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1

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Rapid integrated circuit delayering without grass

Vanderlinde, William E., Von Benken, Christopher J., Crockett, Addison R., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1996

Language:

english

File:

PDF, 672 KB

english, 1996

2

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Fast failure analysis and yield enhancement: an integrated approach

Lee, Fourmun, Doan, Nam, Liu, Lisa H., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1996

Language:

english

File:

PDF, 1.14 MB

english, 1996

3

SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Wednesday 1 October 1997)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III - Arc-induced gate oxide breakdown in plasma etching process

Song, Jungwoo, Lee, Heegee, Lee, Jung Hoon, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1997

Language:

english

File:

PDF, 349 KB

english, 1997

4

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Sunday 20 September 1998)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV - Shorter failure analysis using a new application of IDDQ for defect localization in ICs

Desplats, Romain, Fougnie, Bertrand, Perdu, Philippe, Benbrik, Jamel, Marc, Francois, Danto, Yves, Prasad, Sharad, Hartmann, Hans-Dieter, Tsujide, Tohru

Year:

1998

Language:

english

File:

PDF, 1.68 MB

english, 1998

5

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Automated collection of yield and performance analysis data during UltraSPARC-I microprocessor production test

Koeppen, Matt, Moore, John, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1996

Language:

english

File:

PDF, 848 KB

english, 1996

6

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - UltraSPARC-I microprocessor yield and performance analysis

Wrobbel, Derek C., Walker, Kevin L., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1996

Language:

english

File:

PDF, 639 KB

english, 1996

7

N-(4-Hydroxyphenyl)-N-(1,1,1-trifluor-2-propyl)-4-hydroxybenzamid: Synthese und pharmakologische Bewertung eines neues Antiestrogens

Rolf W. Hartmann, Hans-Dieter Vom Orde, Alexander Heindl, Helmut Schönenberger

Journal:

Archiv der Pharmazie

Year:

1988

Language:

german

File:

PDF, 459 KB

german, 1988

8

Antiestrogene N-(4-Hydroxyphenyl)-N-(1,1,1-trifluor-2-propyl)-4-hydroxybenzamide: Beeinflussung der Wirkung durch hydrophobe Reste in ortho-Position des Benzamidfragments

Rolf W. Hartmann, Hans-Dieter Vom Orde, Helmut Schönenberger

Journal:

Archiv der Pharmazie

Year:

1990

Language:

german

File:

PDF, 512 KB

german, 1990

9

An Indole-Binding Site is a Major Determinant of the Ligand Specificity of the GABA Type A Receptor-Associated Protein GABARAP

Yvonne Thielmann, Jeannine Mohrlüder, Bernd W. Koenig, Thomas Stangler, Rudolf Hartmann, Karin Becker, Hans-Dieter Höltje, Dieter Willbold

Journal:

Year:

2008

Language:

english

File:

PDF, 869 KB

english, 2008

10

Cover Picture: An Indole-Binding Site is a Major Determinant of the Ligand Specificity of the GABA Type A Receptor-Associated Protein GABARAP (ChemBioChem 11/2008)

Yvonne Thielmann, Jeannine Mohrlüder, Bernd W. Koenig, Thomas Stangler, Rudolf Hartmann, Karin Becker, Hans-Dieter Höltje, Dieter Willbold

Journal:

Year:

2008

Language:

english

File:

PDF, 644 KB

english, 2008

11

Regulation of NK cell trafficking by CD81

Benjamin Krämer, Daniela Schulte, Christian Körner, Claudia Zwank, Agathe Hartmann, Monika Michalk, Jennifer Söhne, Bettina Langhans, Hans-Dieter Nischalke, Martin Coenen, Christoph Möhl, Annabelle Vo

Journal:

European Journal of Immunology

Year:

2009

Language:

english

File:

PDF, 546 KB

english, 2009

12

42 V — an indication for changing requirements on the vehicle electrical system

Karsten Ehlers, Hans-Dieter Hartmann, Eberhard Meissner

Journal:

Journal of Power Sources

Year:

