J. Jomaah: search on Z-Library

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1

Imagerie du rachis lombaire opéré

Miquel, A., Court, C., Pradel, C., Bienvenot, P., Jomaah, N., Menu, Y.

Journal:

Journal de Radiologie

Year:

2010

Language:

french

File:

PDF, 2.64 MB

french, 2010

2

Durov Plot: A Computer Program for Processing and Plotting Hydrochemical Data

Abdulaziz M. Al-Bassam, Hussein S. Awad, Jomaah A. Al-Alawi

Journal:

Year:

1997

File:

PDF, 410 KB

1997

3

Diagnosis of Acute Groin Injuries: A Prospective Study of 110 Athletes

Serner, A., Tol, J. L., Jomaah, N., Weir, A., Whiteley, R., Thorborg, K., Robinson, M., Holmich, P.

Journal:

American Journal of Sports Medicine

Year:

2015

Language:

english

File:

PDF, 161 KB

english, 2015

4

Estimating the skeletal age from two and three-dimensional computed tomography reconstructions of the pubic symphysis and the fourth rib

Trodi, N.I., Jomaah, N., Koch, G., Alavi, Z., Aho, S., Ben Salem, D.

Journal:

La Revue de Médecine Légale

Year:

2016

File:

PDF, 1.48 MB

2016

5

Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors

S Haendler, J Jomaah, G Ghibaudo, F Balestra

Journal:

Microelectronics Reliability

Year:

2001

Language:

english

File:

PDF, 560 KB

english, 2001

6

Analysis and modeling of self-heating effects in thin-film SOI MOSFETs as a function of temperature

J. Jomaah, G. Ghibaudo, F. Balestra

Journal:

Solid-State Electronics

Year:

1995

Language:

english

File:

PDF, 337 KB

english, 1995

7

Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs

M.A. Exarchos, G.J. Papaioannou, J. Jomaah, F. Balestra

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 492 KB

english, 2009

8

Low frequency noise and reliability properties pf 0.12 μm CMOS devices with Ta2O5 as gate dielectrics

M. Fadlallah, A. Szewczyk, C. Giannakopoulos, B. Cretu, F. Monsieur, T. Devoivre, J. Jomaah, G. Ghibaudo

Journal:

Microelectronics Reliability

Year:

2001

File:

PDF, 295 KB

2001

9

An overview of hot-carrier induced degradation in 0.25 μm Partially and Fully Depleted SOI N-MOSFET's

F. Dieudonné, F. Daugé, J. Jomaah, C. Raynaud, F. Balestra

Journal:

Microelectronics Reliability

Year:

2001

File:

PDF, 260 KB

2001

10

Low frequency noise in 0.12 μm partially and fully depleted SOI technology

François Dieudonné, Sébastien Haendler, Jalal Jomaah, Francis Balestra

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 269 KB

english, 2003

11

Impact of latch phenomenon on low-frequency noise in SOI MOSFETs

J. Jomaah, F. Balestra

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 207 KB

english, 1998

12

Low frequency noise in multi-gate SOI CMOS devices

Leily Zafari, Jalal Jomaah, Gérard Ghibaudo

Journal:

Solid-State Electronics

Year:

2007

Language:

english

File:

PDF, 267 KB

english, 2007

13

Analytical unified threshold voltage model of short-channel FinFETs and implementation

N. Fasarakis, A. Tsormpatzoglou, D.H. Tassis, C.A. Dimitriadis, K. Papathanasiou, J. Jomaah, G. Ghibaudo

Journal:

Solid-State Electronics

Year:

2011

Language:

english

File:

PDF, 1.43 MB

english, 2011

14

[IEEE 2018 International Conference on High Performance Computing & Simulation (HPCS) - Orleans (2018.7.16-2018.7.20)] 2018 International Conference on High Performance Computing & Simulation (HPCS) - Snow Depth Retrieval Algorithm from Radar Backscattering Measurements at L- and X- Band Using Multi-Incidence Angles

Mazeh, Fatima, Hammoud, Bilal, Ayad, Hussam, Ndagijimana, Fabien, Faour, Ghaleb, Fadlallah, Majida, Jomaah, Jalal

Year:

2018

Language:

english

File:

PDF, 7 KB

english, 2018

15

The impact of static and dynamic degradation on SOI “smart-cut” floating body MOSFETs

M.A. Exarchos, G.J. Papaioannou, J. Jomaah, F. Balestra

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 293 KB

english, 2005

16

Low frequency noise and hot-carrier reliability in advanced SOI MOSFETs

François Dieudonné, Sébastien Haendler, Jalal Jomaah, Francis Balestra

Journal:

