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1

Transverse-ultrasonic-attenuation determination of the energy gap between the normal and superconducting states of zinc

Breashears, E. H., Cleavelin, C. R., Marshall, B. J.

Journal:

Physical Review B

Year:

1976

Language:

english

File:

PDF, 431 KB

english, 1976

2

[IEEE 2008 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2008.06.15-2008.06.16)] 2008 IEEE Silicon Nanoelectronics Workshop - Multigate SOI MOSFETs: Accumulation-mode vs. enhancement-mode

Afzalian, A., Lederer, D., Lee, C.-W, Yan, R., Xiong, W., Cleavelin, C. Rinn, Colinge, J.-P.

Year:

2008

Language:

english

File:

PDF, 921 KB

english, 2008

3

[IEEE 2007 IEEE Symposium on VLSI Technology - Kyoto, Japan (2007.06.12-2007.06.14)] 2007 IEEE Symposium on VLSI Technology - BSIM-MG: A Versatile Multi-Gate FET Model for Mixed-Signal Design

Dunga, Mohan V., Lin, Chung-Hsun, Lu, Darsen D., Xiong, Weize, Cleavelin, C. R., Patruno, P., Hwang, Jiunn-Ren, Yang, Fu-Liang, Niknejad, Ali M., Hu, Chenming

Year:

2007

Language:

english

File:

PDF, 884 KB

english, 2007

4

ESD Evaluation of the Emerging MuGFET Technology

Russ, C., Gossner, H., Schulz, T., Chaudhary, N., Weize Xiong,, Marshall, A., Duvvury, C., Schrufer, K., Rinn Cleavelin, C.R.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2007

Language:

english

File:

PDF, 1.49 MB

english, 2007

5

[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - Unique ESD Failure Mechanism in a MuGFET Technology

Gossner, Harald, Russ, Christian, Siegelin, Frank, Schneider, Jens, Schruefer, Klaus, Schulz, Thomas, Duvvury, Charvaka, Cleavelin, C. Rinn, Xiong, Weize

Year:

2006

Language:

english

File:

PDF, 2.80 MB

english, 2006

6

[IEEE 2006 Proceedings of the 32nd European Solid-State Circuits Conference - Montreaux, Switzerland (2006.09.19-2006.09.21)] 2006 Proceedings of the 32nd European Solid-State Circuits Conference - Multi-Gate MOSFET Design

Knoblinger, G., Pacha, C., Kuttner, F., Marshall, A., Russ, C., Haibach, P., Patruno, P., Schulz, T., Arnim, K., Engelstaedter, J.P., Bertolissi, L., Xiong, W., Cleavelin, C.R., Schruefer, K.

Year:

2006

Language:

english

File:

PDF, 972 KB

english, 2006

7

[IEEE 2004 IEEE International SOI Conference - Charleston, SC, USA (4-7 Oct. 2004)] 2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573) - Full/partial depletion effects in FinFETs

Xiong, W., Cleavelin, C.R., Wise, R., Yu, S., Pas, M., Zaman, R.J., Gostkowski, M., Matthews, K., Maleville, C., Patruno, P., Tsu-Jae King,, Colinge, J.P.

Year:

2004

Language:

english

File:

PDF, 232 KB

english, 2004

8

Ultrasonic-attenuation determination of the anisotropic energy gap in superconducting zinc

Cleavelin, C. R., Marshall, B. J.

Journal:

Physical Review B

Year:

1974

Language:

english

File:

PDF, 913 KB

english, 1974

9

Elastic Constants of RbF from 300 to 4.2 K

Cleavelin, C. R., Pederson, D. O., Marshall, B. J.

