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51

Guest Editors' introduction: On-chip structures for smarter silicon

Tehranipoor, Mohammad, Winemberg, LeRoy

Journal:

IEEE Design & Test of Computers

Year:

2012

Language:

english

File:

PDF, 57 KB

english, 2012

52

Introduction to Hardware Security and Trust || Trusted Design in FPGAs

Tehranipoor, Mohammad, Wang, Cliff

Year:

2012

Language:

english

File:

PDF, 667 KB

english, 2012

53

[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Layout-Aware Pattern Generation for Maximizing Supply Noise Effects on Critical Paths

Ma, Junxia, Lee, Jeremy, Tehranipoor, Mohammad

Year:

2009

Language:

english

File:

PDF, 737 KB

english, 2009

54

Aging Adaption in Integrated Circuits Using a Novel Built-In Sensor

Wang, Xiaoxiao, Winemberg, LeRoy, Su, Donglin, Tran, Dat, George, Saji, Ahmed, Nisar, Palosh, Steve, Dobin, Allan, Tehranipoor, Mohammad

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2015

Language:

english

File:

PDF, 2.25 MB

english, 2015

55

[ACM Press the 49th Annual Design Automation Conference - San Francisco, California (2012.06.03-2012.06.07)] Proceedings of the 49th Annual Design Automation Conference on - DAC '12 - Identification of recovered ICs using fingerprints from a light-weight on-chip sensor

Zhang, Xuehui, Tuzzio, Nicholas, Tehranipoor, Mohammad

Year:

2012

Language:

english

File:

PDF, 435 KB

english, 2012

56

[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2010.04.19-2010.04.22)] 2010 28th VLSI Test Symposium (VTS) - A novel hybrid method for SDD pattern grading and selection

Peng, Ke, Thibodeau, Jason, Yilmaz, Mahmut, Chakrabarty, Krishnendu, Tehranipoor, Mohammad

Year:

2010

Language:

english

File:

PDF, 509 KB

english, 2010

57

[IEEE 2013 IEEE 31st International Conference on Computer Design (ICCD) - Asheville, NC, USA (2013.10.6-2013.10.9)] 2013 IEEE 31st International Conference on Computer Design (ICCD) - Functional Fmax test-time reduction using novel DFTs for circuit initialization

Guin, Ujjwal, Chakraborty, Tapan, Tehranipoor, Mohammad

Year:

2013

Language:

english

File:

PDF, 288 KB

english, 2013

58

[IEEE 2013 IEEE 31st International Conference on Computer Design (ICCD) - Asheville, NC, USA (2013.10.6-2013.10.9)] 2013 IEEE 31st International Conference on Computer Design (ICCD) - On design vulnerability analysis and trust benchmarks development

Salmani, Hassan, Tehranipoor, Mohammad, Karri, Ramesh

Year:

2013

Language:

english

File:

PDF, 143 KB

english, 2013

59

[IEEE 2011 IEEE 29th International Conference on Computer Design (ICCD 2011) - Amherst, MA, USA (2011.10.9-2011.10.12)] 2011 IEEE 29th International Conference on Computer Design (ICCD) - Red team: Design of intelligent hardware trojans with known defense schemes

Zhang, Xuehui, Tuzzio, Nicholas, Tehranipoor, Mohammad

Year:

2011

Language:

english

File:

PDF, 4.91 MB

english, 2011

60

[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - A Noise-Aware Hybrid Method for SDD Pattern Grading and Selection

Peng, Ke, Yilmaz, Mahmut, Chakrabarty, Krishnendu, Tehranipoor, Mohammad

Year:

2010

Language:

english

File:

PDF, 593 KB

english, 2010

61

[ACM Press the conference - Munich, Germany (2008.03.10-2008.03.14)] Proceedings of the conference on Design, automation and test in Europe - DATE '08 - Layout-aware, IR-drop tolerant transition fault pattern generation

Lee, Jeremy, Narayan, Sumit, Kapralos, Mike, Tehranipoor, Mohammad

Year:

2008

Language:

english

File:

PDF, 251 KB

english, 2008

62

SCT

Rad, Reza, Tehranipoor, Mohammad

Journal:

ACM Journal on Emerging Technologies in Computing Systems

Year:

2008

Language:

english

File:

PDF, 1.88 MB

english, 2008

63

[IEEE 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Amsterdam, Netherlands (2014.10.1-2014.10.3)] 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - SAM: A comprehensive mechanism for accessing embedded sensors in modern SoCs

He, Miao Tony, Tehranipoor, Mohammad

Year:

2014

Language:

english

File:

