66

Depth profiles of nickel ion damage in helium-implanted nickel

Year:
1982
Language:
english
File:
PDF, 2.21 MB
english, 1982
79

Radiation-induced precipitation at grain boundaries in Ni-8 at.% Si

Year:
1991
Language:
english
File:
PDF, 1.43 MB
english, 1991
90

DEVICE PHYSICS:Pushing the Limits

Year:
1999
Language:
english
File:
PDF, 707 KB
english, 1999
94

Emitter-base breakdown: Measurement and simulation

Year:
1992
Language:
english
File:
PDF, 249 KB
english, 1992
96

Scaling Transistors into the Deep-Submicron Regime

Year:
2000
Language:
english
File:
PDF, 213 KB
english, 2000