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1

Resistive Switching (From Fundamentals of Nanoionic Redox Processes to Memristive Device Applications) || Introduction to Nanoionic Elements for Information Technology

Ielmini, Daniele, Waser, Rainer

Year:

2016

Language:

english

File:

PDF, 1.66 MB

english, 2016

2

A recombination model for transient and stationary stress-induced leakage current

D Ielmini, A.S Spinelli, A.L Lacaita, A Martinelli, G Ghidini

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 204 KB

english, 2000

3

Reliability Study of Phase-Change Nonvolatile Memories

Pirovano, A., Redaelli, A., Pellizzer, F., Ottogalli, F., Tosi, M., Ielmini, D., Lacaita, A.L., Bez, R.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2004

Language:

english

File:

PDF, 604 KB

english, 2004

4

A Comparative Study of Characterization Techniques for Oxide Reliability in Flash Memories

Ielmini, D., Spinelli, A.S., Lacaita, A.L., vanDuuren, M.J.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2004

Language:

english

File:

PDF, 429 KB

english, 2004

5

Improving Floating-Gate Memory Reliability by Nanocrystal Storage and Pulsed Tunnel Programming

Puzzilli, G., Caputo, D., Irrera, F., MonzioCompagnoni, C., Ielmini, D., Spinelli, A.S., Lacaita, A.L., Gerardi, C.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2004

Language:

english

File:

PDF, 600 KB

english, 2004

6

Physics-based modeling approaches of resistive switching devices for memory and in-memory computing applications

Ielmini, D., Milo, V.

Journal:

Journal of Computational Electronics

Year:

2017

Language:

english

File:

PDF, 10.74 MB

english, 2017

7

Memristive and CMOS Devices for Neuromorphic Computing

Milo, Valerio, Malavena, Gerardo, Monzio Compagnoni, Christian, Ielmini, Daniele

Journal:

Year:

2020

Language:

english

File:

PDF, 6.53 MB

english, 2020

8

[IEEE 2020 IEEE International Symposium on Circuits and Systems (ISCAS) - Sevilla (2020.10.12-2020.10.14)] 2020 IEEE International Symposium on Circuits and Systems (ISCAS) - A Bio-Inspired Recurrent Neural Network with Self-Adaptive Neurons and PCM Synapses for Solving Reinforcement Learning Tasks

Bianchi, S., Munoz-Martin, I., Hashemkhani, S., Pedretti, G., Ielmini, D.

Year:

2020

File:

PDF, 2.22 MB

2020

9

Recent developments on Flash memory reliability

D. Ielmini, A.S. Spinelli, A.L. Lacaita

Journal:

Microelectronic Engineering

Year:

2005

Language:

english

File:

PDF, 648 KB

english, 2005

10

Reliability issues and modeling of Flash and post-Flash memory (Invited Paper)

Daniele Ielmini

Journal:

Microelectronic Engineering

Year:

2009

Language:

english

File:

PDF, 678 KB

english, 2009

11

Status and challenges of phase change memory modeling

A.L. Lacaita, D. Ielmini, D. Mantegazza

Journal:

Solid-State Electronics

Year:

2008

Language:

english

File:

PDF, 995 KB

english, 2008

12

Control of filament size and reduction of reset current below 10 μA in NiO resistance switching memories

F. Nardi, D. Ielmini, C. Cagli, S. Spiga, M. Fanciulli, L. Goux, D.J. Wouters

Journal:

Solid-State Electronics

Year:

2011

Language:

english

File:

PDF, 1.03 MB

english, 2011

13

Impact of gate stack process on conduction and reliability of 0.18 μm PMOSFET

G. Ghidini, A. Garavaglia, G. Giusto, A. Ghetti, R. Bottini, D. Peschiaroli, M. Scaravaggi, F. Cazzaniga, D. Ielmini

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 325 KB

english, 2003

14

A new two-trap tunneling model for the anomalous stress-induced leakage current (SILC) in Flash memories

D. Ielmini, A.S. Spinelli, A.L. Lacaita, A. Modelli

Journal:

Microelectronic Engineering

Year:

2001

Language:

english

File:

PDF, 298 KB

english, 2001

15

Explanation of programming distributions in phase-change memory arrays based on crystallization time statistics

D. Mantegazza, D. Ielmini, A. Pirovano, A.L. Lacaita, E. Varesi, F. Pellizzer, R. Bez

Journal:

