Duvvury, C.: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

51

RURAL WOMEN AND AGING: IMPLICATIONS FOR WORK AND RETIREMENT OF OLDER WOMEN

Leime, Aine Ni, Duvvury, Nata, Watson, Tanya

Journal:

Innovation in Aging

Year:

2019

File:

PDF, 87 KB

2019

52

ESD issues for advanced CMOS technologies

Charvaka Duvvury, Ajith Amerasekera

Journal:

Microelectronics Reliability

Year:

1996

Language:

english

File:

PDF, 679 KB

english, 1996

53

[IEEE Proceedings of 17th Annual Electrical Overstress/Electrostatic Discharge Symposium - Phoenix, AZ, USA (1995.09.12-1995.09.14)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings - Advanced CMOS protection device trigger mechanisms during CDM

Duvvury, C., Amerasekera, A.

Year:

1995

Language:

english

File:

PDF, 1.28 MB

english, 1995

54

Synthesis, characterization and activity pattern of carbon nanofibers based copper/zirconia catalysts for carbon dioxide hydrogenation to methanol: Influence of calcination temperature

Ud Din, Israf, Shaharun, Maizatul S., Subbarao, Duvvuri, Naeem, A.

Journal:

Journal of Power Sources

Year:

2015

Language:

english

File:

PDF, 2.16 MB

english, 2015

55

[ESD Assoc Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 - Anaheim, CA, USA (26-28 Sept. 2000)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) - Substrate pump NMOS for ESD protection applications

Duvvury, C., Ramaswamy, S., Amerasekera, A., Cline, R.A., Andresen, B.H., Gupta, V.

Year:

2000

Language:

english

File:

PDF, 1.08 MB

english, 2000

56

[IEEE 2015 7th International Conference on Information Technology and Electrical Engineering (ICITEE) - Chiang Mai, Thailand (2015.10.29-2015.10.30)] 2015 7th International Conference on Information Technology and Electrical Engineering (ICITEE) - Model-based stator interturn short-circuit fault detection and diagnosis in induction motors

Duvvuri, S S S R Sarathbabu, Detroja, Ketan

Year:

2015

Language:

english

File:

PDF, 493 KB

english, 2015

57

System Level ESD Co-Design (Duvvury/System Level ESD Co-Design) || Front Matter

Duvvury, Charvaka, Gossner, Harald

Year:

2015

Language:

english

File:

PDF, 115 KB

english, 2015

58

Erosion of pension rights: Experiences of older women in Ireland

Duvvury, Nata, Ní Léime, Áine, Callan, Aoife

Journal:

European Journal of Cultural and Political Sociology

Year:

2017

Language:

english

File:

PDF, 1.97 MB

english, 2017

59

Theoretical analysis of the noise characteristics of an ejector jet

Duvvuri Tirumalesa

Journal:

Journal of Sound and Vibration

Year:

1973

Language:

english

File:

PDF, 805 KB

english, 1973

60

[IEEE 25th International Reliability Physics Symposium - San Diego, CA, USA (1987.04.7-1987.04.9)] 25th International Reliability Physics Symposium - ESD Phenomena and Protection Issues in CMOS Output Buffers

Duvvury, C., Rountree, R.N., Fong, Y., McPhee, R.A.

Year:

1987

Language:

english

File:

PDF, 8.16 MB

english, 1987

61

System Level ESD Co-Design (Duvvury/System Level ESD Co-Design) || Glossary

Duvvury, Charvaka, Gossner, Harald

Year:

2015

Language:

english

File:

PDF, 41 KB

english, 2015

62

Perineural Invasion in Parotid Gland Malignancies

Huyett, Phillip, Duvvuri, Umamaheswar, Ferris, Robert L., Johnson, Jonas T., Schaitkin, Barry M., Kim, Seungwon

Journal:

Otolaryngology - Head and Neck Surgery

Year:

2018

Language:

english

File:

PDF, 143 KB

english, 2018

63

Low-cost adsorbent derived from the coconut shell for the removal of hexavalent chromium from aqueous medium

Chandana, L., Krushnamurty, Killi, Suryakala, Duvvuri, Subrahmanyam, Ch.