Solid-State Electronics

Year:

2004

Language:

english

File:

PDF, 681 KB

english, 2004

17

An explicit analytical charge-based model of undoped independent double gate MOSFET

Marina Reyboz, Olivier Rozeau, Thierry Poiroux, Patrick Martin, Jalal Jomaah

Journal:

Solid-State Electronics

Year:

2006

Language:

english

File:

PDF, 213 KB

english, 2006

18

A unified short-channel compact model for cylindrical surrounding-gate MOSFET

Bastien Cousin, Marina Reyboz, Olivier Rozeau, Marie-Anne Jaud, Thomas Ernst, Jalal Jomaah

Journal:

Solid-State Electronics

Year:

2011

Language:

english

File:

PDF, 666 KB

english, 2011

19

Impact of front oxide quality on transient effects and low-frequency noise in partially and fully depleted SOI N-MOSFETs

S. Haendler, F. Dieudonné, J. Jomaah, F. Balestra, C. Raynaud, J.L. Pelloie

Journal:

Solid-State Electronics

Year:

2002

Language:

english

File:

PDF, 682 KB

english, 2002

20

Static and low frequency noise characterization in surface- and buried-mode 0.1 μm PMOSFETS

M. Fadlallah, G. Ghibaudo, J. Jomaah, G. Guégan

Journal:

Solid-State Electronics

Year:

2003

Language:

english

File:

PDF, 391 KB

english, 2003

21

Static and low frequency noise characterization of surface- and buried-mode 0.1 μm P and N MOSFETs

M Fadlallah, G Ghibaudo, J Jomaah, M Zoaeter, G Guegan

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 393 KB

english, 2002

22

SOI Technologies Overview for Low-Power Low-Voltage Radio-Frequency Applications

O. Rozeau, J. Jomaah, S. Haendler, J. Boussey, F. Balestra

Journal:

Analog Integrated Circuits and Signal Processing

Year:

2000

Language:

english

File:

PDF, 530 KB

english, 2000

23

Low-frequency noise in advanced CMOS/SOI devices

Jomaah, J., Balestra, F.

Journal:

IEE Proceedings - Circuits Devices and Systems

Year:

2004

Language:

english

File:

PDF, 1.53 MB

english, 2004

24

Analysis of the latch and breakdown phenomena in N and P channel thin film SOI MOSFET's as a function of temperature

Balestra, F., Jomaah, J., Ghibaudo, G., Faynot, O., Auberton-Herve, A.J., Giffard, B.

Journal:

IEEE Transactions on Electron Devices

Year:

1994

Language:

english

File:

PDF, 388 KB

english, 1994

25

Improved analysis and modeling of low-frequency noise in nanoscale MOSFETs

Ioannidis, E.G., Dimitriadis, C.A., Haendler, S., Bianchi, R.A., Jomaah, J., Ghibaudo, G.

Journal:

Solid-State Electronics

Year:

2012

Language:

english

File:

PDF, 394 KB

english, 2012

26

Ligamentous Injuries and the Risk of Associated Tissue Damage in Acute Ankle Sprains in Athletes: A Cross-sectional MRI Study

Roemer, F. W., Jomaah, N., Niu, J., Almusa, E., Roger, B., D'Hooghe, P., Geertsema, C., Tol, J. L., Khan, K., Guermazi, A.

Journal:

American Journal of Sports Medicine

Year:

2014

Language:

english

File:

PDF, 1.63 MB

english, 2014

27

[IEEE ESSDERC 2012 - 42nd European Solid State Device Research Conference - Bordeaux, France (2012.09.17-2012.09.21)] 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) - Impact of front-back gate coupling on low frequency noise in 28 nm FDSOI MOSFETs

Theodorou, Christoforos G., Ioannidis, Eleftherios G., Haendler, Sebastien, Planes, Nicolas, Arnaud, Franck, Jomaah, Jalal, Dimitriadis, Charalabos A., Ghibaudo, Gerard

Year:

2012

Language:

english

File:

PDF, 1.95 MB

english, 2012

28

Acute groin injuries in 109 athletes – Clinical and radiological findings

Serner, A., Tol, J.L., Weir, A., Jomaah, N., Whiteley, R., Robinson, M., Thorborg, K., Holmich, P.