Solid-State Electronics

Year:

2008

Language:

english

File:

PDF, 493 KB

english, 2008

16

Impact of Ge–Sb–Te compound engineering on the set operation performance in phase-change memories

Mattia Boniardi, Daniele Ielmini, Innocenzo Tortorelli, Andrea Redaelli, Agostino Pirovano, Mario Allegra, Michele Magistretti, Camillo Bresolin, Davide Erbetta, Alberto Modelli, Enrico Varesi, Fabio

Journal:

Solid-State Electronics

Year:

2011

Language:

english

File:

PDF, 872 KB

english, 2011

17

Modeling the Universal Set/Reset Characteristics of Bipolar RRAM by Field- and Temperature-Driven Filament Growth

Journal:

IEEE Transactions on Electron Devices

Year:

2011

Language:

english

File:

PDF, 823 KB

english, 2011

18

Electronic switching effect and phase-change transition in chalcogenide materials

Redaelli, A., Pirovano, A., Pellizzer, F., Lacaita, A.L., Ielmini, D., Bez, R.

Journal:

IEEE Electron Device Letters

Year:

2004

Language:

english

File:

PDF, 100 KB

english, 2004

19

Phase I clinical and pharmacological evaluation of the multi-tyrosine kinase inhibitor SU006668 by chronic oral dosing

Cristiana Sessa, Lucia Viganò, Giacomo Grasselli, Josè Trigo, Irene Marimon, Anna Lladò, Alberta Locatelli, Nicoletta Ielmini, Silvia Marsoni, Luca Gianni

Journal:

European Journal of Cancer

Year:

2006

Language:

english

File:

PDF, 450 KB

english, 2006

20

Analytical model for subthreshold conduction and threshold switching in chalcogenide-based memory devices

Ielmini, Daniele, Zhang, Yuegang

Journal:

Journal of Applied Physics

Year:

2007

Language:

english

File:

PDF, 1.21 MB

english, 2007

21

Complementary Switching in Oxide-Based Bipolar Resistive-Switching Random Memory

Nardi, Federico, Balatti, Simone, Larentis, Stefano, Gilmer, David C., Ielmini, Daniele

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.33 MB

english, 2013

22

Logic Computation in Phase Change Materials by Threshold and Memory Switching

Cassinerio, M., Ciocchini, N., Ielmini, D.

Journal:

Advanced Materials

Year:

2013

Language:

english

File:

PDF, 914 KB

english, 2013

23

[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - Filamentary-switching model in RRAM for time, energy and scaling projections

Ielmini, Daniele

Year:

2011

Language:

english

File:

PDF, 307 KB

english, 2011

24

[IEEE 2014 IEEE International Symposium on Circuits and Systems (ISCAS) - Melbourne VIC, Australia (2014.6.1-2014.6.5)] 2014 IEEE International Symposium on Circuits and Systems (ISCAS) - Statistical modeling of program and read variability in resistive switching devices

Ambrogio, S., Balatti, S., Cubeta, A., Ielmini, D.

Year:

2014

Language:

english

File:

PDF, 1014 KB

english, 2014

25

Recent Advances on the Modeling of Phase Change Materials and Devices

Lacaita, Andrea Leonardo, Russo, Ugo, Ielmini, Daniele

Journal:

MRS Proceedings

Year:

2008

Language:

english

File:

PDF, 766 KB

english, 2008

26

Voltage-Controlled Cycling Endurance of HfOₓ-Based Resistive-Switching Memory

Balatti, Simone, Ambrogio, Stefano, Wang, Zhongqiang, Sills, Scott, Calderoni, Alessandro, Ramaswamy, Nirmal, Ielmini, Daniele

Journal:

IEEE Transactions on Electron Devices

Year:

2015

Language:

english

File:

PDF, 3.36 MB

english, 2015

27

Neuromorphic Learning and Recognition With One-Transistor-One-Resistor Synapses and Bistable Metal Oxide RRAM

Ambrogio, Stefano, Balatti, Simone, Milo, Valerio, Carboni, Roberto, Wang, Zhong-Qiang, Calderoni, Alessandro, Ramaswamy, Nirmal, Ielmini, Daniele

Journal:

IEEE Transactions on Electron Devices

Year:

2016

Language:

english

File:

PDF, 3.85 MB

english, 2016

28

Resistive Switching (From Fundamentals of Nanoionic Redox Processes to Memristive Device Applications) || Electroforming Processes in Metal Oxide Resistive-Switching Cells

Ielmini, Daniele, Waser, Rainer

Year:

2016

Language:

english

File:

PDF, 1.42 MB

english, 2016

29

[IEEE ESSDERC 2016 - 46th European Solid-State Device Research Conference - Lausanne, Switzerland (2016.9.12-2016.9.15)] 2016 46th European Solid-State Device Research Conference (ESSDERC) - Bipolar-switching operated phase change memory (PCM) for improved high-temperature reliability

Ciocchini, N., Laudato, M., Lacaita, A. L., Ielmini, D., Boniardi, M., Varesi, E., Fantini, P.

Year:

2016

Language:

english

File:

PDF, 1.34 MB

english, 2016

30

[IEEE 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Florence, Italy (2018.5.27-2018.5.30)] 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Brain-inspired recurrent neural network with plastic RRAM synapses

Milo, Valerio, Chicca, Elisabetta, Ielmini, Daniele

Year:

2018

Language:

english

File:

PDF, 1.95 MB

english, 2018

31

In-memory computing with resistive switching devices

Ielmini, Daniele, Wong, H.-S. Philip

Journal:

Nature Electronics

Year:

2018

Language:

english

File:

PDF, 2.44 MB

english, 2018

32

[IEEE 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Florence, Italy (2018.5.27-2018.5.30)] 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Resistive switching synapses for unsupervised learning in feed-forward and recurrent neural networks

Milo, V., Pedretti, G., Laudato, M., Bricalli, A., Ambrosi, E., Bianchi, S., Chicca, E., Ielmini, D.

Year:

2018

Language:

english

File:

PDF, 2.04 MB

english, 2018

33

Recommended Methods to Study Resistive Switching Devices

Lanza, Mario, Wong, H.-S. Philip, Pop, Eric, Ielmini, Daniele, Strukov, Dimitri, Regan, Brian C., Larcher, Luca, Villena, Marco A., Yang, J. Joshua, Goux, Ludovic, Belmonte, Attilio, Yang, Yuchao, Pug

Journal:

Advanced Electronic Materials

Year:

2018

Language:

english

File:

PDF, 5.05 MB

english, 2018

34

Surface diffusion-limited lifetime of silver and copper nanofilaments in resistive switching devices

Wang, Wei, Wang, Ming, Ambrosi, Elia, Bricalli, Alessandro, Laudato, Mario, Sun, Zhong, Chen, Xiaodong, Ielmini, Daniele

Journal:

Nature Communications

Year:

2019

Language:

english

File:

PDF, 1.76 MB

english, 2019

35

Phase-change memories (PCM) – Experiments and modelling: general discussion

Bartlett, Philip, Berg, Alexandra I., Bernasconi, Marco, Brown, Simon, Burr, Geoffrey, Foroutan-Nejad, Cina, Gale, Ella, Huang, Ruomeng, Ielmini, Daniele, Kissling, Gabriela, Kolosov, Vladimir, Kozick

Journal:

Faraday Discussions

Year:

2019

Language:

english

File:

PDF, 2.53 MB

english, 2019

36

Unsupervised learning to overcome catastrophic forgetting in neural networks

Munoz-Martin, Irene, Bianchi, Stefano, Pedretti, Giacomo, Melnic, Octavian, Ambrogio, Stefano, Ielmini, Daniele

Journal:

IEEE Journal on Exploratory Solid-State Computational Devices and Circuits

Year:

2019

Language:

english

File:

PDF, 8 KB

english, 2019

37

The 6-D Model of National Culture as a Tool to Examine Cultural Interpretation of Migration Trauma-Related Dissociative Disorder: A Case Series

Callegari, C., Ielmini, M., Caselli, I., Mattia, M., Gasparini, A., Grossi, A., Ceccon, F., Poloni, N.