PDF, 1.05 MB

english, 2014

64

[IEEE 2014 IEEE 23rd Asian Test Symposium (ATS) - Hangzhou, China (2014.11.16-2014.11.19)] 2014 IEEE 23rd Asian Test Symposium - An All Digital Distributed Sensor Network Based Framework for Continuous Noise Monitoring and Timing Failure Analysis in SoCs

Sadi, Mehdi, Conroy, Zoe, Eklow, Bill, Kamm, Matthias, Bidokhti, Nematollah, Tehranipoor, Mark Mohammad

Year:

2014

Language:

english

File:

PDF, 1.76 MB

english, 2014

65

[IEEE 2012 21st Asian Test Symposium (ATS) - Niigata, Japan (2012.11.19-2012.11.22)] 2012 IEEE 21st Asian Test Symposium - PowerMAX: Fast Power Analysis during Test

Zhao, Wei, Tehranipoor, Mohammad

Year:

2012

Language:

english

File:

PDF, 632 KB

english, 2012

66

[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - Case Study: Efficient SDD test generation for very large integrated circuits

Peng, Ke, Fang Bao,, Shofner, Geoff, Winemberg, LeRoy, Tehranipoor, Mohammad

Year:

2011

Language:

english

File:

PDF, 791 KB

english, 2011

67

[IEEE 2013 IEEE 31st VLSI Test Symposium (VTS) - Berkeley, CA (2013.4.29-2013.5.2)] 2013 IEEE 31st VLSI Test Symposium (VTS) - Special session 12A: Hot topic counterfeit IC identification: How can test help?

Polian, Ilia, Tehranipoor, Mohammad, Polian, Ilia, Tehranipoor, Mohammad

Year:

2013

Language:

english

File:

PDF, 59 KB

english, 2013

68

[IEEE 2006 IEEE/ACM International Conference on Computer Aided Design - Double Tree Hotel, San Jose, CA,USA (2006.11.5-2006.11.9)] 2006 IEEE/ACM International Conference on Computer Aided Design - A Novel Framework for Faster-than-at-Speed Delay Test Considering IR-drop Effects

Ahmed, Nisar, Tehranipoor, Mohammad, Jayaram, Vinay

Year:

2006

Language:

english

File:

PDF, 7.61 MB

english, 2006

69

A critical-path-aware partial gating approach for test power reduction

Elshoukry, Mohammed, Tehranipoor, Mohammad, Ravikumar, C. P.

Journal:

ACM Transactions on Design Automation of Electronic Systems

Year:

2007

Language:

english

File:

PDF, 613 KB

english, 2007

70

Test and Diagnosis for Small-Delay Defects || Diagnosing Noise-Induced SDDs by Using Dynamic SDF

Tehranipoor, Mohammad, Peng, Ke, Chakrabarty, Krishnendu

Year:

2012

Language:

english

File:

PDF, 827 KB

english, 2012

71

Detection of trojans using a combined ring oscillator network and off-chip transient power analysis

Zhang, Xuehui, Ferraiuolo, Andrew, Tehranipoor, Mohammad

Journal:

ACM Journal on Emerging Technologies in Computing Systems

Year:

2013

Language:

english

File:

PDF, 3.76 MB

english, 2013

72

Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain

Guin, Ujjwal, Huang, Ke, DiMase, Daniel, Carulli, John M., Tehranipoor, Mohammad, Makris, Yiorgos

Journal:

Proceedings of the IEEE

Year:

2014

Language:

english

File:

PDF, 3.88 MB

english, 2014

73

[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Power-Safe Application of Transition Delay Fault Patterns Considering Current Limit during Wafer Test

Zhao, Wei, Ma, Junxia, Tehranipoor, Mohammad, Chakravarty, Sreejit

Year:

2010

Language:

english

File:

PDF, 540 KB

english, 2010

74

Test and Diagnosis for Small-Delay Defects || Maximizing Crosstalk Effect on Critical Paths

Tehranipoor, Mohammad, Peng, Ke, Chakrabarty, Krishnendu

Year:

2012

Language:

english

File:

PDF, 405 KB

english, 2012

75

An Experimental Analysis of Power and Delay Signal-to-Noise Requirements for Detecting Trojans and Methods for Achieving the Required Detection Sensitivities

Lamech, Charles, Rad, Reza M., Tehranipoor, Mohammad, Plusquellic, Jim

Journal:

IEEE Transactions on Information Forensics and Security

Year:

2011

Language:

english

File:

PDF, 1.56 MB

english, 2011

76

Crosstalk- and Process Variations-Aware High-Quality Tests for Small-Delay Defects