Journal:

Journal of Science and Medicine in Sport

Year:

2014

Language:

english

File:

PDF, 57 KB

english, 2014

29

[IEEE ICECS 2000. 7th IEEE International Conference on Electronics, Circuits and Systems - Jounieh, Lebanon (17-20 Dec. 2000)] ICECS 2000. 7th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.00EX445) - Numerical simulation and modeling of static characteristics and electrical noise in submicron MOS transistors

Fadlallah, M., Ghibaudo, G., Jomaah, J., Zoaeter, M.

Year:

2000

Language:

english

File:

PDF, 304 KB

english, 2000

30

[IEEE 2012 International Semiconductor Conference Dresden-Grenoble (ISCDG) - formerly known as the Semiconductor Conference Dresden (SCD) - Grenoble, France (2012.09.24-2012.09.26)] 2012 International Semiconductor Conference Dresden-Grenoble (ISCDG) - Front-back gate coupling effect on 1/f noise in ultra-thin Si film FDSOI MOSFETs

Theodorou, C. G., Ioannidis, E. G., Haendler, S., Planes, N., Arnaud, F., Andrieu, F., Poiroux, T., Faynot, O., Jomaah, J., Dimitriadis, C. A., Ghibaudo, G.

Year:

2012

Language:

english

File:

PDF, 939 KB

english, 2012

31

Radiographically Occult and Subtle Fractures: A Pictorial Review

Jarraya, Mohamed, Hayashi, Daichi, Roemer, Frank W., Crema, Michel D., Diaz, Luis, Conlin, Jane, Marra, Monica D., Jomaah, Nabil, Guermazi, Ali

Journal:

Radiology Research and Practice

Year:

2013

Language:

english

File:

PDF, 3.40 MB

english, 2013

32

[IEEE 2015 Third International Conference on Technological Advances in Electrical, Electronics and Computer Engineering (TAEECE) - Beirut, Lebanon (2015.4.29-2015.5.1)] 2015 Third International Conference on Technological Advances in Electrical, Electronics and Computer Engineering (TAEECE) - Compact SIW leaky wave antenna

Khalil, Mohamad, Kamarei, Mahmoud, Jomaah, Jalal, Ayad, Hussam

Year:

2015

Language:

english

File:

PDF, 1.11 MB

english, 2015

33

SPIE Proceedings [SPIE SPIE's First International Symposium on Fluctuations and Noise - Santa Fe, NM (Sunday 1 June 2003)] Noise in Devices and Circuits - An overview of low-frequency noise in advanced CMOS/SOI transistors

Jomaah, Jalal, Balestra, Francis, Deen, M. Jamal, Celik-Butler, Zeynep, Levinshtein, Michael E.

Year:

2003

Language:

english

File:

PDF, 290 KB

english, 2003

34

[IEEE 2016 IEEE Middle East Conference on Antennas and Propagation (MECAP) - Beirut, Lebanon (2016.9.20-2016.9.22)] 2016 IEEE Middle East Conference on Antennas and Propagation (MECAP) - Near-field measurement system with 3D magnetic-field probe design for dosimetric applications

Jomaa, K., Ndagijimana, F., Jomaah, J., Ayad, H.

Year:

2016

Language:

english

File:

PDF, 664 KB

english, 2016

35

Ethnic differences in bony hip morphology: A cohort of 445 professional soccer players

Mosler, A., Crossley, K., Waarsing, J., Jomaah, N., Weir, A., HÓ§lmich, P., Agricola, R.

Journal:

Journal of Science and Medicine in Sport

Year:

2017

Language:

english

File:

PDF, 50 KB

english, 2017

36

[IEEE 2017 International Symposium on Electromagnetic Compatibility (EMC EUROPE) - Angers (2017.9.4-2017.9.7)] 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE - Near-field characterization for 13.56 MHz RFID antenna

Jomaa, Kassem, Ndagijimana, Fabien, Ayad, Hussam, Fadlallah, Majida, Jomaah, Jalal

Year:

2017

Language:

english

File:

PDF, 1.10 MB

english, 2017

37

[IEEE 2018 IEEE Middle East and North Africa Communications Conference (MENACOMM) - Jounieh, Lebanon (2018.4.18-2018.4.20)] 2018 IEEE Middle East and North Africa Communications Conference (MENACOMM) - Direction of arrival estimation for LTE-Advanced and 5G in the uplink

Haroun, Mohammad H., Cabedo-Fabres, Marta, Ayad, Hussam, Jomaah, Jalal, Ferrando-Bataller, Miguel

Year:

2018

Language:

english

File:

PDF, 1.21 MB

english, 2018

38

Performance Analysis of Detector Algorithms Using Drone-Based Radar Systems for Oil Spill Detection