Journal:

Journal of Immigrant and Minority Health

Year:

2019

Language:

english

File:

PDF, 617 KB

english, 2019

38

Stochastic Memory Devices for Security and Computing

Carboni, Roberto, Ielmini, Daniele

Journal:

Advanced Electronic Materials

Year:

2019

Language:

english

File:

PDF, 6.51 MB

english, 2019

39

Resilience and recovery style: a retrospective study on associations among personal resources, symptoms, neurocognition, quality of life and psychosocial functioning in psychotic patients

Zizolfi, Daniele, Poloni, Nicola, Caselli, Ivano, Ielmini, Marta, Lucca, Giulia, Diurni, Marcello, Cavallini, Greta, Callegari, Camilla

Journal:

Psychology Research and Behavior Management

Year:

2019

Language:

english

File:

PDF, 316 KB

english, 2019

40

BrainâInspired Structural Plasticity through Reweighting and Rewiring in MultiâTerminal SelfâOrganizing Memristive Nanowire Networks

Milano, Gianluca, Pedretti, Giacomo, Fretto, Matteo, Boarino, Luca, Benfenati, Fabio, Ielmini, Daniele, Valov, Ilia, Ricciardi, Carlo

Journal:

Advanced Intelligent Systems

Year:

2020

File:

PDF, 16.22 MB

2020

41

[IEEE 2020 IEEE International Symposium on Circuits and Systems (ISCAS) - Sevilla (2020.10.12-2020.10.14)] 2020 IEEE International Symposium on Circuits and Systems (ISCAS) - Hardware Implementation of PCM-Based Neurons with Self-Regulating Threshold for Homeostatic Scaling in Unsupervised Learning

Munoz-Martin, I., Bianchi, S., Hashemkhani, S., Pedretti, G., Ielmini, D.

Year:

2020

File:

PDF, 1.46 MB

2020

42

[IEEE 2020 IEEE International Symposium on Circuits and Systems (ISCAS) - Sevilla (2020.10.12-2020.10.14)] 2020 IEEE International Symposium on Circuits and Systems (ISCAS) - A Spiking Recurrent Neural Network with Phase Change Memory Synapses for Decision Making

Pedretti, G., Milo, V., Hashemkhani, S., Mannocci, P., Melnic, O., Chicca, E., Ielmini, D.

Year:

2020

File:

PDF, 1.03 MB

2020

43

ChemInform Abstract: Highly Efficient Palladium-Catalyzed Boronic Acid Coupling Reactions in Water: Scope and Limitations.

D. BADONE, M. BARONI, R. CARDAMONE, A. IELMINI, U. GUZZI

Journal:

Year:

1998

File:

PDF, 35 KB

1998

44

Extracting kinetic parameters for homogeneous [Os(bpy)2ClPyCOOH]+ mediated enzyme reactions from cyclic voltammetry and simulations

V. Flexer, M.V. Ielmini, E.J. Calvo, P.N. Bartlett

Journal:

Bioelectrochemistry

Year:

2008

Language:

english

File:

PDF, 911 KB

english, 2008

45

Edge and percolation effects on VT window in nanocrystal memories

R. Gusmeroli, A.S. Spinelli, C. Monzio Compagnoni, D. Ielmini, A.L. Lacaita

Journal:

Microelectronic Engineering

Year:

2005

Language:

english

File:

PDF, 257 KB

english, 2005

46

Extraction of the floating-gate capacitive couplings for drain turn-on estimation in discrete-trap memories

Christian Monzio Compagnoni, Daniele Ielmini, Alessandro S. Spinelli, Andrea L. Lacaita

Journal:

Microelectronic Engineering

Year:

2006

Language:

english

File:

PDF, 169 KB

english, 2006

47

Unified mechanisms for structural relaxation and crystallization in phase-change memory devices

D. Ielmini, M. Boniardi, A.L. Lacaita, A. Redaelli, A. Pirovano

Journal:

Microelectronic Engineering

Year:

2009

Language:

english

File:

PDF, 394 KB

english, 2009

48

Filament diffusion model for simulating reset and retention processes in RRAM

S. Larentis, C. Cagli, F. Nardi, D. Ielmini

Journal:

Microelectronic Engineering

Year:

2011

Language:

english

File:

PDF, 817 KB

english, 2011

49

Study of nanocrystal memory reliability by CAST structures

Christian Monzio Compagnoni, Daniele Ielmini, Alessandro S Spinelli, Andrea L Lacaita, Cosimo Gerardi

Journal:

Solid-State Electronics

Year:

2004

Language:

english

File:

PDF, 593 KB

english, 2004

50

Picosecond time-resolved luminescence studies of recombination processes in CdTe

G Ghislotti, D Ielmini, E Riedo, M Martinelli, M Dellagiovanna

Journal:

Solid State Communications

Year:

1999

Language:

english

File:

PDF, 149 KB

english, 1999

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