Journal:

Materials Today: Proceedings

Year:

2019

Language:

english

File:

PDF, 1.61 MB

english, 2019

64

Experimental, numerical and exergy analyses of a dual fuel combustion engine fuelled with syngas and biodiesel/diesel blends

Krishnamoorthi, M., Sreedhara, S., Prakash Duvvuri, Pavan

Journal:

Year:

2020

Language:

english

File:

PDF, 6.33 MB

english, 2020

65

Rotational atherectomy: Improved procedural outcome with evolution of technique and equipment. single-center results of first 1,000 patients

Annapoorna Kini, Jonathan D. Marmur, Srinivas Duvvuri, George Dangas, Sanjay Choudhary, Samin K. Sharma

Journal:

Catheterization and Cardiovascular Interventions

Year:

1999

Language:

english

File:

PDF, 60 KB

english, 1999

66

Margin assessment in oral squamous cell carcinoma

Duvvuri, Uma, Seethala, Raja R., Chiosea, Simion

Journal:

Year:

2014

Language:

english

File:

PDF, 58 KB

english, 2014

67

[IEEE Proceedings of International Reliability Physics Symposium - Dallas, TX, USA (1996.04.30-1996.05.2)] Proceedings of International Reliability Physics Symposium RELPHY-96 - Modeling MOS snapback and parasitic bipolar action for circuit-level ESD and high current simulations

Amerasekera, A., Ramaswamy, S., Mi-Chang Chang,, Duvvury, C.

Year:

1996

Language:

english

File:

PDF, 834 KB

english, 1996

68

Effects of Synthesis Conditions on the Textural and Morphological Properties of Mesoporous Silica (SBA-15)

Tasfy, Sara Faiz Hanna, Zabidi, Noor Asmawati Mohd, Subbarao, Duvvuri, Shaharun, Maizatul Shima

Journal:

Applied Mechanics and Materials

Year:

2013

Language:

english

File:

PDF, 1.19 MB

english, 2013

69

System Level ESD Co-Design (Duvvury/System Level ESD Co-Design) || Index

Duvvury, Charvaka, Gossner, Harald

Year:

2015

Language:

english

File:

PDF, 66 KB

english, 2015

70

[ESD Assoc Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 - Orlando, FL, USA (28-30 Sept. 1999)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 1999 (IEEE Cat. No.99TH8396) - A strategy for characterization and evaluation of ESD robustness of CMOS semiconductor technologies

Voldman, S., Anderson, W., Ashton, R., Chaine, M., Duvvury, C., Maloney, T., Worley, E.

Year:

1999

Language:

english

File:

PDF, 1.17 MB

english, 1999

71

India’s International Integration and Challenges to Sustaining Growth

Das, Abhiman, Mohapatra, Sanket, Gokarn, Subir, Sander, Frederico Gil, Subbarao, Duvvuri, Chinoy, Sajjid Z., Gupta, Abhijit Sen, Bhattacharya, Saugata, Acharya, Viral V.

Journal:

Year:

2017

Language:

english

File:

PDF, 996 KB

english, 2017

72

Challenges in Alzheimer Disease Drug Discovery and Development: The Role of Modeling, Simulation and Open Data

Conrado, Daniela J, Duvvuri, Sridhar, Geerts, Hugo, Burton, Jackson, Biesdorf, Carla, Ahamadi, Malidi, Macha, Sreeraj, Hather, Gregory, Morales, Juan Francisco, Podichetty, Jagdeep, Nicholas, Timothy,

Journal:

Clinical Pharmacology & Therapeutics

Year:

2020

Language:

english

File:

PDF, 14.46 MB

english, 2020

73

A novel surgeon credentialing and quality assurance process using transoral surgery for oropharyngeal cancer in ECOG-ACRIN Cancer Research Group Trial E3311

Ferris, Robert L., Flamand, Yael, Holsinger, F. Christopher, Weinstein, Gregory S., Quon, Harry, Mehra, Ranee, Garcia, Joaquin J., Hinni, Michael L., Gross, Neil D., Sturgis, Erich M., Duvvuri, Umamah

Journal:

Year:

2020

File:

PDF, 695 KB

2020

74

[IEEE 26th Annual Proceedings Reliability Physics Symposium 1988 - Monterey, CA, USA (12-14 April 1988)] 26th Annual Proceedings Reliability Physics Symposium 1988 - Internal chip ESD phenomena beyond the protection circuit

Duvvury, C., Rountree, R.N., Adams, O.

Year:

1988

Language:

english

File:

PDF, 711 KB

english, 1988

75

[IEEE International Electron Devices Meeting. IEDM Technical Digest - Washington, DC, USA (7-10 Dec. 1997)] International Electron Devices Meeting. IEDM Technical Digest - Lateral DMOS design for ESD robustness

Duvvury, C., Carvajal, F., Jones, C., Briggs, D.