Journal:

Physical Review B

Year:

1972

Language:

english

File:

PDF, 388 KB

english, 1972

10

[IEEE 2006 IEEE Dallas/CAS Workshop on Design, Applications, Integration and Software - Univ. of Texas at Dallas, Richardson, TX, USA (2006.10.29-2006.10.30)] 2006 IEEE Dallas/CAS Workshop on Design, Applications, Integration and Software - Ring Oscillator Performance and Parasitic Extraction Simulation in Finfet Technology

Kulkarni, Mak, Marshall, Andrew, Cleavelin, C., Xiong, Weize, Pacha, Christian, Armin, Klaus, Schulz, Thomas, Schruefer, Klaus, Patruno, Paul

Year:

2006

Language:

english

File:

PDF, 225 KB

english, 2006

11

Elastic constants of LiBr from 300° to 4.2°K

B.J. Marshall, C.R. Cleavelin

Journal:

Journal of Physics and Chemistry of Solids

Year:

1969

Language:

english

File:

PDF, 253 KB

english, 1969

12

Improved hot-electron reliability in strained-Si nMOS

Onsongo, D., Kelly, D.Q., Dey, S., Wise, R.L., Cleavelin, C.R., Banerjee, S.K.

Journal:

IEEE Transactions on Electron Devices

Year:

2004

Language:

english

File:

PDF, 768 KB

english, 2004

13

Quantum-mechanical effects in trigate SOI MOSFETs

Colinge, J.-P., Alderman, J.C., Weize Xiong, Cleavelin, C.R.

Journal:

IEEE Transactions on Electron Devices

Year:

2006

Language:

english

File:

PDF, 296 KB

english, 2006

14

Junction Passivation for Direct Silicon Bond Hybrid Orientation Technology

Joshi, S., Pinto, A., Huang, Y.-T., Wise, R., Cleavelin, R., Seacrist, M., Ries, M., Ramin, M., Freeman, M., Nguyen, B., Matthews, K., Wilks, B., Denning, L., Johnson, C., Bennet, J., Ma, M., Lin, C.-

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 626 KB

english, 2007

15

[IEEE 2010 International Conference on Microelectronic Test Structures (ICMTS) - Hiroshima, Japan (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - Global parameter extraction for a multi-gate MOSFETs compact model

Yao, Shijing, Morshed, Tanvir H., Lu, Darsen D., Venugopalan, Sriramkumar, Xiong, Weize, Cleavelin, C. R., Niknejad, Ali M., Hu, Chenming

Year:

2010

Language:

english

File:

PDF, 1.27 MB

english, 2010

16

Low-temperature electron mobility in Trigate SOI MOSFETs

Colinge, J.-P., Quinn, A.J., Floyd, L., Redmond, G., Alderman, J.C., Weize Xiong, Cleavelin, C.R., Schulz, T., Schruefer, K., Knoblinger, G., Patruno, P.

Journal:

IEEE Electron Device Letters

Year:

2006

Language:

english

File:

PDF, 285 KB

english, 2006

17

[IEEE 2009 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - San Diego, CA, USA (2009.09.9-2009.09.11)] 2009 International Conference on Simulation of Semiconductor Processes and Devices - Design of FinFET SRAM Cells Using a Statistical Compact Model

Lu, Darsen D., Lin, Chung-Hsun, Yao, Shijing, Xiong, Weize, Bauer, Florian, Cleavelin, Cloves R., Niknejad, Ali M., Hu, Chenming

Year:

2009

Language:

english

File:

PDF, 505 KB

english, 2009

18

[IEEE 2006 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - San Francisco, CA (2006.02.6-2006.02.9)] 2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers - Circuit design issues in multi-gate FET CMOS technologies

Pacha, C., von Arnim, K., Schulz, T., Weize Xiong,, Gostkowski, M., Knoblinger, G., Marshall, A., Nirschl, T., Berthold, J., Russ, C., Gossner, H., Duvvury, C., Patruno, P., Cleavelin, R., Schruefer,

Year:

2006

Language:

english

File:

PDF, 921 KB

english, 2006

19

Colinge, J.-P., Flo, L., Quinn, A.J., Redmond, G., Alderman, J.C., Xiong, W., Cleavelin, C.R., Schulz, T., Schruefer, K., Knoblinger, G.