2001

Language:

english

File:

PDF, 661 KB

english, 2001

13

Zum Absorptions-, Fluoreszenz- und Isomerisierungsverhalten styrylsubstitutierter 1,3-Diketo-borate

Hans-Dieter Ilge, Dieter Faßer, Horst Hartmann

Journal:

Zeitschrift für Chemie

Year:

1984

Language:

german

File:

PDF, 260 KB

german, 1984

14

1H-NMR-Spektren von styrylsubstituierten Bor-1,3-diketonaten

Reiner Radeglia, Hans-Dieter Ilge, Horst Hartmann

Journal:

Zeitschrift für Chemie

Year:

1985

Language:

german

File:

PDF, 237 KB

german, 1985

15

Zur Darstellung einer neuen Klasse tieffarbiger Bis-1,3-diketonato-boroniumsalze

Horst Hartmann, Torsten Schumann, Roland Dusi, Uwe Bartsch, Hans-Dieter Ilge

Journal:

Zeitschrift für Chemie

Year:

1986

Language:

german

File:

PDF, 262 KB

german, 1986

16

Zu einigen Besonderheiten im Absorptionsverhalten von kationischen und neutralen 1,3-Diketoboraten

Hans-Dieter Ilge, Horst Hartmann

Journal:

Zeitschrift für Chemie

Year:

1986

Language:

german

File:

PDF, 277 KB

german, 1986

17

High Yield Production and Purification of Recombinant Staphylokinase for Thrombolytic Therapy

Hartmann, Manfred, Gührs, Karl-Heinz, Birch-Hirschfeid, Eckhard, Pohl, Hans-Dieter, Vanderschueren, Steven, Werf, Frans Van de, Michoel, Armand, Collen, Désiré, Behnke, Detlev, Schlott, Bernhard

Journal:

Year:

1994

File:

PDF, 754 KB

1994

18

Adenovirus-Mediated Gene Transfer of Interleukin-4 to Corneal Endothelial Cells and Organ Cultured Corneas Leads to High IL-4 Expression

THOMAS RITTER, KATRIN VOGT, PETER RIECK, ANTJE SCHILLING-SCHÖN, JAY KOLLS, CHRISTIAN HARTMANN, HANS-DIETER VOLK, UWE PLEYER

Journal:

Experimental Eye Research

Year:

1999

Language:

english

File:

PDF, 191 KB

english, 1999

19

SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Wednesday 1 October 1997)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III - Mechanical stress and electromigration in an aluminum meander structure

Yu, Xiaoying, Weide, Kirsten, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1997

Language:

english

File:

PDF, 180 KB

english, 1997

20

[Part 2: Biological Sciences] || Anaerobic Growth of Halobacteria

Rainer Hartmann, Hans-Dieter Sickinger and Dieter Oesterhelt

Journal:

Proceedings of the National Academy of Sciences

Year:

1980

Language:

english

File:

PDF, 654 KB

english, 1980

21

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Time reduction of MCM-D prototype realization by process control and modeling

Fremont, Helene, Ahrens, C., Saint Christophe, E., Enoeckl, B., Fathi, M., N'kaoua, G., Pellet, C., Ferretti, Ruediger, Danto, Yves, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1996

Language:

english

File:

PDF, 869 KB

english, 1996

22

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Laser chemical vapor deposition of Cu and Ni in integrated circuit repair

Leppaevuori, Seppo, Remes, Janne, Moilanen, Hannu, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1996

Language:

english

File:

PDF, 882 KB

english, 1996

23

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Sunday 20 September 1998)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV - Improving yield and reliability of FIB modifications using electrical testing

Desplats, Romain, Benbrik, Jamel, Benteo, Bruno, Perdu, Philippe, Prasad, Sharad, Hartmann, Hans-Dieter, Tsujide, Tohru

Year:

1998

Language:

english

File:

PDF, 3.13 MB

english, 1998

24

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Plasma-etching-induced oxide degradation: effects upon device performance and circuit yield

Martin, Scott T., Li, Guann-pyng, Worley, Eugene, White, Joe, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1996

Language:

english

File:

PDF, 787 KB

english, 1996

25

SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Wednesday 1 October 1997)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III - Unique case study of low yield analysis of 1.5-μm BiCMOS technology

Teoh, C. S., Lin, James, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1997

Language:

english

File:

PDF, 1.25 MB

english, 1997

26

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Sunday 20 September 1998)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV - Industrial use of conductive adhesives for SMT assemblies

Perichaud, M. G., Fremont, Helene, Salagoity, M., Faure, C., Danto, Yves, Prasad, Sharad, Hartmann, Hans-Dieter, Tsujide, Tohru

Year:

1998

Language:

english

File:

PDF, 1.50 MB

english, 1998

27

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Plasma-induced oxide contamination in a 0.35-um CMOS process

Karnett, Martin P., Zhou, Jingrong, Ghosh, Sumanta, Echtle, Danny, Fritz, L., Manley, Martin, Scott, Gregory S., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1996

Language:

english

File:

PDF, 549 KB

english, 1996

28

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Sunday 20 September 1998)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV - Simulation of charging voltages on a wafer during plasma etch

Oner, M., Bhuva, Bharat L., Sisterhen, P., Hasan, H., Kerns, Sherra E., Prasad, Sharad, Hartmann, Hans-Dieter, Tsujide, Tohru

Year:

1998

Language:

english

File:

PDF, 134 KB

english, 1998

29

SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Wednesday 1 October 1997)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III - Evaluation of pad life in chemical mechanical polishing process using statistical metrology

Muthukrishnan, N. Moorthy, Prasad, Sharad, Stine, Brian, Loh, William, Nagahara, Ron, Chung, James E., Boning, Duane S., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1997

Language:

english

File:

PDF, 458 KB

english, 1997

30

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Sunday 20 September 1998)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV - Foundry technology trend

Sun, Jack Y. C., Prasad, Sharad, Hartmann, Hans-Dieter, Tsujide, Tohru

Year:

1998

Language:

english

File:

PDF, 1.97 MB

english, 1998

31

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Sunday 20 September 1998)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV - Equipment challenges for a total material system change: enabling device manufacturing at 130 nm and below

Harrus, Alain S., Kelly, John, Powell, Ronald A., Prasad, Sharad, Hartmann, Hans-Dieter, Tsujide, Tohru

Year:

1998

Language:

english

File:

PDF, 240 KB

english, 1998

32

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Defect analysis and classification in process control using an SEM and EDX review station

Perret, Pascal, Zinssner, Vincent, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1996

Language:

english

File:

PDF, 1.87 MB

english, 1996

33

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Sunday 20 September 1998)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV - SPRT for Weibull distributed integrated circuit failures

Chandramouli, Rajarathnam, Vijaykrishnan, N., Ranganathan, N., Prasad, Sharad, Hartmann, Hans-Dieter, Tsujide, Tohru

Year:

1998

Language:

english

File:

PDF, 396 KB

english, 1998

34

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Using IDD to analyze analog faults and development of a sensor

Maidon, Yvan, Deval, Yann, Fremont, Helene, Dom, Jean P., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1996

Language:

english

File:

PDF, 516 KB

english, 1996

35

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Modern concept of focused ion beam techniques for reliability analysis in VLSI manufacturing

Ulieru, Dumitru G., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1996

Language:

english

File:

PDF, 748 KB

english, 1996

36

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Defect detection and control in an analog CMOS process

Taucher, Franz, Evans, Ivor R., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1996

Language:

english

File:

PDF, 553 KB

english, 1996

37

SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Wednesday 1 October 1997)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III - STADIUM SOI reliability simulator for the analysis of hot-electron and ESD-induced degradation in nonisothermal devices

Lee, David, Sanders, Thomas J., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1997

Language:

english

File:

PDF, 443 KB

english, 1997

38

SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Wednesday 1 October 1997)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III - Statistical effects of plasma etch damage on hot-carrier degradation