Year:

1997

Language:

english

File:

PDF, 361 KB

english, 1997

76

Profiling the reference price consumer

Sangkil Moon, Gary J. Russell, Sri Devi Duvvuri

Journal:

Journal of Retailing

Year:

2006

Language:

english

File:

PDF, 170 KB

english, 2006

77

ESD: a pervasive reliability concern for IC technologies

Duvvury, C., Amerasekera, A.

Journal:

Proceedings of the IEEE

Year:

1993

Language:

english

File:

PDF, 1.67 MB

english, 1993

78

[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - Unique ESD Failure Mechanism in a MuGFET Technology

Gossner, Harald, Russ, Christian, Siegelin, Frank, Schneider, Jens, Schruefer, Klaus, Schulz, Thomas, Duvvury, Charvaka, Cleavelin, C. Rinn, Xiong, Weize

Year:

2006

Language:

english

File:

PDF, 2.80 MB

english, 2006

79

Intraoperative identification of the human communicating nerve during thyroidectomy

Hodnett, Benjamin L., Schmitt, Nicole C., Thirumala, Parthasarathy D., Duvvuri, Umamaheswar

Journal:

Journal of Surgical Case Reports

Year:

2015

Language:

english

File:

PDF, 383 KB

english, 2015

80

Transoral robotic surgery for the pediatric head and neck surgeries

Erkul, Evren, Duvvuri, Umamaheswar, Mehta, Deepak, Aydil, Utku

Journal:

European Archives of Oto-Rhino-Laryngology

Year:

2017

Language:

english

File:

PDF, 338 KB

english, 2017

81

[IEEE 2018 IEEE 8th Power India International Conference (PIICON) - Kurukshetra, India (2018.12.10-2018.12.12)] 2018 IEEE 8th Power India International Conference (PIICON) - Rotor Inter-turn Short-circuit Fault Diagnostics Relevant Modeling of Slip-Ring Induction Motor

Duvvuri, SSSR Sarathbabu

Year:

2018

Language:

english

File:

PDF, 168 KB

english, 2018

82

Robotics in Otolaryngology

Duvvuri, Umamaheswar, Sharma, Arun, Thaler, Erica R.

Journal:

Otolaryngologic Clinics of North America

Year:

2020

File:

PDF, 34 KB

2020

83

[IEEE 2004 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Grapevine, TX, USA (2004.09.19-2004.09.23)] 2004 Electrical Overstress/Electrostatic Discharge Symposium - Gate oxide failures due to anomalous stress from HBM ESD testers

Duvvury, Charvaka, Steinhoff, Robert, Boselli, Gianluca, Reddy, Vijay, Kunz, Hans, Marum, Steve, Cline, Roger

Year:

2004

Language:

english

File:

PDF, 404 KB

english, 2004

84

[ESD Assoc Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 - Reno, NV, USA (6-8 Oct. 1998)] Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) - An automated tool for detecting ESD design errors

Siha, S., Swaminathan, H., Kadamati, G., Duvvury, C.

Year:

1998

Language:

english

File:

PDF, 644 KB

english, 1998

85

Synthesis and Characterization of Bimetallic Fe/Co Nanocatalyst on CNTs for Fischer-Tropsch Reaction

Ali, Sardar, Mohd Zabidi, Noor Asmawati, Subbarao, Duvvuri

Journal:

Journal of Nano Research

Year:

2012

Language:

english

File:

PDF, 3.63 MB

english, 2012

86

System efficient ESD design

Gossner, H., Duvvury, C.

Journal:

Microelectronics Reliability

Year:

2015

Language:

english

File:

PDF, 895 KB

english, 2015

87

A Meta-Analysis and Systematic Review of Prospective Trials: Eckardt Score with Peroral Endoscopic Myotomy (POEM) Versus Surgical Myotomy in Managing Adult Achalasia Patients

Duvvuri, Abhiram, Moole, Vishnu, Poosala, Anwesh, Boddireddy, Raghuveer R., Uppu, Achuta, Emani, Vamsi, Dharmapuri, Sowmya, Puli, Srinivas R., Moole, Harsha V.