Peng, Ke, Yilmaz, Mahmut, Chakrabarty, Krishnendu, Tehranipoor, Mohammad

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2013

Language:

english

File:

PDF, 1.24 MB

english, 2013

77

[IEEE 2010 15th Asia and South Pacific Design Automation Conference ASP-DAC 2010 - Taipei, Taiwan (2010.01.18-2010.01.21)] 2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC) - Emulating and diagnosing IR-drop by using dynamic SDF

Ke Peng,, Yu Huang,, Guo, Ruifeng, Wu-Tung Cheng,, Tehranipoor, Mohammad

Year:

2010

Language:

english

File:

PDF, 268 KB

english, 2010

78

[IEEE 26th IEEE VLSI Test Symposium (vts 2008) - San Diego, CA, USA (2008.04.27-2008.05.1)] 26th IEEE VLSI Test Symposium (vts 2008) - Test-Pattern Grading and Pattern Selection for Small-Delay Defects

Yilmaz, Mahmut, Chakrabarty, Krishnendu, Tehranipoor, Mohammad

Year:

2008

Language:

english

File:

PDF, 490 KB

english, 2008

79

Generation of Effective 1-Detect TDF Patterns for Detecting Small-Delay Defects

Bao, Fang, Peng, Ke, Tehranipoor, Mohammad, Chakrabarty, Krishnendu

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2013

Language:

english

File:

PDF, 8.01 MB

english, 2013

80

[IEEE 2010 IEEE International Workshop on Information Forensics and Security (WIFS) - Seattle, WA, USA (2010.12.12-2010.12.15)] 2010 IEEE International Workshop on Information Forensics and Security - A layout-aware approach for improving localized switching to detect hardware Trojans in integrated circuits

Salmani, Hassan, Tehranipoor, Mohammad, Plusquellic, Jim

Year:

2010

Language:

english

File:

PDF, 579 KB

english, 2010

81

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Fast aging degradation rate prediction during production test

Wang, Xiaoxiao, Winemberg, LeRoy, Haggag, Amr, Chayachinda, Joe, Saluja, Amandeep, Tehranipoor, Mohammad

Year:

2014

Language:

english

File:

PDF, 538 KB

english, 2014

82

[IEEE 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS) - College Station, TX, USA (2014.8.3-2014.8.6)] 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS) - On-chip sensor selection for effective speed-binning

Shi, Qihang, Tehranipoor, Mohammad, Wang, Xiaoxiao, Winemberg, LeRoy

Year:

2014

Language:

english

File:

PDF, 1.60 MB

english, 2014

83

[ACM Press the The 51st Annual Design Automation Conference - San Francisco, CA, USA (2014.06.01-2014.06.05)] Proceedings of the The 51st Annual Design Automation Conference on Design Automation Conference - DAC '14 - TI-TRNG

Rahman, Md. Tauhidur, Xiao, Kan, Forte, Domenic, Zhang, Xuhei, Shi, Jerry, Tehranipoor, Mohammad

Year:

2014

Language:

english

File:

PDF, 295 KB

english, 2014

84

[IEEE 2014 27th International Conference on VLSI Design - India (2014.01.5-2014.01.9)] 2014 27th International Conference on VLSI Design and 2014 13th International Conference on Embedded Systems - Tutorial T4: All You Need to Know about Hardware Trojans and Counterfeit ICs

Tehranipoor, Mohammad, Forte, Domenic

Year:

2014

Language:

english

File:

PDF, 187 KB

english, 2014

85

[ACM Press the 43rd annual conference - San Francisco, CA, USA (2006.07.24-2006.07.28)] Proceedings of the 43rd annual conference on Design automation - DAC '06 - A new hybrid FPGA with nanoscale clusters and CMOS routing

Rad, Reza M. P., Tehranipoor, Mohammad

Year:

2006

Language:

english

File:

PDF, 587 KB

english, 2006

86

[ACM Press the great lakes symposium - Salt Lake City, Utah, USA (2012.05.03-2012.05.04)] Proceedings of the great lakes symposium on VLSI - GLSVLSI '12 - TSUNAMI

Wang, Shuo, Tehranipoor, Mohammad

Year:

2012

Language:

english

File:

PDF, 869 KB

english, 2012

87

On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST

TOMITA, Akihiro, WEN, Xiaoqing, SATO, Yasuo, KAJIHARA, Seiji, MIYASE, Kohei, HOLST, Stefan, GIRARD, Patrick, TEHRANIPOOR, Mohammad, WANG, Laung-Terng

Journal:

