Kondo, Masahiro, Nakagawa, Hiroaki, Tanzil, Daniel, Eschbach, Florence O., Cotte, Eric P., Engelstad, Roxann L., Lovell, Edward G., Kawahira, Hiroichi

Year:

2002

Language:

english

File:

PDF, 228 KB

english, 2002

85

SPIE Proceedings [SPIE 26th Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 25 February 2001)] Optical Microlithography XIV - Mechanical analysis of hard pellicles for 157-nm lithography

Reu, Phillip L., Mikkelson, Andrew R., Schlax, Michael P., Cotte, Eric P., Siewert, Lowell K., Engelstad, Roxann L., Lovell, Edward G., Dao, Giang T., Zheng, Jun-Fei, Progler, Christopher J.

Year:

2001

Language:

english

File:

PDF, 576 KB

english, 2001

86

SPIE Proceedings [SPIE Photomask Technology 2002 - Monterey, CA (Tuesday 1 October 2002)] 22nd Annual BACUS Symposium on Photomask Technology - Experimental and Numerical Studies of the Response of Photomask Hard Pellicles to Acoustic Excitation

Cotte, Eric P., Reu, Phillip L., Engelstad, Roxann L., Lovell, Edward G., Grenville, Andrew, Van Peski, Chris K., Grenon, Brian J., Kimmel, Kurt R.

Year:

2002

Language:

english

File:

PDF, 560 KB

english, 2002

87

SPIE Proceedings [SPIE Microlithography 2000 - Santa Clara, CA (Sunday 27 February 2000)] Emerging Lithographic Technologies IV - Film stress changes during anodic bonding of NGL masks

Cotte, Eric P., Schlax, Michael P., Engelstad, Roxann L., Lovell, Edward G., Brooks, Cameron J., Dobisz, Elizabeth A.

Year:

2000

Language:

english

File:

PDF, 2.37 MB

english, 2000

88

SPIE Proceedings [SPIE Microlithography 2003 - Santa Clara, CA (Sunday 23 February 2003)] Optical Microlithography XVI - Effects of soft pellicle frame curvature and mounting process on pellicle-induced distortions in advanced photomasks

Cotte, Eric P., Engelstad, Roxann L., Lovell, Edward G., Tanzil, Daniel, Eschbach, Florence O., Korobko, Yulia O., Fujita, Minoru, Nakagawa, Hiroaki, Yen, Anthony

Year:

2003

Language:

english

File:

PDF, 540 KB

english, 2003

89

SPIE Proceedings [SPIE Photomask Technology - Monterey, CA (Monday 13 September 2004)] 24th Annual BACUS Symposium on Photomask Technology - Numerical and experimental study of oxide growth on EUV mask capping layers

Cotte, Eric P., Staud, Wolfgang, Weed, J. Tracy, Holfeld, Christian, Dersch, Uwe, Ruhl, Guenther, Perlich, Jan

Year:

2004

Language:

english

File:

PDF, 412 KB

english, 2004

90

SPIE Proceedings [SPIE Microlithography '99 - Santa Clara, CA (Sunday 14 March 1999)] Emerging Lithographic Technologies III - Predicting mechanical distortions in x-ray masks

Cotte, Eric P., Engelstad, Roxann L., Lovell, Edward G., Brooks, Cameron J., Vladimirsky, Yuli

Year:

1999

Language:

english

File:

PDF, 3.18 MB

english, 1999

91

SPIE Proceedings [SPIE Photomask 2001 - Monterey, CA (Wednesday 3 October 2001)] 21st Annual BACUS Symposium on Photomask Technology - Mask-related distortions of modified fused silica reticles for 157-nm lithography

Mikkelson, Andrew R., Abdo, Amr Y., Cotte, Eric P., Sohn, Jaewoong, Engelstad, Roxann L., Lovell, Edward G., Dao, Giang T., Grenon, Brian J.

Year:

2002

Language:

english

File:

PDF, 819 KB

english, 2002

92

SPIE Proceedings [SPIE Photomask Technology - Monterey, CA (Monday 8 September 2003)] 23rd Annual BACUS Symposium on Photomask Technology - Experimental investigation of hard pellicle purge processes

Abdo, Amr Y., Kimmel, Kurt R., Staud, Wolfgang, Nellis, Gregory F., Diab, Aya K., Cotte, Eric P., Chalekian, Aaron J., Engelstad, Roxann L., Lovell, Edward G., Peski, Chris V.

