IEEE Electron Device Letters

1

Resistive Switching Characteristics of WO3/ZrO2 Structure With Forming-Free, Self-Compliance, and Submicroampere Current Operation

Tsai, Tsung-Ling, Lin, Yu-Hsuan, Tseng, Tseung-Yuen

Journal:

Year:

2015

Language:

english

File:

PDF, 505 KB

english, 2015

2

A Two-Dimensional Gate Threshold Voltage Model for a Heterojunction SOI-Tunnel FET With Oxide/Source Overlap

Chander, Sweta, Baishya, Srimanta

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 561 KB

english, 2015

3

Performance of Inversion, Accumulation, and Junctionless Mode n-Type and p-Type Bulk Silicon FinFETs With 3-nm Gate Length

Thirunavukkarasu, Vasanthan, Jhan, Yi-Ruei, Liu, Yan-Bo, Wu, Yung-Chun

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 1.46 MB

english, 2015

4

Advanced Heterojunction Bipolar Transistor for Half-THz SiGe BiCMOS Technology

Fox, Alexander, Heinemann, Bernd, Rucker, Holger, Barth, Rainer, Fischer, Gerhard G., Wipf, Christian, Marschmeyer, Steffen, Aufinger, Klaus, Bock, Josef, Boguth, Sabine, Knapp, Herbert, Lachner, Rudo

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 295 KB

english, 2015

5

High Reverse Blocking and Low Onset Voltage AlGaN/GaN-on-Si Lateral Power Diode With MIS-Gated Hybrid Anode

Zhou, Qi, Jin, Yang, Shi, Yuanyuan, Mou, Jinyu, Bao, Xu, Chen, Bowen, Zhang, Bo

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 445 KB

english, 2015

6

An Innovative Ellipsoidal Layout Style to Further Boost the Electrical Performance of MOSFETs

Gimenez, Salvador P., Correia, Marcello M., Neto, Enrico D., Silva, Cristina R.

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 1.30 MB

english, 2015

7

InAs Planar Nanowire Gate-All-Around MOSFETs on GaAs Substrates by Selective Lateral Epitaxy

Zhang, Chen, Choi, Wonsik, Mohseni, Parsian K., Li, Xiuling

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 419 KB

english, 2015

8

Experimental Study of Counter-Doped Junction Termination Extension for 4H–SiC Power Devices

Jiang, Jheng-Yi, Hsu, Hua-Chih, Chu, Kuan-Wei, Huang, Chih-Fang, Zhao, Feng

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 463 KB

english, 2015

9

Visible Light-Emitting Diodes With Thin-Film-Flip- Chip-Based Wafer-Level Chip-Scale Package Technology Using Anisotropic Conductive Film Bonding

Lee, Keon Hwa, Kim, Seung Hwan, Lim, Woo-Sik, Song, June-O, Ryou, Jae-Hyun

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 1.34 MB

english, 2015

10

Modeling SiGe FinFETs With Thin Fin and Current-Dependent Source/Drain Resistance

Khandelwal, Sourabh, Duarte, Juan Pablo, Medury, Aditya, Chauhan, Yogesh S., Salahuddin, Sayeef, Hu, Chenming

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 1.25 MB

english, 2015

11

An Area-Efficient Clamp Based on Transmission Gate Feedback Technology for Power Rail Electrostatic Discharge Protection

Cai, Xiaowu, Yan, Beiping, Huo, Xiao

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 266 KB

english, 2015

12

Improved Field Emission Properties of Multidimensional Graphene-Nanotube Emitters Decorated With Au Nanoparticles

Xu, Ji, Wang, Qilong, Jia, Ruoxue, Qi, Zhiyang, Zhai, Yusheng, Zhang, Xiaobing

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 278 KB

english, 2015

13

A Study on the Degradation of In-Ga–Zn-O Thin-Film Transistors Under Current Stress by Local Variations in Density of States and Trapped Charge Distribution

Choi, Sungju, Kim, Hyeongjung, Jo, Chunhyung, Kim, Hyun-Suk, Choi, Sung-Jin, Kim, Dong Myong, Park, Jozeph, Kim, Dae Hwan

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 139 KB

english, 2015

14

Combining Bottom-Up and Top-Down Segmentation: A Way to Realize High-Performance Organic Circuit

Wang, Long, Ji, Zhuoyu, Lu, Congyan, Wang, Wei, Guo, Jingwei, Li, Ling, Li, Dongmei, Liu, Ming

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 593 KB

english, 2015

15

Multiple State Electrostatically Formed Nanowire Transistors

Segev, G., Amit, I., Godkin, A., Henning, A., Rosenwaks, Y.

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 517 KB

english, 2015

16

Improvement of High-Frequency Characteristics of InGaAsSb-Base Double Heterojunction Bipolar Transistors by Inserting a Highly Doped GaAsSb Base Contact Layer

Kashio, Norihide, Hoshi, Takuya, Kurishima, Kenji, Ida, Minoru, Matsuzaki, Hideaki

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 761 KB

english, 2015

17

Robust SiNx/AlGaN Interface in GaN HEMTs Passivated by Thick LPCVD-Grown SiNx Layer

Wang, Xinhua, Huang, Sen, Zheng, Yingkui, Wei, Ke, Chen, Xiaojuan, Liu, Guoguo, Yuan, Tingting, Luo, Weijun, Pang, Lei, Jiang, Haojie, Li, Junfeng, Zhao, Chao, Zhang, Haoxiang, Liu, Xinyu

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 1.28 MB

english, 2015

18

Performance Evaluation of Silicon and Germanium Ultrathin Body (1 nm) Junctionless Field-Effect Transistor With Ultrashort Gate Length (1 nm and 3 nm)

Jhan, Yi-Ruei, Thirunavukkarasu, Vasanthan, Wang, Cheng-Ping, Wu, Yung-Chun

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 1.02 MB

english, 2015

19

Threshold Selector With High Selectivity and Steep Slope for Cross-Point Memory Array

Song, Jeonghwan, Woo, Jiyong, Prakash, Amit, Lee, Daeseok, Hwang, Hyunsang

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 775 KB

english, 2015

20

High-Performance Temperature Sensor Based on 4H-SiC Schottky Diodes

Rao, Sandro, Pangallo, Giovanni, Pezzimenti, Fortunato, Corte, Francesco G. Della

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 498 KB

english, 2015

21

Scaling Theory of Electrically Doped 2D Transistors

Ilatikhameneh, Hesameddin, Klimeck, Gerhard, Appenzeller, Joerg, Rahman, Rajib

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 928 KB

english, 2015

22

Fabrication and Photovoltaic Properties of Dye-Sensitized Solar Cells Modified by Graphene Oxide and Magnetic Bead

Chou, Jung-Chuan, Chu, Chia-Ming, Liao, Yi-Hung, Huang, Chin-Hui, Lin, Yu-Jen, Wu, Han, Nien, Yu-Hsun

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 770 KB

english, 2015

23

A New Electroluminescent Organic Dual-Gate Field-Effect Transistor

Colalongo, Luigi, Torricelli, Fabrizio, Kovacs-Vajna, Zsolt M.

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 954 KB

english, 2015

24

The Dependence of Offset Voltage in p-Type 3C-SiC van der Pauw Device on Applied Strain

Qamar, Afzaal, Phan, Hoang-Phuong, Dao, Dzung Viet, Tanner, Philip, Dinh, Toan, Wang, Li, Dimitrijev, Sima

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 704 KB

english, 2015

25

InGaZnO Thin-Film Transistors Modified by Self-Assembled Monolayer With Different Alkyl Chain Length

Xiao, Peng, Lan, Linfeng, Dong, Ting, Lin, Zhenguo, Sun, Sheng, Song, Wei, Peng, Junbiao

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 989 KB

english, 2015

26

Experimental Reliability Improvement of Power Devices Operated Under Fast Thermal Cycling

Simon, Dan, Boianceanu, Cristian, De Mey, Gilbert, Topa, Vasile

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 1.64 MB

english, 2015

27

A Novel Silicon-on-Insulator Lateral Insulated-Gate Bipolar Transistor With Dual Trenches for Three-Phase Single Chip Inverter ICs

Weifeng Sun,, Jing Zhu,, Long Zhang,, Hui Yu,, Yicheng Du,, Keqin Huang,, Shengli Lu,, Longxing Shi,, Yangbo Yi,

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 1.06 MB

english, 2015

28

Random Telegraph Noise-Induced Sensitivity of Data Retention to Cell Position in the Programmed Distribution of NAND Flash Memory Arrays

Resnati, Davide, Monzio Compagnoni, Christian, Paolucci, Giovanni M., Miccoli, Carmine, Spinelli, Alessandro S., Lacaita, Andrea L., Visconti, Angelo, Goda, Akira

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 629 KB

english, 2015

29

The Role of the Base Stack on the AC Performance of GaN Hot Electron Transistor

Soligo, Riccardo, Chowdhury, Srabanti, Gupta, Geetak, Mishra, Umesh, Saraniti, Marco

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 465 KB

english, 2015

30

Impact of H2 High-Pressure Annealing Onto InGaAs Quantum-Well Metal–Oxide–Semiconductor Field-Effect Transistors With Al2O3/HfO2 Gate-Stack

Tae-Woo Kim,, Hyuk-Min Kwon,, Seung Heon Shin,, Chan-Soo Shin,, Won-Kyu Park,, Chiu, Eddie, Rivera, Manny, Lew, Jae Ik, Veksler, Dmitry, Orzali, Tommaso, Dae-Hyun Kim,

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 807 KB

english, 2015

31

EDS Meetings Calendar

Journal:

IEEE Electron Device Letters

Year:

2015

File:

PDF, 1.81 MB

2015

32