IEICE Transactions on Information and Systems

Year:

2014

Language:

english

File:

PDF, 3.48 MB

english, 2014

88

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - ARO-PUF: An aging-resistant ring oscillator PUF design

Rahman, Md. Tauhidur, Forte, Domenic, Fahrny, Jim, Tehranipoor, Mohammad

Year:

2014

Language:

english

File:

PDF, 163 KB

english, 2014

89

[IEEE 2008 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTVS) - Cambridge, MA, USA (2008.10.1-2008.10.3)] 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems - Hardware Trojan Detection and Isolation Using Current Integration and Localized Current Analysis

Wang, Xiaoxiao, Salmani, Hassan, Tehranipoor, Mohammad, Plusquellic, Jim

Year:

2008

Language:

english

File:

PDF, 391 KB

english, 2008

90

[IEEE 2014 IEEE 23rd North Atlantic Test Workshop (NATW) - Johnson City, NY, USA (2014.5.14-2014.5.16)] 2014 IEEE 23rd North Atlantic Test Workshop - CSST: An Efficient Secure Split-Test for Preventing IC Piracy

Rahman, Md. Tauhidur, Forte, Domenic, Shi, Quihang, Contreras, Gustavo K., Tehranipoor, Mohammad

Year:

2014

Language:

english

File:

PDF, 325 KB

english, 2014

91

[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Novel Physical Unclonable Function with process and environmental variations

Xiaoxiao Wang,, Tehranipoor, Mohammad

Year:

2010

Language:

english

File:

PDF, 197 KB

english, 2010

92

Introduction to Hardware Security and Trust || Security in Embedded Systems

Tehranipoor, Mohammad, Wang, Cliff

Year:

2012

Language:

english

File:

PDF, 1.21 MB

english, 2012

93

Light-Weight On-Chip Structure for Measuring Timing Uncertainty Induced by Noise in Integrated Circuits

Shuo Wang,, Tehranipoor, Mohammad

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2014

Language:

english

File:

PDF, 1.38 MB

english, 2014

94

[IEEE 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Austin, TX, USA (2012.10.3-2012.10.5)] 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Path-delay fingerprinting for identification of recovered ICs

Zhang, Xuehui, Xiao, Kan, Tehranipoor, Mohammad

Year:

2012

Language:

english

File:

PDF, 490 KB

english, 2012

95

[IEEE 2011 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) - San Diego, CA, USA (2011.06.5-2011.06.6)] 2011 IEEE International Symposium on Hardware-Oriented Security and Trust - Case study: Detecting hardware Trojans in third-party digital IP cores

Zhang, Xuehui, Tehranipoor, Mohammad

Year:

2011

Language:

english

File:

PDF, 204 KB

english, 2011

96

[IEEE 2013 22nd Asian Test Symposium (ATS) - Yilan County, Taiwan (2013.11.18-2013.11.21)] 2013 22nd Asian Test Symposium - Critical Paths Selection and Test Cost Reduction Considering Process Variations

Chen, Jifeng, Tehranipoor, Mohammad

Year:

2013

Language:

english

File:

PDF, 2.09 MB

english, 2013

97

[ACM Press the International Conference - San Jose, California (2012.11.05-2012.11.08)] Proceedings of the International Conference on Computer-Aided Design - ICCAD '12 - Representative critical reliability paths for low-cost and accurate on-chip aging evaluation

Wang, Shuo, Chen, Jifeng, Tehranipoor, Mohammad

Year:

2012

Language:

english

File:

PDF, 900 KB

english, 2012

98

Design of On-Chip Lightweight Sensors for Effective Detection of Recycled ICs

Xuehui Zhang,, Tehranipoor, Mohammad

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2014

Language:

english

File:

PDF, 1.77 MB

english, 2014

99

[IEEE 2008 IEEE International Workshop on Hardware-Oriented Security and Trust (HOST) - Anaheim, CA, USA (2008.06.9-2008.06.9)] 2008 IEEE International Workshop on Hardware-Oriented Security and Trust - Detecting malicious inclusions in secure hardware: Challenges and solutions

Xiaoxiao Wang,, Tehranipoor, Mohammad, Plusquellic, Jim

Year:

2008

Language:

english

File:

PDF, 87 KB

english, 2008

100

[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Circuit Topology-Based Test Pattern Generation for Small-Delay Defects

Goel, Sandeep Kumar, Chakrabarty, Krishnendu, Yilmaz, Mahmut, Peng, Ke, Tehranipoor, Mohammad

Year:

2010

Language:

english

File:

PDF, 354 KB

english, 2010

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