Hammoud, Bilal, Faour, Ghaleb, Ayad, Hussam, Ndagijimana, Fabien, Jomaah, Jalal

Journal:

Proceedings (American Bar Association. Section of International and Comparative Law)

Year:

2018

Language:

english

File:

PDF, 853 KB

english, 2018

39

[IEEE 2018 International Conference on High Performance Computing & Simulation (HPCS) - Orleans (2018.7.16-2018.7.20)] 2018 International Conference on High Performance Computing & Simulation (HPCS) - Oil Thickness Estimation Using Single- and Dual- Frequency Maximum-Likelihood Approach

Hammoud, Bilal, Ayad, Hussam, Fadlallah, Majida, Jomaah, Jalal, Ndagijimana, Fabien, Faour, Ghaleb

Year:

2018

Language:

english

File:

PDF, 7 KB

english, 2018

40

[IEEE 2019 7th Mediterranean Congress of Telecommunications (CMT) - Fès, Morocco (2019.10.24-2019.10.25)] 2019 7th Mediterranean Congress of Telecommunications (CMT) - Ultra Broadband Curved Pyramidal Absorber Metamaterial in the UHF/SHF Region

Fneish, Z., Ayad, H., Kadi, M., Mazeh, F., Jomaah, J., Faour, G.

Year:

2019

Language:

english

File:

PDF, 513 KB

english, 2019

41

[IEEE 2020 IEEE International Symposium on Circuits and Systems (ISCAS) - Sevilla (2020.10.12-2020.10.14)] 2020 IEEE International Symposium on Circuits and Systems (ISCAS) - Memristor Overwrite Logic (MOL) for Energy-Efficient In-Memory DNN

Ali, Khaled Alhaj, Rizk, Mostafa, Baghdadi, Amer, Diguet, Jean-Philippe, Jomaah, Jalal

Year:

2020

File:

PDF, 2.25 MB

2020

42

Low frequency noise in silicon on insulator MOSFET's: Experimental and numerical simulation results

J. Jomaah, F. Balestra, G. Ghibaudo

Journal:

Microelectronic Engineering

Year:

1993

Language:

english

File:

PDF, 353 KB

english, 1993

43

Investigation of polarization mechanisms on unibond buried oxide layer

V. Tsouti, G. Papaioannou, J. Jomaah, F. Balestra

Journal:

Microelectronic Engineering

Year:

2007

Language:

english

File:

PDF, 330 KB

english, 2007

44

Coupling effects and channels separation in FinFETs

F. Daugé, J. Pretet, S. Cristoloveanu, A. Vandooren, L. Mathew, J. Jomaah, B.-Y. Nguyen

Journal:

Solid-State Electronics

Year:

2004

Language:

english

File:

PDF, 590 KB

english, 2004

45

Polysilicon high frequency devices for large area electronics: Characterization, simulation and modeling

J.L. Botrel, O. Savry, O. Rozeau, F. Templier, J. Jomaah

Journal:

Thin Solid Films

Year:

2007

Language:

english

File:

PDF, 1.12 MB

english, 2007

46

Reliability of ultra-thin film deep submicron SIMOX nMOSFETs

O. Potavin, S. Haendler, J. Jomaah, F. Balestra, C. Raynaud

Journal:

Solid-State Electronics

Year:

2002

Language:

english

File:

PDF, 318 KB

english, 2002

47

Thorough characterization of deep-submicron surface and buried channel pMOSFETs

B. Cretu, M. Fadlallah, G. Ghibaudo, J. Jomaah, F. Balestra, G. Guégan

Journal:

Solid-State Electronics

Year:

2002

Language:

english

File:

PDF, 384 KB

english, 2002

48

Shrinking from 0.25 down to 0.12 μm SOI CMOS technology node: a contribution to low-frequency noise in partially depleted N-MOSFETs

F Dieudonné, S Haendler, J Jomaah, F Balestra

Journal:

Solid-State Electronics

Year:

2003

Language:

english

File:

PDF, 344 KB

english, 2003

49

Experimental investigation and numerical simulation of low-frequency noise in thin film SOI MOSFETs

J. Jomaah, F. Balestra, G. Ghibaudo

Journal:

physica status solidi (a)

Year:

1994

Language:

english

File:

PDF, 265 KB

english, 1994

50

Bony sequestrum: a radiologic review

Félicie Jennin, Valérie Bousson, Caroline Parlier, Nabil Jomaah, Vanessa Khanine, Jean-Denis Laredo

Journal:

Skeletal Radiology

Year:

2011

Language:

english

File:

PDF, 806 KB

english, 2011