Bhuva, Bharat L., Janapaty, Vijay, Bui, N., Kerns, Sherra E., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1997

Language:

english

File:

PDF, 254 KB

english, 1997

39

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Characterization of intrinsic thin silicon dioxide breakdown under static and dynamic stress

Chaparala, Prasad, Suehle, John S., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1996

Language:

english

File:

PDF, 714 KB

english, 1996

40

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Determination of critical process steps for enhanced yield improvement

Duluc, J. B., Zimmer, Thomas, Lewis, N., Dom, Jean P., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1996

Language:

english

File:

PDF, 766 KB

english, 1996

41

SPIE Proceedings [SPIE Microelectronic Processing '93 - Monterey, CA (Sunday 26 September 1993)] Multilevel Interconnection: Issues That Impact Competitiveness - Yield and reliability of laser-formed vertical links

Hartmann, Hans-Dieter, Hillmann-Ruge, Thomas, Hoang, Hoang H., Schutz, Ron, Bernstein, Joseph B., Vasquez, Barbara

Year:

1993

Language:

english

File:

PDF, 1.44 MB

english, 1993

42

SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Wednesday 1 October 1997)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III - Automatic final inspection: an important nonexpensive control to guarantee long-term reliability

Kiel, Friedbald, Balbo, Guiseppe, Duzi, Eyal, Andrianaivo-Golz, Olga, Kohnen, Thomas, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1997

Language:

english

File:

PDF, 722 KB

english, 1997

43

SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Wednesday 1 October 1997)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III - Die-counting algorithm for yield modeling and die-per-wafer optimization

Croft, Gregg D., Lomenick, Robert L., Youngblood, Douglas L., Johnston, Jeffrey M., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1997

Language:

english

File:

PDF, 753 KB

english, 1997

44

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Sunday 20 September 1998)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV - Characterization of snap-back breakdown and its temperature dependence up to 300°C including circuit-level model and simulation

Uffmann, Dirk, Prasad, Sharad, Hartmann, Hans-Dieter, Tsujide, Tohru

Year:

1998

Language:

english

File:

PDF, 468 KB

english, 1998

45

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Fault isolation with fanin tree technique

Ng, Kang S., Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1996

Language:

english

File:

PDF, 381 KB

english, 1996

46

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Design of the UltraSPARC-I microprocessor for manufacturing performance

Youngs, Lynn, Billus, Greg, Jones, Anjali, Paramanandam, Siva, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1996

Language:

english

File:

PDF, 555 KB

english, 1996

47

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Inter- and intra-die polysilicon critical dimension variation

Stine, Brian, Boning, Duane S., Chung, James E., Bell, David A., Equi, Edward, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1996

Language:

english

File:

PDF, 562 KB

english, 1996

48

SPIE Proceedings [SPIE Microelectronic Manufacturing - Santa Clara, CA (Sunday 20 September 1998)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV - Fault diagnosis of CMOS LSI with various leakage current state using abnormal IDDQ phenomenon

Sanada, Masaru, Fujioka, Hiromu, Prasad, Sharad, Hartmann, Hans-Dieter, Tsujide, Tohru

Year:

1998

Language:

english

File:

PDF, 1.31 MB

english, 1998

49

SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Wednesday 1 October 1997)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III - Modeling of defect propagation/growth for yield impact prediction in VLSI manufacturing

Li, Xiaolei, Strojwas, Andrzej J., Swecker, Aaron L., Reddy, Mahesh, Milor, Linda, Lin, YungTao, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1997

Language:

english

File:

PDF, 767 KB

english, 1997

50

SPIE Proceedings [SPIE Microelectronic Manufacturing 1996 - Austin, TX (Wednesday 16 October 1996)] Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II - Reliability issue on pipeline defects in CMOS memory devices

Youn, So, Terrell, Kyle, Wu, Chau-Chin, Shy, Paul, Lien, Chuen-Der, Keshavarzi, Ali, Prasad, Sharad, Hartmann, Hans-Dieter

Year:

1996

Language:

english

File:

PDF, 1.09 MB

english, 1996

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