Year:

2003

Language:

english

File:

PDF, 239 KB

english, 2003

93

SPIE Proceedings [SPIE 20th European Conference on Mask Technology for Integrated Circuits and Microcomponents - Dresden, Germany (Monday 12 January 2004)] 20th European Conference on Mask Technology for Integrated Circuits and Microcomponents - Hard pellicle investigation for 157-nm lithography: impact on overlay

Bruls, Richard, Uitterdijk, Tammo, Cicilia, Orlando, De Bisschop, Peter, Kocsis, Michael K., Grenville, Andrew, Van Peski, Chris K., Engelstad, Roxann L., Chang, Jaehyuk, Cotte, Eric P., Okada, Kaname

Year:

2004

Language:

english

File:

PDF, 1.09 MB

english, 2004

94

SPIE Proceedings [SPIE Photomask and Next Generation Lithography Mask Technology XII - Yokohama, Japan (Wednesday 13 April 2005)] Photomask and Next-Generation Lithography Mask Technology XII - EUV mask image placement management in writing, registration, and exposure tools

Cotte, Eric, Komuro, Masanori, Dersch, Uwe, Holfeld, Christian, Mickan, Uwe, Seitz, Holger, Leutbecher, Thomas, Hess, Gunter

Year:

2005

Language:

english

File:

PDF, 420 KB

english, 2005

95

SPIE Proceedings [SPIE Photomask and Next Generation Lithography Mask Technology XII - Yokohama, Japan (Wednesday 13 April 2005)] Photomask and Next-Generation Lithography Mask Technology XII - Study of stress birefringence for 193-nm immersion photomasks

Cotte, Eric, Komuro, Masanori, Selle, Michael, Bubke, Karsten, Teuber, Silvio

Year:

2005

Language:

english

File:

PDF, 209 KB

english, 2005

96

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2008)] Optical Microlithography XXI - Modeling the work piece charging during e-beam lithography

Alles, Benjamin, Cotte, Eric, Simeon, Bernd, Wandel, Timo

Year:

2008

Language:

english

File:

PDF, 274 KB

english, 2008

97

eGFR but not SLC polymorphisms influences anemia in HIV-HCV co-infected patients treated with boceprevir- or telaprevir-based therapy (ANRS HC26 and HC27 Study)

Kheloufi, Farid, Bellissant, Eric, Cotte, Laurent, Poizot-Martin, Isabelle, Quaranta, Sylvie, Garraffo, Rodolphe, Barrail-Tran, Aurélie, Renault, Alain, Fournier, Isabelle, Lacarelle, Bruno, Bourlière

Journal:

Year:

2016

Language:

english

File:

PDF, 1.48 MB

english, 2016

98

SPIE Proceedings [SPIE SPIE Photomask Technology - Monterey, CA (Monday 14 September 2009)] Photomask Technology 2009 - Mask performance improvement with mapping

Utzny, Clemens, Zurbrick, Larry S., Montgomery, M. Warren, Cotte, Eric, Wandel, Timo, Peters, Jan Hendrik

Year:

2009

Language:

english

File:

PDF, 617 KB

english, 2009

99

SPIE Proceedings [SPIE Photomask Technology - Monterey, CA (Monday 13 September 2004)] 24th Annual BACUS Symposium on Photomask Technology - Pellicle choice for 193-nm immersion lithography photomasks

Cotte, Eric P., Staud, Wolfgang, Weed, J. Tracy, Haessler, Ruediger, Utess, Benno, Antesberger, Gunter, Kromer, Frank, Teuber, Silvio

Year:

2004

Language:

english

File:

PDF, 313 KB

english, 2004

100

SPIE Proceedings [SPIE Photomask 2001 - Monterey, CA (Wednesday 3 October 2001)] 21st Annual BACUS Symposium on Photomask Technology - Numerical and experimental studies of pellicle-induced photomask distortions

Cotte, Eric P., Engelstad, Roxann L., Lovell, Edward G., Shkel, Yuri M., Eschbach, Florence O., Shu, Emily Y., Tanzil, Daniel, Calhoun, Rebecca, Dao, Giang T., Grenon, Brian J.

Year:

2002

Language:

english

File:

PDF, 368 KB

english, 2002