Journal:

IEEE Electron Device Letters

Year:

2006

Language:

english

File:

PDF, 100 KB

english, 2006

20

[IEEE 2005 IEEE International SOI - Honolulu, HI, USA (03-06 Oct. 2005)] 2005 IEEE International SOI Conference Proceedings - Retention Characteristics of Zero-capacitor RAM (Z-RAM) cell based on FinFET and Tri-Gate devices

Nagoga, M., Okhonin, S., Bassin, C., Fazan, P., Xiong, W., Cleavelin, C.R., Schulz, T., Schruefer, K., Gostkowski, M., Patruno, P., Maleville, C.

Year:

2005

Language:

english

File:

PDF, 1.81 MB

english, 2005

21

Reply Briefs

Richard P. Glovka, Donald L. Cox, Philip J. Englund, Patrick J. Gibbs, Leonard R. Cleavelin, Robert D. Sundby and Franklin N. Cunningham

Journal:

Year:

1984

Language:

english

File:

PDF, 734 KB

english, 1984

22

[IEEE 2005 IEEE International SOI - Honolulu, HI, USA (03-06 Oct. 2005)] 2005 IEEE International SOI Conference Proceedings - Design and Evaluation of Basic Analog Circuits in an Emerging MuGFET Technology

Knoblinger, G., Kuttner, F., Marshall, A., Russ, C., Haibach, P., Patruno, P., Schulz, T., Xiong, W., Gostkowski, M., Schruefer, K., Cleavelin, C.R.

Year:

2005

Language:

english

File:

PDF, 2.09 MB

english, 2005

23

[IEEE ESSCIRC 2007 - 33rd European Solid-State Circuits Conference - Muenchen, Germany (2007.09.11-2007.09.13)] ESSCIRC 2007 - 33rd European Solid-State Circuits Conference - Efficiency of low-power design techniques in Multi-Gate FET CMOS Circuits

Pacha, C., von Arnim, K., Bauer, F., Schulz, T., Xiong, W., San, K.T., Marshall, A., Baumann, T., Cleavelin, C.-R., Schruefer, K., Berthold, J.

Year:

2007

Language:

english

File:

PDF, 1.10 MB

english, 2007

24

[IEEE 2006 European Solid-State Device Research Conference - Montreux, Switzerland (2006.09.19-2006.09.21)] 2006 European Solid-State Device Research Conference - Multi-Gate MOSFET Design

Knoblinger, G., Pacha, C., Kuttner, F., Marshall, A., Russ, C., Haibach, P., Patruno, P., Schulz, T., Arnim, K., Engelstaedter, J.P., Bertolissi, L., Xiong, W., Cleavelin, C.R., Schruefer, K.

Year:

2006

Language:

english

File:

PDF, 995 KB

english, 2006

25

[IEEE 2007 14th IEEE International Conference on Electronics, Circuits and Systems (ICECS '07) - Marrakech (2007.12.11-2007.12.14)] 2007 14th IEEE International Conference on Electronics, Circuits and Systems - Advances in Multi-Gate MOSFET Circuit Design

Fulde, M., Arnim, K. v., Pacha, C., Bauer, F., Russ, C., Siprak, D., Xiong, W., Marshall, A., Cleavelin, C. R., Schruefer, K., Schmitt-Landsiedel, D., Knoblinger, G.

Year:

2007

Language:

english

File:

PDF, 1.35 MB

english, 2007

26

Impact of strained-silicon-on-insulator (sSOI) substrate on FinFET mobility

Xiong, W., Cleavelin, C.R., Kohli, P., Huffman, C., Schulz, T., Schruefer, K., Gebara, G., Mathews, K., Patruno, P., Le Vaillant, Y.-M., Cayrefourcq, I., Kennard, M., Mazure, C., Shin, K., Liu, T.-J.K

Journal:

IEEE Electron Device Letters

Year:

2006

Language:

english

File:

PDF, 295 KB

english, 2006

27

Impact of Gate-Induced Strain on MuGFET Reliability

Nathanael, Rhesa, Xiong, Weize, Cleavelin, C. Rinn, Liu, Tsu-Jae King

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 592 KB

english, 2008

28

[IEEE 2006 IEEE International Conference on IC Design and Technology - Padova, Italy ()] 2006 IEEE International Conference on IC Design and Technology - Characterization of HfSiON Gate Dielectric with TiN Gate on Multi-Gate MOSFET

Weize Xiong,, Chadwin Young,, Matthew, K., Cleavelin, C.R., Schulz, T., Schruefer, K., Patruno, P.