Journal:

Gastroenterology

Year:

2017

Language:

english

File:

PDF, 654 KB

english, 2017

88

Thermodynamics Analysis of Refinery Sludge Gasification in Adiabatic Updraft Gasifier

Ahmed, Reem, Sinnathambi, Chandra M., Eldmerdash, Usama, Subbarao, Duvvuri

Journal:

The Scientific World JOURNAL

Year:

2014

Language:

english

File:

PDF, 1.58 MB

english, 2014

89

[IEEE International Electron Devices Meeting. Technical Digest - Washington, DC, USA (2-5 Dec. 2001)] International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) - Gate bias induced heating effect and implications for the design of deep submicron ESD protection

Kwang-Hoon Oh,, Duvvury, C., Banerjee, K., Dutton, R.W.

Year:

2001

Language:

english

File:

PDF, 491 KB

english, 2001

90

Endoscopic transnasal anterior skull base resection for the treatment of sinonasal malignancies

Ricardo L. Carrau, Amin B. Kassam, Carl H. Snyderman, Umamaheswar Duvvuri, Arlan Mintz, Paul Gardner

Journal:

Operative Techniques in Otolaryngology-Head and Neck Surgery

Year:

2006

Language:

english

File:

PDF, 1.09 MB

english, 2006

91

Impact of gate-to-contact spacing on ESD performance of salicided deep submicron NMOS transistors

Kwang-Hoon Oh, Duvvury, C., Banerjee, K., Dutton, R.W.

Journal:

IEEE Transactions on Electron Devices

Year:

2002

Language:

english

File:

PDF, 1.03 MB

english, 2002

92

[IEEE 24th International Reliability Physics Symposium - Anaheim, CA, USA (1986.04.1-1986.04.3)] 24th International Reliability Physics Symposium - ESD Protection Reliability in 1μM CMOS Technologies

Duvvury, C., McPhee, R.A., Baglee, D.A., Rountree, R.N.

Year:

1986

Language:

english

File:

PDF, 8.25 MB

english, 1986

93

Gate oxide failures due to anomalous stress from HBM ESD testers

Charvaka Duvvury, Robert Steinhoff, Gianluca Boselli, Vijay Reddy, Hans Kunz, Steve Marum, Roger Cline

Journal:

Microelectronics Reliability

Year:

2006

Language:

english

File:

PDF, 280 KB

english, 2006

94

An Analysis of Assortment Choice in Grocery Retailing

Kwak, Kyuseop, Duvvuri, Sri Devi, Russell, Gary J.

Journal:

Journal of Retailing

Year:

2015

Language:

english

File:

PDF, 1.05 MB

english, 2015

95

System Level ESD Co-Design (Duvvury/System Level ESD Co-Design) || Introduction

Duvvury, Charvaka, Gossner, Harald

Year:

2015

Language:

english

File:

PDF, 459 KB

english, 2015

96

Comparison of the seventh and eighth edition american joint committee on cancer oral cavity staging systems

Cramer, John D., Reddy, Abhita, Ferris, Robert L., Duvvuri, Umamaheswar, Samant, Sandeep

Journal:

The Laryngoscope

Year:

2018

Language:

english

File:

PDF, 582 KB

english, 2018

97

Design methodology and optimization of gate-driven NMOS ESD protection circuits in submicron CMOS processes

Chen, J.Z., Amerasekera, E.A., Duvvury, C.

Journal:

IEEE Transactions on Electron Devices

Year:

1998

Language:

english

File:

PDF, 510 KB

english, 1998

98

Analysis of nonuniform ESD current distribution in deep submicron NMOS transistors

Kwang-Hoon Oh, Duvvury, C., Banerjee, K., Dutton, R.W.

Journal:

IEEE Transactions on Electron Devices

Year:

2002

Language:

english

File:

PDF, 2.06 MB

english, 2002

99

[IEEE 27th Annual Proceedings., International Reliability Physics Symposium - Phoenix, AZ, USA (11-13 April 1989)] 27th Annual Proceedings., International Reliability Physics Symposium - ESD phenomena in graded junction devices

Duvvury, C., Rountree, R.N., Stiegler, H.J., Polgreen, T., Corum, D.

Year:

1989

Language:

english

File:

PDF, 741 KB

english, 1989

100

[IEEE Proceedings of 1995 IEEE International Reliability Physics Symposium - Las Vegas, NV (1995.04.4-1995.04.6)] 33rd IEEE International Reliability Physics Symposium - EOS/ESD reliability of deep sub-micron NMOS protection devices

Ramaswamy, S., Duvvury, C., Sung-Mo Kang,

Year:

1995

Language:

english

File:

PDF, 1.34 MB

english, 1995

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Z-Library Since 2009 support@1delivery.pm

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски