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51

Scalability of the Si/sub 1-x/Ge/sub x/ source/drain technology for the 45-nm technology node and beyond

Eneman, G., Verheyen, P., Rooyackers, R., Nouri, F., Washington, L., Schreutelkamp, R., Moroz, V., Smith, L., An De Keersgieter, Jurczak, M., Kristin De Meyer

Journal:

IEEE Transactions on Electron Devices

Year:

2006

Language:

english

File:

PDF, 609 KB

english, 2006

52

Extraction of the Top and Sidewall Mobility in FinFETs and the Impact of Fin-Patterning Processes and Gate Dielectrics on Mobility

Iyengar, V.V., Kottantharayil, A., Tranjan, F.M., Jurczak, M., De Meyer, K.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 326 KB

english, 2007

53

Scalability of Stress Induced by Contact-Etch-Stop Layers: A Simulation Study

Eneman, G., Verheyen, P., De Keersgieter, A., Jurczak, M., De Meyer, K.

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 388 KB

english, 2007

54

Impact of Line-Edge Roughness on FinFET Matching Performance

Baravelli, E.., Dixit, A.., Rooyackers, R.., Jurczak, M.., Speciale, N., De Meyer, K..

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 1.02 MB

english, 2007

55

High-pressure transesterification of sterically hindered esters

Jan Romanski, Piotr Nowak, Krzysztof Kosinski, Janusz Jurczak

Journal:

Tetrahedron Letters

Year:

2012

Language:

english

File:

PDF, 196 KB

english, 2012

56

Characterization and Diversity of Cyano- bacterial Hepatotoxins (Microcystins) in Blooms from Polish Freshwaters Identified by Liquid Chromatography-Electrospray Ionisation Mass Spectrometry

T. Jurczak, M. Tarczyñska, K. Karlsson, J. Meriluoto

Journal:

Chromatographia

Year:

2004

Language:

english

File:

PDF, 487 KB

english, 2004

57

Inflammasome-mediated dysbiosis regulates progression of NAFLD and obesity

Henao-Mejia, Jorge, Elinav, Eran, Jin, Chengcheng, Hao, Liming, Mehal, Wajahat Z., Strowig, Till, Thaiss, Christoph A., Kau, Andrew L., Eisenbarth, Stephanie C., Jurczak, Michael J., Camporez, Joao-Pa

Journal:

Year:

2012

Language:

english

File:

PDF, 1.12 MB

english, 2012

58

Nature of the filament formed in HfO2-based resistive random access memory

De Stefano, Francesca, Houssa, Michel, Afanas'ev, Valeri V., Kittl, Jorge A., Jurczak, Małgorzata, Stesmans, Andre

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 455 KB

english, 2013

59

[IEEE 2009 IEEE International SOI Conference - Foster City, CA, USA (2009.10.5-2009.10.8)] 2009 IEEE International SOI Conference - Review of FINFET technology

Jurczak, M., Collaert, N., Veloso, A., Hoffmann, T., Biesemans, S.

Year:

2009

Language:

english

File:

PDF, 833 KB

english, 2009

60

A Functional 41-Stage Ring Oscillator Using Scaled FinFET Devices With 25-nm Gate Lengths and 10-nm Fin Widths Applicable for the 45-nm CMOS Node

Collaert, N., Dixit, A., Goodwin, M., Anil, K.G., Rooyackers, R., Degroote, B., Leunissen, L.H.A., Veloso, A., Jonckheere, R., DeMeyer, K., Jurczak, M., Biesemans, S.

Journal:

IEEE Electron Device Letters

Year:

2004

Language:

english

File:

PDF, 363 KB

english, 2004

61

Metformin suppresses gluconeogenesis by inhibiting mitochondrial glycerophosphate dehydrogenase

Madiraju, Anila K., Erion, Derek M., Rahimi, Yasmeen, Zhang, Xian-Man, Braddock, Demetrios T., Albright, Ronald A., Prigaro, Brett J., Wood, John L., Bhanot, Sanjay, MacDonald, Michael J., Jurczak, Mi

Journal:

Year:

2014

Language:

english

File:

PDF, 5.58 MB

english, 2014

62

Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics

dos Santos, S.D., Cretu, B., Strobel, V., Routoure, J.-M., Carin, R., Martino, J.A., Aoulaiche, M., Jurczak, M., Simoen, E., Claeys, C.

Journal:

Solid-State Electronics

Year:

2014

Language:

english

File:

PDF, 1.27 MB

english, 2014

63

Thermal-stability optimization of Al2O3/Cu–Te based conductive-bridging random access memory systems

Goux, L., Opsomer, K., Franquet, A., Kar, G., Jossart, N., Richard, O., Wouters, D.J., Müller, R., Detavernier, C., Jurczak, M., Kittl, J.A.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 1.60 MB

english, 2013

64

Electron barrier height at CuxTe1−x/Al2O3 interfaces of conducting bridge memory stacks

Afanas'ev, V.V., De Stefano, F., Houssa, M., Stesmans, A., Goux, L., Opsomer, K., Detavernier, C., Kittl, J.A., Jurczak, M.

Journal:

Thin Solid Films

Year:

2013

Language:

english

File:

PDF, 336 KB

english, 2013

65

Influence of metal electrode stoichiometry on the electron barrier height at CuxTe1−x/Al2O3 interfaces for CBRAM applications

De Stefano, Francesca, Afanas’ev, Valeri V., Houssa, Michel, Goux, Ludovic, Opsomer, Karl, Jurczak, Małgorzata, Stesmans, Andre

Journal:

Microelectronic Engineering

Year:

2014

Language:

english

File:

PDF, 632 KB

english, 2014

66

Evaluating the Impact of a School Waste Education Programme upon Students', Parents' and Teachers' Environmental Knowledge, Attitudes and Behaviour

Grodzinska-Jurczak, Malgorzata, Bartosiewicz, Agata, Twardowska, Agata, Ballantyne, Roy

Journal:

International Research in Geographical and Environmental Education

Year:

2003

Language:

english

File:

PDF, 262 KB

english, 2003

67

Thinking about waste: Development of English and Polish children's understanding of concepts related to waste management

Palmer, Joy A., Grodzinska-Jurczak, Malgorzata, Suggate, Jennifer

Journal:

European Early Childhood Education Research Journal

Year:

2003

Language:

english

File:

PDF, 1.13 MB

english, 2003

68

[IEEE 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Marina Bay Sands, Singapore (2014.6.30-2014.7.4)] Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hourglass concept for RRAM: A dynamic and statistical device model

Degraeve, R., Fantini, A., Raghavan, N., Goux, L., Clima, S., Chen, Y. Y., Belmonte, A., Cosemans, S., Govoreanu, B., Wouters, D. J., Roussel, Ph., Kar, G. S., Groeseneken, G., Jurczak, M.

Year:

2014

Language:

english

File:

PDF, 1.13 MB

english, 2014

69

On the impact of TiN film thickness variations on the effective work function of poly-Si/TiN/SiO/sub 2/ and poly-Si/TiN/HfSiON gate stacks

R. Singanamalla, H. Yu, G. Pourtois, I. Ferain, K. Anil, S. Kubicek, T. Hoffmann, M. Jurczak, S. Biesemans, K. De Meyer

Journal:

IEEE Electron Device Letters

Year:

2006

Language:

english

File:

PDF, 219 KB

english, 2006

70

[IEEE ESSDERC 2003. 33rd European Solid-State Device Research - ESSDERC '03 - Estoril, Portugal (16-18 Sept. 2003)] Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710) - Experimental verification of SRAM cell functionality after hard and soft gate oxide breakdowns

Kaczer, B., Degraeve, R., Augendre, E., Jurczak, M., Groeseneken, G.

Year:

2003

Language:

english

File:

PDF, 290 KB

english, 2003

71

[IEEE ESSDERC 2003. 33rd European Solid-State Device Research - ESSDERC '03 - Estoril, Portugal (16-18 Sept. 2003)] Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710) - Thin L-shaped spacers for CMOS devices

Augendre, E., Rooyackers, R., de Potter de ten Broeck, M., Kunnen, E., Beckx, S., Mannaert, G., Vrancken, C., Vassilev, V., Chiarella, T., Jurczak, M., Debusschere, I.

Year:

2003

Language:

english

File:

PDF, 316 KB

english, 2003

72

Balancing SET/RESET Pulse for $>\hbox{10}^{10}$ Endurance in $\hbox{HfO}_{2}\hbox{/Hf}$ 1T1R Bipolar RRAM

Yang Yin Chen,, Govoreanu, B., Goux, L., Degraeve, R., Fantini, A., Kar, G. S., Wouters, D. J., Groeseneken, G., Kittl, J. A., Jurczak, M., Altimime, L.

Journal:

IEEE Transactions on Electron Devices

Year:

2012

Language:

english

File:

PDF, 1.21 MB

english, 2012

73

[IEEE 2011 3rd IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2011.05.22-2011.05.25)] 2011 3rd IEEE International Memory Workshop (IMW) - Self-Limited Filament Formation and Low-Power Resistive Switching in CuxTe1-x/Al2O3/Si CBRAM Cell

Goux, L., Opsomer, K., Schuitema, R., Degraeve, R., Muller, R., Detavernier, C., Wouters, D. J., Jurczak, M., Altimime, L., Kittl, J. A.

Year:

2011

Language:

english

File:

PDF, 1.08 MB

english, 2011

74

[IEEE ESSDERC 2003. 33rd European Solid-State Device Research - ESSDERC '03 - Estoril, Portugal (16-18 Sept. 2003)] Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710) - Design-driven optimisation of a 90 nm RF CMOS process by use of elevated source/drain

Linten, D., Thijs, S., Jeamsaksiri, W., Natarajan, M.I., De Heyn, V., Vassilev, V., Groeseneken, G., Scholten, A.J., Badenes, G., Jurczak, M., Decoutere, S., Donnay, S., Wambacq, P.

Year:

2003

Language:

english

File:

PDF, 331 KB

english, 2003

75

In-depth characterization of the hole mobility in 50-nm process-induced strained MOSFETs

Andrieu, F., Ernst, T., Ravit, C., Jurczak, M., Ghibaudo, G., Deleonibus, S.

Journal:

IEEE Electron Device Letters

Year:

2005

Language:

english

File:

PDF, 155 KB

english, 2005

76

[Japan Soc. Appl. Phys 1999 Symposium on VLSI Technology. Digest of Technical Papers - Kyoto, Japan (14-16 June 1999)] 1999 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.99CH36325) - SON (silicon on nothing)-a new device architecture for the ULSI era

Jurczak, M., Skotnicki, T., Paoli, M., Tormen, B., Regolini, J.-L., Morin, C., Schiltz, A., Martins, J., Pantel, R., Galvier, J.

Year:

1999

Language:

english

File:

PDF, 262 KB

english, 1999

77

Air pollution and atmospheric precipitation chemistry in Poland - a review

Grodzin'ska-Jurczak, M, Godzik, B

Journal:

Environmental Reviews

Year:

1999

Language:

english

File:

PDF, 228 KB

english, 1999

78

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Role of holes and electrons during erase of TANOS memories: Evidences for dipole formation and its impact on reliability

Vandelli, Luca, Padovani, Andrea, Larcher, Luca, Arreghini, Antonio, Van den bosch, Geert, Jurczak, Malgorzata, Van Houdt, Jan, Marca, Vincenzo Della, Pavan, Paolo

Year:

2010

Language:

english

File:

PDF, 1.18 MB

english, 2010

79

[IEEE 2007 IEEE International SOI Conference - Indian Wells, CA, USA (2007.10.1-2007.10.4)] 2007 IEEE International SOI Conference - Analysis of the FinFET parasitics for improved RF performances

Parvais, B., Dehan, M., Subramanian, V., Mercha, A., San, K. Tamer, Jurczak, M., Groeseneken, G., Sansen, W., Decoutere, S.

Year:

2007

Language:

english

File:

PDF, 879 KB

english, 2007

80

[IEEE Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. - Grenoble, France (12-16 Sept. 2005)] Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. - Scalability of strained nitride capping layers for future CMOS generations

Eneman, G., Jurczak, M., Verheyen, P., Hoffmann, T., De Keersgieter, A., De Meyer, K.

Year:

2005

Language:

english

File:

PDF, 267 KB

english, 2005

81

An ERK/Cdk5 axis controls the diabetogenic actions of PPARγ

Banks, Alexander S., McAllister, Fiona E., Camporez, João Paulo G., Zushin, Peter-James H., Jurczak, Michael J., Laznik-Bogoslavski, Dina, Shulman, Gerald I., Gygi, Steven P., Spiegelman, Bruce M.

Journal:

Year:

2014

Language:

english

File:

PDF, 2.32 MB

english, 2014

82

Methodology for Design Optimization of SOI FinFET Grounded-Gate NMOS Devices

Thijs, Steven, Russ, Christian, Tremouilles, David, Griffoni, Alessio, Linten, Dimitri, Scholz, Mirko, Collaert, Nadine, Rooyackers, Rita, Jurczak, Malgorzata, Groeseneken, Guido

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2010

Language:

english

File:

PDF, 566 KB

english, 2010

83

[IEEE 2005 International Conference On Simulation of Semiconductor Processes and Devices - Tokyo, Japan (2005.09.3-2005.09.3)] 2005 International Conference On Simulation of Semiconductor Processes and Devices - The Impact of Layout on Stress-Enhanced Transistor Performance

Moroz, V., Eneman, G., Verheyen, P., Nouri, F., Washington, L., Smith, L., Jurczak, M., Pramanik, D., Xu, X.

Year:

2005

Language:

english

File:

PDF, 2.13 MB

english, 2005

84

[IEEE Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005. - Kyoto, Japan (June 14-16, 2005)] Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005. - Experimental and comparative investigation of low and high field transport in substrate- and process-induced strained nanoscaled MOSFETs

Andrieu, F., Ernst, T., Lime, F., Rochette, F., Romanjek, K., Barraud, S., Ravit, C., Boeuf, F., Jurczak, M., Casse, M., Weber, O., Brevard, L., Reimbold, G., Ghibaudo, G., Deleonibus, S.

Year:

2005

Language:

english

File:

PDF, 434 KB

english, 2005

85

[IEEE Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005. - Kyoto, Japan (June 14-16, 2005)] Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005. - 25% drive current improvement for p-type multiple gate FET (MuGFET) devices by the introduction of recessed Si/sub 0.8/Ge/sub 0.2/ in the source and drain regions.

Verheyen, P., Collaert, N., Rooyackers, R., Loo, R., Shamiryan, D., De Keersgieter, A., Eneman, G., Leys, F., Dixit, A., Goodwin, M., Yim, Y.S., Caymax, M., De Meyer, K., Absil, P., Jurczak, M., Biese

Year:

2005

Language:

english

File:

PDF, 509 KB

english, 2005

86

[IEEE 2010 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2010.12.6-2010.12.8)] 2010 International Electron Devices Meeting - Realizing super-steep subthreshold slope with conventional FDSOI CMOS at low-bias voltages

Lu, Z., Collaert, N., Aoulaiche, M., De Wachter, B., De Keersgieter, A., Fossum, J. G., Altimime, L., Jurczak, M.

Year:

2010

Language:

english

File:

PDF, 635 KB

english, 2010

87

Attitudes to environmental education in Poland

Kobierska, Hanna, Tarabuła-Fiertak, Marta, Grodzińska-Jurczak, Małgorzata

Journal:

Journal of Biological Education

Year:

2007

Language:

english

File:

PDF, 258 KB

english, 2007

88

[IEEE 2012 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2012.06.12-2012.06.14)] 2012 Symposium on VLSI Technology (VLSIT) - Field-driven ultrafast sub-ns programming in W\Al2O3\Ti\CuTe-based 1T1R CBRAM system

Goux, L., Sankaran, K., Kar, G., Jossart, N., Opsomer, K., Degraeve, R., Pourtois, G., Rignanese, G.-M., Detavernier, C., Clima, S., Chen, Y.-Y., Fantini, A., Govoreanu, B., Wouters, D.J., Jurczak, M.

Year:

2012

Language:

english

File:

PDF, 1018 KB

english, 2012

89

[IEEE 2009 Proceedings of the European Solid State Device Research Conference (ESSDERC) - Athens, Greece (2009.09.14-2009.09.18)] 2009 Proceedings of the European Solid State Device Research Conference - Experimental evaluation of trapping efficiency in silicon nitride based charge trapping memories

Suhane, A., Arreghini, A., Van den bosch, G., Breuil, L., Cacciato, A., Rothschild, A., Jurczak, M., Van Houdt, J., De Meyer, K.

Year:

2009

Language:

english

File:

PDF, 941 KB

english, 2009

90

Acetylation of TUG Protein Promotes the Accumulation of GLUT4 Glucose Transporters in an Insulin-responsive Intracellular Compartment

Belman, Jonathan P., Bian, Rachel R., Habtemichael, Estifanos N., Li, Don T., Jurczak, Michael J., Alcázar-Román, Abel, McNally, Leah J., Shulman, Gerald I., Bogan, Jonathan S.

Journal:

Journal of Biological Chemistry

Year:

2015

Language:

english

File:

PDF, 9.32 MB

english, 2015

91

Hepatic Acetyl CoA Links Adipose Tissue Inflammation to Hepatic Insulin Resistance and Type 2 Diabetes

Perry, Rachel J., Camporez, João-Paulo G., Kursawe, Romy, Titchenell, Paul M., Zhang, Dongyan, Perry, Curtis J., Jurczak, Michael J., Abudukadier, Abulizi, Han, Myoung Sook, Zhang, Xian-Man, Ruan, Hai

Journal:

Year:

2015

Language:

english

File:

PDF, 4.07 MB

english, 2015

92

Modeling of Copper Diffusion in Amorphous Aluminum Oxide in CBRAM Memory Stack

Sankaran, K., Goux, L., Clima, S., Mees, M., Kittl, J. A., Jurczak, M., Altimime, L., Rignanese, G.-M., Pourtois, G.

Journal:

ECS Transactions

Year:

2012

Language:

english

File:

PDF, 1.03 MB

english, 2012

93

Dynamic Modeling of Radiation-Induced State Changes in ${\hbox {HfO}_2}/\hbox {Hf}$ 1T1R RRAM

Bennett, William G., Hooten, Nicholas C., Schrimpf, Ronald D., Reed, Robert A., Alles, Michael L., Zhang, En Xia, Weeden-Wright, Stephanie L., Linten, Dimitri, Jurczak, Malgorzata, Fantini, Andrea

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 1015 KB

english, 2014

94

Oral folic acid supplementation decreases palate and/or lip cleft occurrence in Pug and Chihuahua puppies and elevates folic acid blood levels in pregnant bitches

Domosławska, A., Jurczak, A., Janowski, T.

Journal:

Polish Journal of Veterinary Sciences

Year:

2013

Language:

english

File:

PDF, 1.27 MB

english, 2013

95

Causes and consequences of the stochastic aspect of filamentary RRAM

Degraeve, R., Fantini, A., Raghavan, N., Goux, L., Clima, S., Govoreanu, B., Belmonte, A., Linten, D., Jurczak, M.

Journal:

Microelectronic Engineering

Year:

2015

Language:

english

File:

PDF, 1.60 MB

english, 2015

96

ECS Transactions [ECS China Semiconductor Technology International Conference 2011 (CSTIC 2011) - Shanghai, China (March 13 - March 14, 2011)] - Atomic-Layer Deposition of Lutetium Aluminate Thin Films for Non-Volatile Memory Applications

Adelmann, Christoph, Swerts, Johan, Conard, Thierry, Brijs, Bert, Franquet, Alexis, Hardy, An, Tielens, Hilde, Opsomer, Karl, Moussa, Alain, Van Bael, Marlies K., Jurczak, Malgorzata, Kittl, Jorge A.,

Year:

2011

Language:

english

File:

PDF, 222 KB

english, 2011

97

Analysis of the Excellent Memory Disturb Characteristics of a Hourglass-Shaped Filament in Al2O3/Cu-Based CBRAM Devices

Belmonte, Attilio, Celano, Umberto, Redolfi, Augusto, Fantini, Andrea, Muller, Robert, Vandervorst, Wilfried, Houssa, Michel, Jurczak, Malgorzata, Goux, Ludovic

Journal:

IEEE Transactions on Electron Devices

Year:

2015

Language:

english

File:

PDF, 1.73 MB

english, 2015

98

The High-Pressure [4+2] Cycloaddition of Activated 1,3-Dienes to Nonactivated Heterodienophiles Derived from Glycolaldehyde

Malinowska, Małgorzata, Sałań, Piotr, Caille, Jean-Claude, Jurczak, Janusz

Journal:

Year:

2002

Language:

english

File:

PDF, 54 KB

english, 2002

99

Simple and Efficient Synthesis of Racemic Substituted Mandelic Acid Esters from Nonactivated Arenes and Ethyl Glyoxylate

Kwiatkowski, Jacek, Majer, Jakub, Kwiatkowski, Piotr, Jurczak, Janusz

Journal:

Year:

2008

Language:

english

File:

PDF, 143 KB

english, 2008

100

Imaging the Three-Dimensional Conductive Channel in Filamentary-Based Oxide Resistive Switching Memory

Celano, Umberto, Goux, Ludovic, Degraeve, Robin, Fantini, Andrea, Richard, Olivier, Bender, Hugo, Jurczak, Malgorzata, Vandervorst, Wilfried

Journal:

Year:

2015

Language:

english

File:

PDF, 3.90 MB

english, 2015

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