Year:

2006

Language:

english

File:

PDF, 2.83 MB

english, 2006

29

[IEEE 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Hsinchu, Taiwan (2007.04.23-2007.04.25)] 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Multi-Gate MOSFETs with Dual Contact Etch Stop Liner Stressors on Tensile Metal Gate and Strained Silicon on Insulator (sSOI)

Hsu, Che-Hua, Xiong, Weize, Lin, Chien-Ting, Huang, Yao-Tsung, Ma, Mike, Cleavelin, C.R, Patruno, Paul, Kennard, Mark, Cayrefourcq, Ian, Shin, Kyoungsub, Liu, Tsu-Jae King

Year:

2007

Language:

english

File:

PDF, 910 KB

english, 2007

30

[IEEE 2007 IEEE International SOI Conference - Indian Wells, CA, USA (2007.10.1-2007.10.4)] 2007 IEEE International SOI Conference - Study of Fin Profiles and MuGFETs built on SOI Wafers with a Nitride-Oxide Buried Layer (NOx-BL) as the Buried Insulator Layer

Patruno, Paul, Kostrzewa, Marek, Landry, Karine, Xiong, Weize, Cleavelin, C. Rinn, Hsu, Che-Hua, Ma, Mike, Colinge, Jean-Pierre

Year:

2007

Language:

english

File:

PDF, 1.13 MB

english, 2007

31

[IEEE 2005 IEEE Dallas/CAS Workshop on Architecture, Circuits and Implementtation of SOCs - Richardson, TX, USA (10-10 Oct. 2005)] 2005 IEEE Dallas/CAS Workshop on Architecture, Circuits and Implementtation of SOCs - FinFET Current Mirror Design and Evaluation

Marshall, A., Mak Kulkarni,, Cleavelin, R., Duvvury, C., Campise, M., Wilks, B., Gossner, H., Knoblinger, G., Pacha, C., Russ, C., Schruefer, K., VonArnim, K., Gostkowski, M., Schulz, T., Wade Xiong,

Year:

2005

Language:

english

File:

PDF, 1.11 MB

english, 2005

32

[IEEE ESSCIRC 2007 - 33rd European Solid-State Circuits Conference - Muenchen, Germany (2007.09.11-2007.09.13)] ESSCIRC 2007 - 33rd European Solid-State Circuits Conference - Layout options for stability tuning of SRAM cells in multi-gate-FET technologies

Bauer, F., von Arnim, K., Pacha, C., Schulz, T., Fulde, M., Nackaerts, A., Jurczak, M., Xiong, W., T. San, K., Cleavelin, C.-R., Schruefer, K., Georgakos, G., Schmitt-Landsiedel, D.

Year:

2007

Language:

english

File:

PDF, 1.07 MB

english, 2007

33

[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - Enhanced hot-electron performance of strained Si NMOS over unstrained Si

Kelly, D.Q., Onsongo, D., Dey, S., Wise, R., Cleavelin, R., Banerjee, S.K.

Year:

2004

Language:

english

File:

PDF, 418 KB

english, 2004

34

[IEEE 2007 IEEE International SOI Conference - Indian Wells, CA, USA (2007.10.1-2007.10.4)] 2007 IEEE International SOI Conference - Evaluation of FinFET RF Building Blocks

Knoblinger, G., Fulde, M., Siprak, D., Hodel, U., Von Arnim, K., Schulz, Th., Pacha, C., Baumann, U., Marshall, A., Xiong, W., Cleavelin, C. R., Patruno, P., Schruefer, K.

Year:

2007

Language:

english

File:

PDF, 289 KB

english, 2007

35

[IEEE Technical Digest., International Electron Devices Meeting - San Francisco, CA, USA (11-14 Dec. 1988)] Technical Digest., International Electron Devices Meeting - A 5-volt contactless array 256 kbit flash EEPROM technology

Gill, M., Cleavelin, R., Lin, S., D'Arrigo, I., Santin, G., Shah, P., Nguyen, A., Esquivel, J., Riemenschneider, B., Paterson, J.

Year:

1988

File:

PDF, 143 KB

1988

36

[IEEE 2007 IEEE International SOI Conference - Indian Wells, CA, USA (2007.10.1-2007.10.4)] 2007 IEEE International SOI Conference - Multi-Gate SOI MOSFET Operations in Harsh Environments

Xiong, W., Cleavelin, C. R., Hsu, C.H., Ma, M., Schulz, T., Schruefer, K., Patruno, P., Colinge, J.P.

Year:

2007

Language:

english

File:

PDF, 1.29 MB

english, 2007

37

[IEEE 2007 IEEE International SOI Conference - Indian Wells, CA, USA (2007.10.1-2007.10.4)] 2007 IEEE International SOI Conference - Influence of Fluorine Implant on Threshold Voltage for Metal Gate FDSOI and MuGFET

Xiong, W., Hsu, C.H., Cleavelin, C.R., Ma, M., Patruno, P., Lee, C-W., Yan, R., Lederer, D., Afzalian, A., Colinge, J.P.

Year:

2007

Language:

english

File:

PDF, 1.02 MB

english, 2007

38

[IEEE 2006 64th Device Research Conference - State College, PA, USA (2006.06.26-2006.06.28)] 2006 64th Device Research Conference - FinFET Performance Enhancement with Tensile Metal Gates and Strained Silicon on Insulator (sSOI) Substrate

Xiong, Weize, Shin, Kyoungsub, Cleavelin, C., Schulz, Thomas, Schruefer, Klaus, Cayrefourcq, I., Kennard, M., Mazure, C., Patruno, Paul, Liu, Tsu-jae

Year:

2006

Language:

english

File:

PDF, 2.38 MB

english, 2006

39

[IEEE 2010 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2010.12.6-2010.12.8)] 2010 International Electron Devices Meeting - MuGFET carrier mobility and velocity: Impacts of fin aspect ratio, orientation and stress

Nuo Xu,, Xin Sun,, Weize Xiong,, Rinn Cleavelin, C., Tsu-Jae King Liu,

Year:

2010

Language:

english

File:

PDF, 509 KB

english, 2010

40

Body Effect in Tri- and Pi-Gate SOI MOSFETs

Frei, J., Johns, C., Vazquez, A., Xiong, W., Cleavelin, C.R., Schulz, T., Chaudhary, N., Gebara, G., Zaman, J.R., Gostkowski, M., Matthews, K., Colinge, J.-P.

Journal:

IEEE Electron Device Letters

Year:

2004

Language:

english

File:

PDF, 291 KB

english, 2004

41

Radiation Dose Effects in Trigate SOI MOS Transistors

Colinge, J. P., Orozco, A., Rudee, J., Xiong, Weize, Cleavelin, C. Rinn, Schulz, T., Schrfer, K., Knoblinger, G., Patruno, P.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 1.27 MB

english, 2006

42

[IEEE IEEE International Solid-State Circuits Conference - New York, NY, USA (15-17 Feb. 1989)] IEEE International Solid-State Circuits Conference - A 5 V-only 256 kbit CMOS flash EEPROM

D'Arrigo, S., Imondi, G., Santin, G., Gill, M., Cleavelin, R., Spagliccia, S., Tomassetti, E., Lin, S., Nguyen, A., Shah, P., Savarese, G., McElroy, D.

Year:

1989

Language:

english

File:

PDF, 365 KB

english, 1989

43

Improvement of FinFET Electrical Characteristics by Hydrogen Annealing

Xiong, W., Gebara, G., Zaman, J., Gostkowski, M., Nguyen, B., Smith, G., Lewis, D., Cleavelin, C.R., Wise, R., Yu, S., Pas, M., King, T.-J., Colinge, J.P.

Journal:

IEEE Electron Device Letters

Year:

2004

Language:

english

File:

PDF, 339 KB

english, 2004

44

[IEEE 1999 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings - Boston, MA, USA (8-10 Sept. 1999)] 10th Annual IEEE/SEMI. Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings (Cat. No.99CH36295) - The Virtual Fab the core of future technology development

Torres, K., Smith, E., McDonald, C., Rinn Cleavelin, C.

Year:

1999

Language:

english

File:

PDF, 434 KB

english, 1999

45

[IEEE 2007 IEEE International SOI Conference - Indian Wells, CA, USA (2007.10.1-2007.10.4)] 2007 IEEE International SOI Conference - Experimental Hardware Calibrated Compact Models for 50nm n-channel FinFETs

Song, Jooyoung, Yu, Bo, Xiong, W., Hsu, C.H., Cleavelin, C.R., Ma, M., Patruno, P., Taur, Yuan

Year:

2007

Language:

english

File:

PDF, 553 KB

english, 2007

46

[IEEE 2006 IEEE international SOI - Niagara Falls, NY, USA (2006.10.2-2006.10.5)] 2006 IEEE international SOI Conferencee Proceedings - Effects of Temperature on Metal Gate FinFET Circuit Performance

Marshall, Andrew, Xiong, Weize, Cleavelin, C., Matthews, Ken, Konblinger, Gerhard, Pacha, Christian, Armin, Klaus, Schulz, Thomas, Schruefer, Klaus, Patruno, Paul

Year:

2006

Language:

english

File:

PDF, 2.17 MB

english, 2006

47

[IEEE 2007 IEEE Dallas Engineering in Medicine and Biology Workshop - Dallas, TX (2007.11.11-2007.11.12)] 2007 IEEE Dallas Engineering in Medicine and Biology Workshop - Silicon on Insulator - The Perfect Material for Implantable Electronics?

Marshall, Andrew, Cleavelin, C. Rinn, Xiong, Weize, Pacha, Christian, Russ, Christian, von Arnim, Klaus, Schulz, Thomas, Schruefer, Klaus, Knoblinger, Gerhard, Patruno, Paul

Year:

2007

Language:

english

File:

PDF, 4.52 MB

english, 2007

48

Study of bending-induced strain effects on MuGFET performance

Shin, K., Weize,, Chung Yeung Cho,, Cleavelin, C.R., Schulz, T., Schruefer, K., Patruno, P., Smith, L., Tsu-Jae King Liu,

Journal:

IEEE Electron Device Letters

Year:

2006

Language:

english

File:

PDF, 316 KB

english, 2006

49

[IEEE 2006 European Solid-State Device Research Conference - Montreux, Switzerland (2006.09.19-2006.09.21)] 2006 European Solid-State Device Research Conference - Self Heating Simulation of Multi-Gate FETs

Molzer, W., Schulz, Th., Xiong, W., Cleavelin, R., Schrufer, K., Marshall, A., Matthews, K., Sedlmeir, J., Siprak, D., Knoblinger, G., Bertolissi, L., Patruno, P., Colinge, J.-p.

Year:

2006

Language:

english

File:

PDF, 1.32 MB

english, 2006

50

[IEEE 2007 IEEE International SOC Conference (SOCC) - Hsin Chu, Taiwan (2007.09.26-2007.09.29)] 2007 IEEE International SOC Conference - A merged MuGFET and planar SOI process

Marshall, Andrew, Cleavelin, C. Rinn, Weize Xiong,, Pacha, Christian, Knoblinger, Gerhard, Von Armin, Klaus, Schulz, Thomas, Schruefer, Klaus, Matthews, Ken, Molzer, Wolfgang, Patruno, Paul, Russ, Ch

Year:

2007

Language:

english

File:

PDF, 206 KB

english, 2007

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